公开(公告)号：US20140103954A1

公开(公告)日：2014-04-17

申请号：US14048785

申请日：2013-10-08

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN ,  Herbert TSAI ,  Chin-Yi OU YANG

IPC: G01R31/26

CPC classification number: G01R31/2601 ,  G01R31/2887 ,  G01R31/2893

Abstract: A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.

Abstract translation: 具有用于测试半导体部件的旋转测试臂的测试系统包括传送装置，第一测试插座，第二测试插座，第一测试臂和第二测试臂。 第一测试插座和第二测试插座分别电连接到不同的测试信号，并对应于第一测试臂和第二测试臂。 第一测试臂和第二测试臂测试臂旋转操作以将半导体组件携带并放置到传输设备，第一测试插座和第二测试插座，从而提高测试时间。