METHOD AND DEVICE FOR TESTING AIR TIGHTNESS
    1.
    发明申请

    公开(公告)号:US20180188132A1

    公开(公告)日:2018-07-05

    申请号:US15846026

    申请日:2017-12-18

    Abstract: A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.

    ABSORPTION TESTING APPARATUS
    2.
    发明申请

    公开(公告)号:US20180172762A1

    公开(公告)日:2018-06-21

    申请号:US15846031

    申请日:2017-12-18

    Inventor: Po-Kai CHENG

    CPC classification number: G01R31/2891 G01R1/06716 G01R31/2863

    Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.

    CALIBRATION BOARD AND TIMING CALIBRATION METHOD THEREOF
    3.
    发明申请
    CALIBRATION BOARD AND TIMING CALIBRATION METHOD THEREOF 有权
    校准板和时序校准方法

    公开(公告)号:US20160124066A1

    公开(公告)日:2016-05-05

    申请号:US14928062

    申请日:2015-10-30

    CPC classification number: G01R35/005 G01R31/2834 G01R31/2882

    Abstract: A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

    Abstract translation: 提供校准板及其定时校准方法。 用于校准自动测试设备中测试通道的信号延迟的校准板可插拔地设置在自动测试设备中,并且包括校准组,第一公共节点和开关模块。 每个校准组包括第二公共节点和电连接到第二公共节点的导电焊盘。 每个导电焊盘选择性地和电连接到一个测试通道。 开关模块电连接到第一公共节点和每个第二公共节点。 当执行第一延迟校准过程时,第一公共节点和每个第二公共节点之间的连接被禁用。 当执行第二延迟校准过程时,构建第一公共节点和每个第二公共节点之间的连接。

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