Optical module unlocking apparatus, optical module, and optical communication device

    公开(公告)号:US12117655B2

    公开(公告)日:2024-10-15

    申请号:US17850360

    申请日:2022-06-27

    CPC classification number: G02B6/387 G02B6/3858 G02B6/3893

    Abstract: An optical module unlocking apparatus includes a housing, including a base and a mounting portion connected to one end of the base. The base has an accommodation area for installing a circuit board and an electrical component. The apparatus also includes an unlocking component, including an unlocking arm movably connected to the housing. The unlocking arm has an abutment portion for abutting against an elastomer of a cage, and the unlocking component is configured to push the unlocking arm outward relative to the housing in an insertion direction under an action of external force to separate the abutment portion from the elastomer. The apparatus further includes an elastic component on an outer side surface of the mounting portion and outside the accommodation area. A first end of the elastic component is connected to the mounting portion and a second end of the elastic component is connected to the mounting portion.

    Optical module unlocking apparatus, optical module, and optical communications device

    公开(公告)号:US12044890B2

    公开(公告)日:2024-07-23

    申请号:US17852582

    申请日:2022-06-29

    CPC classification number: G02B6/4261 G02B6/4292 G02B6/4262

    Abstract: An optical module unlocking apparatus includes: a base, a sliding member, a driving piece, and an elastic piece. The sliding member is slidably disposed on the base along an insertion direction. The driving piece is rotatably connected to the base, the other end of the sliding member is connected to the driving piece, and the driving piece can rotate from a locked state to an unlocked state relative to the base under an action of external force, and drive the sliding member to move relative to the base along the insertion direction. A second connecting part is disposed on the driving piece. Because the driving piece is located outside a cage, space for disposing the elastic piece on the driving piece is sufficient, and the driving piece does not need to fit a spring plate. This simplifies a structure of the optical module and improves processing efficiency.

    TEST CIRCUIT IN CHIP AND CIRCUIT TEST METHOD

    公开(公告)号:US20230204661A1

    公开(公告)日:2023-06-29

    申请号:US18176025

    申请日:2023-02-28

    Abstract: A test circuit transmits input data of a test vector to a data distribution circuit using an input of a test bus, and transmits the input data of the test vector to a scan input channel in a circuit under test using the data distribution circuit. After scan of the circuit under test is completed, output data of the test vector on a scan output channel in the circuit under test is transmitted to an output of the test bus using the data distribution circuit, to complete testing of the circuit under test. A dynamic correspondence between the data distribution circuit and the test bus may be configured based on a specific test solution, so that a test resource can be dynamically allocated.

    DISPLAY METHOD AND ELECTRONIC DEVICE
    6.
    发明公开

    公开(公告)号:US20240345792A1

    公开(公告)日:2024-10-17

    申请号:US18682406

    申请日:2022-08-01

    CPC classification number: G06F3/1446 G06F3/04845

    Abstract: A display method and an electronic device that relate to the field of terminal technologies are provided. A first electronic device can obtain identification information of a plurality of second electronic devices- and establish a correspondence between a display region of the first electronic device and identification information of each second electronic device. Therefore, the second electronic devices can automatically display content in different display regions based on the correspondence. The method includes performing, by the first electronic device, sending a display configuration message, receiving identification information sent by a second electronic device, establishing a correspondence between a display region and the identification information, and sending the correspondence and displayed display content. In this way, the second electronic device can determine, based on the correspondence, a part or all of display content that is in the received display content and that corresponds to the display region.

    METHOD FOR DESIGNING TEST CIRCUIT AND ELECTRONIC DEVICE

    公开(公告)号:US20240249054A1

    公开(公告)日:2024-07-25

    申请号:US18426293

    申请日:2024-01-29

    CPC classification number: G06F30/333 G06F30/323

    Abstract: A method for designing a test circuit, includes determining a feature of a to-be-tested circuit based on data representing the to-be-tested circuit. The method further includes determining switch distribution for the to-be-tested circuit based on the feature of the to-be-tested circuit. The switch distribution represents distribution, in a two-dimensional switch matrix circuit, of a plurality of switches that are in a test circuit and that are coupled to a plurality of scan chains of the to-be-tested circuit. The switch matrix circuit includes a plurality of rows and a plurality of columns, any one of the plurality of rows has at least one of the plurality of switches, and any one of the plurality of columns has at least one of the plurality of switches.

    Pluggable apparatus
    8.
    发明授权
    Pluggable apparatus 有权
    可插拔设备

    公开(公告)号:US08465215B1

    公开(公告)日:2013-06-18

    申请号:US13763254

    申请日:2013-02-08

    CPC classification number: G02B6/36 G02B6/4246 G02B6/4261 G02B2006/4297

    Abstract: A pluggable apparatus is provided in the present invention. The pluggable apparatus includes one base, one pull tab, at least one elastic piece, two sliding plates, and one front cover. The pull tab includes two rotary shafts arranged symmetrically and is rotatably arranged at one end of the base through the rotary shafts. The at least one elastic piece includes one first elastic arm and one second elastic arm. The at least one elastic piece is arranged on one of the rotary shafts of the pull tab and is held against the pull tab through the first elastic arm. The two sliding plates are slidably arranged on two sides of the base and are connected to the pull tab. The front cover is arranged on the base and is held against the second elastic arm of the elastic piece.

    Abstract translation: 本发明提供一种可插拔装置。 可插拔装置包括一个底座,一个拉片,至少一个弹性件,两个滑板和一个前盖。 拉片包括对称布置的两个旋转轴,并且通过旋转轴可旋转地布置在基部的一端。 所述至少一个弹性件包括一个第一弹性臂和一个第二弹性臂。 所述至少一个弹性件布置在所述拉片的一个旋转轴上并通过所述第一弹性臂保持抵靠所述拉片。 两个滑板可滑动地布置在基座的两侧并且连接到拉片。 前盖设置在基座上并且被保持抵靠弹性件的第二弹性臂。

    Display Picture Synchronization Method, System, and Electronic Device

    公开(公告)号:US20250045007A1

    公开(公告)日:2025-02-06

    申请号:US18712138

    申请日:2022-11-14

    Abstract: A display picture synchronization method includes a source device that sends a first picture frame and a first specified display time corresponding to the first picture frame to each of the sink devices. If each of the sink devices successfully receives the first picture frame and determines that the first picture frame is capable of being displayed based on the first specified display time, each of the devices for performing picture frame synchronization display displays the first picture frame based on the first specified display time. Each of the devices for performing picture frame synchronization display does not display the first picture frame if a first sink device in the sink devices fails to receive the first picture frame or successfully receives the first picture frame but determines that the first picture frame is incapable of being displayed based on the first specified display time.

    Chip test circuit and circuit test method

    公开(公告)号:US12181519B2

    公开(公告)日:2024-12-31

    申请号:US18175306

    申请日:2023-02-27

    Abstract: This disclosure provides methods and apparatuses for testing a tested circuit. In an implementation, a chip test circuit transmits input data of a test vector to a data distribution circuit through an input of a test bus, and transmits the input data of the test vector to a scan input channel of a tested circuit through the data distribution circuit. After scanning of the tested circuit ends, output data of the test vector of the scan output channel of the tested circuit is transmitted to an output of the test bus through the data distribution circuit to complete the test of the tested circuit. A dynamic correspondence between the data distribution circuit and the test bus is implemented by configuring a first selector, so that test resources can be dynamically allocated.

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