公开(公告)号：US20160191032A1

公开(公告)日：2016-06-30

申请号：US14971044

申请日：2015-12-16

Applicant: CHROMA ATE INC.

Inventor： Cheng-Hsien CHANG ,  Ching-Hua CHU ,  Shin-Wen LIN

IPC: H03K5/135 ,  G06F1/04

CPC classification number: H03K5/135 ,  G06F1/04 ,  G06F1/06 ,  H03K2005/00078

Abstract: A clock generating device includes a first timing delay module, a multiplexer, and a second timing delay module. The multiplexer is electrically connected to the first timing delay module. The second timing delay module is electrically connected to the multiplexer. The first timing delay module generates a plurality of delayed clock signals based on a reference clock signal. The multiplexer outputs a first delayed clock signal and a second delayed clock signal, among the plurality of delayed clock signals, based on a clock generating signal. The second timing delay module generates an output clock signal based on the clock generating signal, the first delayed clock signal and the second delayed clock signal.

Abstract translation: 时钟产生装置包括第一定时延迟模块，多路复用器和第二定时延迟模块。 多路复用器电连接到第一定时延迟模块。 第二定时延迟模块电连接到多路复用器。 第一定时延迟模块基于参考时钟信号产生多个延迟的时钟信号。 复用器基于时钟产生信号在多个延迟时钟信号之间输出第一延迟时钟信号和第二延迟时钟信号。 第二定时延迟模块基于时钟产生信号，第一延迟时钟信号和第二延迟时钟信号产生输出时钟信号。

公开(公告)号：US20160124066A1

公开(公告)日：2016-05-05

申请号：US14928062

申请日：2015-10-30

Applicant: CHROMA ATE INC.

Inventor： Hou-Chun CHEN ,  Shin-Wen LIN ,  Ching-Hua CHU ,  Po-Kai CHENG

IPC: G01R35/00 ,  G01R31/28

CPC classification number: G01R35/005 ,  G01R31/2834 ,  G01R31/2882

Abstract: A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

Abstract translation: 提供校准板及其定时校准方法。 用于校准自动测试设备中测试通道的信号延迟的校准板可插拔地设置在自动测试设备中，并且包括校准组，第一公共节点和开关模块。 每个校准组包括第二公共节点和电连接到第二公共节点的导电焊盘。 每个导电焊盘选择性地和电连接到一个测试通道。 开关模块电连接到第一公共节点和每个第二公共节点。 当执行第一延迟校准过程时，第一公共节点和每个第二公共节点之间的连接被禁用。 当执行第二延迟校准过程时，构建第一公共节点和每个第二公共节点之间的连接。

公开(公告)号：US20180306856A1

公开(公告)日：2018-10-25

申请号：US15955668

申请日：2018-04-17

Applicant: CHROMA ATE INC.

Inventor： Ching-Hua CHU ,  Cheng-Hsien CHANG

IPC: G01R31/28

Abstract: A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

公开(公告)号：US20170168100A1

公开(公告)日：2017-06-15

申请号：US15373311

申请日：2016-12-08

Applicant: CHROMA ATE INC.

Inventor： Cheng-Hsien CHANG ,  Ching-Hua CHU

IPC: G01R29/02

CPC classification number: G01R29/02 ,  G01R31/3191 ,  G01R31/31922 ,  H03K3/011

Abstract: A pulse generating apparatus capable of calibration and calibrating method are disclosed. The pulse generating apparatus includes a pulse generator and a delay detector. The pulse generator is configured to repeatedly generate a testing pulse. The delay detector is electrically connected with the pulse generator. When the pulse generator generates the testing pulse, the delay detector detects a feature value of the testing pulse at a plurality detecting time points, and calculates a calibration value according to the detected feature values. The delay detector outputs the calibration value to the pulse generator and the pulse generator adjusts the testing pulse according to the calibration value.