Abstract:
An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.
Abstract:
A pulse generating apparatus capable of calibration and calibrating method are disclosed. The pulse generating apparatus includes a pulse generator and a delay detector. The pulse generator is configured to repeatedly generate a testing pulse. The delay detector is electrically connected with the pulse generator. When the pulse generator generates the testing pulse, the delay detector detects a feature value of the testing pulse at a plurality detecting time points, and calculates a calibration value according to the detected feature values. The delay detector outputs the calibration value to the pulse generator and the pulse generator adjusts the testing pulse according to the calibration value.
Abstract:
A radiator module system for automatic test equipment, including a test arm and a closed-loop circulating cooling device disposed on the test arm. The test arm includes a test head, and an internal channel is formed within and passing through the test head. The closed-loop circulating cooling device includes an inlet and an outlet, respectively connected to the internal channel; a conduit connecting the inlet and the outlet, such that the conduit and the internal channel form a closed-loop circulating channel in which a working fluid flows; a cooling device in contact with the conduit, configured to perform heat dissipation to the working fluid flowing within the conduit; and a driving source configured to drive the working fluid to flow within the closed-loop circulating channel. The working fluid is driven by the driving source to flow within the closed-loop circulating channel to perform heat dissipation.
Abstract:
A tray for placing a plurality of pouch-type batteries is provided. The tray includes a frame, at least a drive shaft, a plurality of fixed plates and a plurality of movable plates. The drive shaft is slidably fixed to the frame along a drive axis, where the drive shaft has a positioning device for fixing a relative position of the drive shaft with respect to the frame. The fixed plates are perpendicular to the drive axis, and are arranged in order along the drive axis and fixed within the frame. The movable plates are also perpendicular to the drive axis, and are arranged in order along the drive axis within the frame, and the movable plates are interlaced with the fixed plates. The movable plates are moved together with the drive shaft, and each of the movable plates and each of the fixed plates define a receiving space for receiving the pouch-type battery, and are used for clamping each of the pouch-type batteries.
Abstract:
A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.
Abstract:
The invention discloses a method of constructing light-measuring look-up table, a light-measuring method, and a light-measuring system. The method of constructing light-measuring look-up table is to construct a look-up table by according to spectrum parameters relative to a light spectrum model, three actual color-matching functions relative to the light-measuring system and three standard color-matching functions, calculating both a look-up color coordinate and a reference color coordinate corresponding to each of the spectrum parameters. The light-measuring method includes: first, measuring a to-be-measured light by the light-measuring system to obtain actual stimulus values and calculating an actual color coordinate; then, comparing the actual color coordinate with the look-up color coordinates to determine both a to-be-measured light spectrum parameter and an estimated color coordinate relative to the to-be-measured light; furthermore, according to the to-be-measured light spectrum parameter, one of the standard color-matching functions and one of the actual stimulus values, calculating an estimated luminance.
Abstract:
A surface pattern detecting method includes: capturing a surface image of a sample element to be detected, wherein the surface image containing N grayscale pixels and wherein the N is a positive integer; selecting f×N pixels with small grayscale value based on a selection ratio f in order to define a pattern zone and further calculating a pattern mean of the pattern zone based on pixel amount and grayscale value of the pattern zone; selecting f×N pixels with big grayscale value in order to define a background zone and further calculating a background mean of the background zone based on pixel amount and grayscale value of the background zone; and determining whether the surface image has a defect based on the pattern means of the pattern zone and the background mean of the background zone.
Abstract:
The present invention relates to a distance adjustment system and a solar wafer inspection machine provided with the system. The inspection machine has a conveyer for carrying a solar wafer, an optical inspection system for inspecting the surface and color appearance of the wafer and an illumination inspection system. A holder is provided in the inspection position where the wafer is clamped along its width direction to prevent the wafer from offset. During the opto-electrical inspection, probes are brought into contact with conductive buses of the wafer and light is applied to the wafer to allow the probing of electric energy thus generated. An adjusting device is employed to adjust the clamping gap of the holder and the distance of the probes in accordance with the size of the solar wafer. The data are collected and transmitted to a sorting system for sorting the wafer.
Abstract:
The present invention discloses a light source with uniform chromaticity and luminance and a color sensor having the same. The light source includes multiple LED devices, a primary light guide plate assembly and a secondary light guide plate assembly. The chromaticity and luminance of light emitted from the LED devices are uniformized for the first time in the primary light guide plate assembly and then guided into the secondary light guide plate assembly for the secondary chromaticity and luminance uniformization, to thereby act as the light source of the color sensor. Therefore, the light source not only provides better chromaticity and luminance uniformization effects, but is further qualified as the standard illuminant D65, thereby enabling more precise color sensor inspection results.
Abstract:
The invention provides a battery charging and discharging apparatus and method. The battery charging and discharging apparatus comprises a power source and a plurality of charging and discharging module. The charging and discharging module comprises a current-limiting transistor, a current-limiting resistor, a charging controlling unit, and a discharging controlling unit, wherein both the charging controlling unit and the discharging controlling unit are of battery voltage tracking types. When the charging and discharging module charges a battery, the voltage across two ends of the current-limiting transistor and the current-limiting resistor connected in series is limited to a fixed value by the charging controlling unit. When the battery discharges, the voltage across two ends of the current-limiting transistor and the current-limiting resistor connected in series is limited to a fixed value by the discharging controlling unit. Besides, the discharging controlling unit feedbacks the discharging energy from the battery to the power source.