Sensor having a plurality of active areas

    公开(公告)号:US20040094717A1

    公开(公告)日:2004-05-20

    申请号:US10294492

    申请日:2002-11-14

    CPC classification number: G08B13/191

    Abstract: A sensor including at least two active areas for receiving light energy and a resistive layer disposed on each of the at least two active areas for providing a pair of current signals corresponding to a position of light energy of a predetermined wavelength striking the active area. The two or more active areas are electrically isolated from each other and operate independent of each other. Preferably, the two or more active areas are electrically isolated with silicon dioxide.

    Optical spatial interconnect net
    133.
    发明申请
    Optical spatial interconnect net 有权
    光学空间互连网

    公开(公告)号:US20040075057A1

    公开(公告)日:2004-04-22

    申请号:US10278705

    申请日:2002-10-22

    Inventor: Stewart A. Clark

    CPC classification number: G01J5/08 G01J5/02 G01J5/025 G01J5/0846 H04N5/33

    Abstract: An infrared detection system for seeing multiple pixel scenes and/or connecting multiple detectors, within each communications path, includes a data processor, optical toggles and/or electrical switches, and a large number of pixels and detectors. For the spatial net, the data processor sends signals to the optical toggle and electric switches connecting neighboring pixels and other detector elements to the data processor. A single communications path serves several pixels and detector elements thereby minimizing interconnection congestion from the pixels to the processing circuitry.

    Abstract translation: 用于在每个通信路径内观看多个像素场景和/或连接多个检测器的红外检测系统包括数据处理器,光学切换和/或电开关以及大量像素和检测器。 对于空间网络,数据处理器向光学切换器发送信号,并将连接相邻像素和其他检测器元件的电开关发送到数据处理器。 单个通信路径提供多个像素和检测器元件,从而最小化从像素到处理电路的互连拥塞。

    Method and apparatus for monitoring environment and apparatus for producing semiconductor
    134.
    发明申请
    Method and apparatus for monitoring environment and apparatus for producing semiconductor 审中-公开
    用于监测环境的方法和装置以及用于制造半导体的装置

    公开(公告)号:US20040056196A1

    公开(公告)日:2004-03-25

    申请号:US10416236

    申请日:2003-09-29

    CPC classification number: G01N21/552 G01N21/3504

    Abstract: An environmental monitoring apparatus comprises: an infrared transmitting substrate 12 disposed in a prescribed ambient atmosphere 10; an infrared radiation source 20 for irradiating an infrared radiation to the infrared transmitting substrate 12; a contaminant analyzing means 30 for computing a concentration of a contaminant in the ambient atmosphere 10, based on the infrared radiation exited from the infrared transmitting substrate 12 after the infrared radiation has undergone multiple reflections inside the infrared transmitting substrate 12; and a contaminant removing means 50 for removing the contaminant in the ambient atmosphere 10 complied with the concentration of the contaminant in the ambient atmosphere 10, which have been computed by the contaminant analyzing means 30. Thus, the contaminant in the ambient atmosphere can be monitored with high sensitivity and real time, and can be immediately removed when the concentration in the ambient atmosphere exceed a prescribed value.

    Abstract translation: 环境监测装置包括:设置在规定环境气氛10中的红外线透射基板12; 用于将红外辐射照射到红外线透射基板12的红外辐射源20; 污染物分析装置30,用于在红外线辐射在红外线透射基板12内进行多次反射之后,基于从红外线透射基板12离开的红外线辐射来计算环境气氛10中的污染物的浓度; 和用于除去环境大气中的污染物的污染物去除装置50,其符合由污染物分析装置30计算出的环境气氛10中的污染物的浓度。因此,可以监测环境大气中的污染物 具有高灵敏度和实时性,并且当环境大气中的浓度超过规定值时可以立即除去。

    Dual-mode focal plane array for missile seekers
    135.
    发明申请
    Dual-mode focal plane array for missile seekers 有权
    用于导弹搜寻者的双模焦平面阵列

    公开(公告)号:US20040004707A1

    公开(公告)日:2004-01-08

    申请号:US10334826

    申请日:2002-12-31

    Abstract: A single dual mode monolithic focal plane array having an active sensor and a passive sensing capability is switched from one mode to the other by switching the bias across the cells of the array from-a passive IR mode to an-active LADAR mode, with the monolithic dual mode focal plane array having applications in missile target seekers and laser target designators. The switching is accomplished by increasing the gain of the array by as much as 30 times that associated with IR detection when laser return pulses are expected. Thus, there need be no mechanical changes to the array to afford both passive IR sensing and an active LADAR pulse detector. Nor need there be two different focal plane arrays, one for IR and one for laser radiation, which leads to boresighted alignment problems.

    Abstract translation: 将具有主动传感器和被动感测能力的单个双模式单片焦平面阵列从一种模式切换到另一种模式,将跨过阵列的单元的偏置从 - 被动IR模式切换到主动LADAR模式,其中 单片双模焦平面阵列具有在导弹瞄准器和激光目标指示器中的应用。 当预期激光返回脉冲时,通过将阵列的增益增加多达与IR检测相关联的30倍来实现切换。 因此,不需要对阵列进行机械改变以提供无源IR感测和有源LADAR脉冲检测器。 也不需要有两个不同的焦平面阵列,一个用于IR,另一个用于激光辐射,这导致视觉对准问题。

    Methods for analyzing defect artifacts to precisely locate corresponding defects
    136.
    发明申请
    Methods for analyzing defect artifacts to precisely locate corresponding defects 失效
    分析缺陷伪影以精确定位相应缺陷的方法

    公开(公告)号:US20030222220A1

    公开(公告)日:2003-12-04

    申请号:US10370206

    申请日:2003-02-18

    CPC classification number: G01R31/308

    Abstract: Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enhance the thermal contrast between defects and the surrounding features, enabling IR imaging equipment to acquire improved thermographic images. In some embodiments, a combination of AC and DC test vectors maximize power transfer to expedite heating, and therefore testing. Mathematical transformations applied to the improved images further enhance defect detection and analysis. Some defects produce image artifacts, or nulldefect artifacts,null that obscure the defects, rendering difficult the task of defect location. Some embodiments employ defect-location algorithms that analyze defect artifacts to precisely locate corresponding defects.

    Abstract translation: 描述了使用红外热像仪提供改进的缺陷检测和分析的方法和系统。 测试载体对待测器件的热特征产生用于识别缺陷的热特性。 测试矢量定时以增强缺陷和周围特征之间的热对比度,使IR成像设备能够获得改进的热成像图像。 在一些实施例中,AC和DC测试矢量的组合使功率传递最大化,以加速加热,并因此测试。 应用于改进图像的数学变换进一步增强了缺陷检测和分析。 一些缺陷会产生图像伪像或“缺陷伪像”,这样会掩盖缺陷,从而使缺陷位置的任务变得困难。 一些实施例采用分析缺陷伪像的缺陷位置算法来精确地定位相应的缺陷。

    Sensor array for image recognition
    137.
    发明申请
    Sensor array for image recognition 失效
    用于图像识别的传感器阵列

    公开(公告)号:US20030189173A1

    公开(公告)日:2003-10-09

    申请号:US10380939

    申请日:2003-03-19

    Inventor: Thorsten Kohler

    Abstract: The invention relates to a sensor array for image recognition, comprising several optical sensor elements (R, G, B) of a first type that are disposed in the shape of a grid and react to light in the visible wavelength range, wherein additional sensor elements (IR) of a second type are provided in addition to the sensor elements (R, G, B) of the first type, which react to light in the invisible wavelength range.

    Abstract translation: 本发明涉及一种用于图像识别的传感器阵列,包括第一类型的光学传感器元件(R,G,B),其布置成格栅形状并对可见光波长范围内的光进行反应,其中附加传感器元件 除了第一类型的传感器元件(R,G,B)之外,还提供了第二类型(IR),其对于不可见的波长范围的光进行反应。

    Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system
    138.
    发明申请
    Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system 有权
    光热调制反射和光热红外辐射系统的组合方法和系统

    公开(公告)号:US20030150993A1

    公开(公告)日:2003-08-14

    申请号:US10315588

    申请日:2002-12-10

    CPC classification number: G01N21/1717 G01N21/171 G01N21/9501

    Abstract: A method and apparatus for evaluating a semiconductor wafer. A combination of a photothermal modulated reflectance method and system with a photothermal IR radiometry system and method is utilized to provide information which can be used to determine properties of semiconductor wafers being evaluated. The system and method can provide for utilizing a common probe source and a common intensity modulated energy source. The system and method further provide an infrared detector for monitoring changes in infrared radiation emitted from a sample, and photodetector for monitoring changes in beam reflected from the sample.

    Abstract translation: 一种用于评估半导体晶片的方法和装置。 利用光热调制反射方法和具有光热IR辐射测量系统和方法的系统的组合来提供可用于确定被评估的半导体晶片的性质的信息。 该系统和方法可以提供利用公共探测源和共同的强度调制能量源。 该系统和方法还提供一种红外检测器,用于监测从样品发射的红外辐射的变化,以及用于监测从样品反射的光束变化的光电检测器。

    Frequency scanning pulsed laser having synchronously set subthreshold current
    139.
    发明申请
    Frequency scanning pulsed laser having synchronously set subthreshold current 有权
    频率扫描脉冲激光器具有同步设置的亚阈值电流

    公开(公告)号:US20030127596A1

    公开(公告)日:2003-07-10

    申请号:US10284781

    申请日:2002-10-31

    Abstract: The present invention provides methods and apparatus for flexible and reproducible control ofquantum cascade laser frequency scans having short (nanosecond) pulse excitations. In accordance with a preferred embodiment of the invention, a method of digital frequency control for pulsed quantum cascade lasers includes digitally synthesizing a sub-threshold current, converting the sub-threshold current to analog form, and generating laser pulses. Preferably, the sub-threshold current is synchronized to the laser pulses.

    Abstract translation: 本发明提供了具有短(纳秒)脉冲激励的量子级联激光频率扫描的灵活和可重复控制的方法和装置。 根据本发明的优选实施例,脉冲量子级联激光器的数字频率控制方法包括数字合成亚阈值电流,将亚阈值电流转换为模拟形式,并产生激光脉冲。 优选地,子阈值电流与激光脉冲同步。

    Window assembly
    140.
    发明申请
    Window assembly 审中-公开
    窗户装配

    公开(公告)号:US20030122081A1

    公开(公告)日:2003-07-03

    申请号:US10283390

    申请日:2002-10-29

    Abstract: An analyte detection system for non-invasively determining the concentration of an analyte in a sample is described. The detection system includes a window assembly consisting of a main layer adapted to allow electromagnetic radiation to pass therethrough, and a heater layer adapted to exchange heat to the sample. The system also includes a detector adapted to detect electromagnetic radiation emitted by the sample and passed through the window assembly. The analyte detection system also includes a control system in electrical communication with the heater layer and adapted to cause the heater layer to exchange heat to the sample. The main layer of the window assembly may be made from a variety of materials such as germanium, silicon, and chemical vapor deposited diamond.

    Abstract translation: 描述了用于非侵入性地确定样品中分析物浓度的分析物检测系统。 检测系统包括由适于允许电磁辐射通过的主层组成的窗口组件和适于将热量交换到样品的加热器层。 该系统还包括一个检测器,适用于检测样品发射的电磁辐射并通过窗户组件。 分析物检测系统还包括与加热器层电连通并适于使加热器层向样品进行热交换的控制系统。 窗组件的主层可以由诸如锗,硅和化学气相沉积金刚石的各种材料制成。

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