公开(公告)号：US20240345157A1

公开(公告)日：2024-10-17

申请号：US18633564

申请日：2024-04-12

Applicant: MEDIATEK INC.

Inventor： Harry Hai Chen ,  Jeng-Yu Liao

IPC: G01R31/28

CPC classification number: G01R31/2884 ,  G01R31/2834

Abstract: A test method is provided for testing a circuit design. The test method includes inputting T test patterns into M sample chips to generate M test results where each sample chip is implemented with the circuit design and has N sensor positions, obtaining M mismatch counts of each sensor position according to the M test results, obtaining a mismatch parameter of the each sensor position according to the M mismatch counts of the each sensor position, selecting m sample chips from the M sample chips according to the M mismatch counts and the mismatch parameter of the each sensor position, selecting m test results from the M test results according to the m sample chips, and analyzing the m test results to obtain at least one critical point of the circuit design. M>m, and T, M, N and m are positive integers.

公开(公告)号：US12099085B2

公开(公告)日：2024-09-24

申请号：US17746498

申请日：2022-05-17

Applicant: Analog Devices International Unlimited Company

Inventor： Padraig Fitzgerald ,  Erkan Acar ,  Patrick M. McGuinness ,  Randy Oltman ,  Naveen Dhull ,  Derek W. Nolan ,  Eric James Carty

IPC: G01R31/28 ,  H01H1/00

CPC classification number: G01R31/2834 ,  H01H1/0036

Abstract: An apparatus is provided that is implemented to enable multiple tests of different types, such as a direct current (DC) test and/or a radio frequency (RF) test of a semiconductor device. The apparatus includes a microelectromechanical systems (MEMS) switch block coupled between the semiconductor device and automatic testing equipment (ATE). The apparatus is configured to enable/disable a DC path or an RF path to switch between a DC test and an RF test without reconfiguring the connections between the semiconductor device and the ATE. The DC path is used to perform a DC contact test for one or more pins of the semiconductor device. The RF path is used to perform an RF test for the semiconductor device.

公开(公告)号：US12072372B2

公开(公告)日：2024-08-27

申请号：US17903344

申请日：2022-09-06

Applicant: STMicroelectronics S.r.l.

Inventor： Matteo Brivio ,  Nicola De Campo ,  Matteo Venturelli

IPC: G01R31/28

CPC classification number: G01R31/2834

Abstract: A system, method, and device to test an electronic circuit are disclosed having a stage to supply a driving signal to a load comprising a pull-up switch and a pull-down switch and a pre-driver stage including pre-driver circuits. The electronic circuit including circuits for testing the pre-driver stage under the control of an automatic testing equipment (ATE) to operate a built-in self-test sequence including test commands for the pre-driver stage under the control of an external test signal issued by the ATE. The system includes a time measuring circuit to measure duration of signals at the output of the stage coupled to a pass-fail check circuit, and to evaluate if the duration of signals at the output of the stage to determine whether the output satisfies a pass criterion.

公开(公告)号：US12050248B2

公开(公告)日：2024-07-30

申请号：US18304691

申请日：2023-04-21

Applicant: HUAWEI TECHNOLOGIES CO., LTD.

Inventor： Yu Huang ,  Weiwei Zhang

IPC: G01R31/3183 ,  G01R31/28 ,  G01R31/317 ,  G01R31/3177 ,  G01R31/3185 ,  H03K19/173 ,  H03K19/21

CPC classification number: G01R31/318335 ,  G01R31/31713 ,  G01R31/3177 ,  G01R31/318536 ,  H03K19/1733 ,  H03K19/21 ,  G01R31/2834

Abstract: This application provides decompression circuits. An example decompression circuit includes a plurality of sub-circuits. The sub-circuit includes a plurality of cellular automaton (CA) circuits and a phase shifter. Each of the plurality of CA circuits includes a first XOR circuit and a register. The first XOR circuit includes a first input end, a second input end, and an output end. A data input end of the register is coupled to the output end of the first XOR circuit. A data output end of the register is coupled to the first input end of the first XOR circuit and an input end of the phase shifter. The data output end of the register is further coupled to the second input end of the first XOR circuit in a different CA circuit. The phase shifter is configured to output a test signal.

公开(公告)号：US12044720B1

公开(公告)日：2024-07-23

申请号：US17801529

申请日：2022-04-18

Applicant: Macrotest Semiconductor Inc.

Inventor： Guoliang Mao

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2834

Abstract: The present disclosure discloses a multi-core test processor, and an integrated circuit test system and method. The multi-core test processor includes a co-test-processor-sync-controller, a master-test-processor, two or more co-test-processors, and a test subsystem command switching device. Several co-test-processors are introduced under the master-test-processor. The master-test-processor will deliver test patterns that require concurrent testing to the co-test-processors for execution, so as to complete test items similar to the asynchronous signal match test. After the co-test-processors complete the test, the master-test-processor continues to carry out the subsequent test. The present disclosure can achieve asynchronous concurrent test on multiple sites and improve the test efficiency. Meanwhile, idling of fewer test channels can be avoided when asynchronous test channels are allocated to each site, thereby improving test channel utilization rate.

公开(公告)号：US20240230750A1

公开(公告)日：2024-07-11

申请号：US18408034

申请日：2024-01-09

Applicant: Guangdong Yang Dili Electric Technology Co., Ltd.

Inventor： SiPing Zeng ,  YongDe Chen ,  YuKai Li

IPC: G01R31/28

CPC classification number: G01R31/2834

Abstract: A detection method for wiring relationship of electrical components is disclosed. An acquisition unit for the wiring relationship of electrical components is used, and the acquisition unit includes a master controller, a control input coding module, a control output coding module, an acquisition signal input and output module, a control input decoding and control analog switch module, a control output decoding and control analog switch module, a relay control wiring separate drive, an acquisition signal module, a wiring terminal module, and also a data transmission module. The detection method can realize multi-point wiring relationship detection technology. A collected wiring relationship of electrical components is restored into a circuit schematic, through comparison a standard circuit diagram with a restored circuit schematic to determine whether correctness of a physical wiring way, which can truly realize a low-level electrical connection line to be transformed into digital electrical circuit equipment for human-computer interaction.

公开(公告)号：US20240210467A1

公开(公告)日：2024-06-27

申请号：US18394821

申请日：2023-12-22

Applicant: Infineon Technologies AG

Inventor： Till Schloesser ,  Axel Reithofer ,  Jens Berrenscheen

IPC: G01R31/28

CPC classification number: G01R31/2884 ,  G01R31/2834 ,  H01L29/402

Abstract: One exemplary embodiment relates to a circuit which is integrated into a semiconductor substrate and which comprises a lateral field effect transistor having a drift region and a field plate electrode, which is isolated from the drift region by an isolation zone. The integrated circuit further comprises a first terminal, which is coupled to the field plate electrode, for applying a test voltage to the field plate electrode in a test operating mode. An electronic switch is configured to connect the field plate electrode to a circuit node that is at a reference voltage in a normal operating mode of the integrated circuit. The integrated circuit further comprises a second terminal, which is connected to a control terminal of the electronic switch and is configured to receive a control signal for switching on or off the electronic switch.

公开(公告)号：US12013430B1

公开(公告)日：2024-06-18

申请号：US18408034

申请日：2024-01-09

Applicant: Guangdong Yang Dili Electric Technology Co., Ltd.

Inventor： SiPing Zeng ,  YongDe Chen ,  YuKai Li

IPC: G01R31/28 ,  G01R31/55 ,  G01R35/02

CPC classification number: G01R31/2834

Abstract: A detection method for wiring relationship of electrical components is disclosed. An acquisition unit for the wiring relationship of electrical components is used, and the acquisition unit includes a master controller, a control input coding module, a control output coding module, an acquisition signal input and output module, a control input decoding and control analog switch module, a control output decoding and control analog switch module, a relay control wiring separate drive, an acquisition signal module, a wiring terminal module, and also a data transmission module. The detection method can realize multi-point wiring relationship detection technology. A collected wiring relationship of electrical components is restored into a circuit schematic, through comparison a standard circuit diagram with a restored circuit schematic to determine whether correctness of a physical wiring way, which can truly realize a low-level electrical connection line to be transformed into digital electrical circuit equipment for human-computer interaction.

公开(公告)号：US11982597B2

公开(公告)日：2024-05-14

申请号：US17870869

申请日：2022-07-22

Applicant: Kyutaek Cho

Inventor： Myung Ki Kim

IPC: G01M99/00 ,  B25J9/16 ,  B65G61/00 ,  G01L25/00 ,  G01R31/28 ,  G03B43/00 ,  G06F3/041 ,  G06F11/263 ,  G06F11/267 ,  G06F11/273 ,  G10K11/16 ,  G10L25/51 ,  H04N17/00 ,  H04R29/00

CPC classification number: G01M99/005 ,  B25J9/161 ,  B25J9/1674 ,  B65G61/00 ,  G01L25/00 ,  G01M99/008 ,  G01R31/2834 ,  G03B43/00 ,  G06F3/0416 ,  G06F11/263 ,  G06F11/267 ,  G06F11/273 ,  G06F11/2733 ,  G10K11/16 ,  G10L25/51 ,  H04N17/002 ,  H04R29/001 ,  H04R29/004

Abstract: An automatic robot control system and methods relating thereto are described. These systems include components such as a touch screen panel (“TSP”) robot controller for controlling a TSP robot, a camera robot controller for controlling a camera robot and an audio robot controller for controlling an audio robot. The TSP robot operates inside a TSP testing subsystem, the camera robot operates inside a camera testing subsystem, and the audio robot operates inside an audio testing subsystem. Inside the audio testing subsystem, an audio signals measurement system, using a bi-directional coupling, controls the operation of the audio robot controller. In this control scheme, a test application controller is designed to control the different types of subsystem robots. Methods relating to TSP, camera, and audio robots, and their controllers, taken individually or in combination, for automatic testing of device functionalities are also described.

公开(公告)号：US11953544B1

公开(公告)日：2024-04-09

申请号：US18337973

申请日：2023-06-20

Applicant: The ADT Security Corporation

Inventor： Jeron E. Bornstein

IPC: G01R31/28

CPC classification number: G01R31/2834 ,  G01R31/287 ,  G01R31/2874

Abstract: A system for testing a sensor and a hub is provided. The system includes a testing control device and a sensor testing device. The testing control device is configured to select a testing profile based at least in part on the sensor, and transmit a testing initiation signal based at least in part on the testing profile. The sensor testing device is configured to perform testing of the sensor and the hub in response to the testing initiation signal, the testing including rotating the sensor along at least one axis based at least in part on the testing profile, and transmit test data to the testing control device based at least in part on the testing of the sensor and the hub. The testing control device is configured to receive the test data from the sensor testing device.