知搜-全球专利检索

  1. 登录
  2. 注册

搜索结果

26 条记录 (耗时 0.011 秒)

    Epoxy-based infrared filter assembly and associated fabrication devices and method
    2.
    发明授权
    Epoxy-based infrared filter assembly and associated fabrication devices and method 有权

    公开(公告)号：US11880053B2

    公开(公告)日：2024-01-23

    申请号：US17405013

    申请日：2021-08-17

    申请人： Fermi Research Alliance, LLC

    发明人： Gabriel Spahn

    IPC分类号： G02B5/20 ,  G02B1/04 ,  G01T1/16 ,  G01K11/00 ,  G01J5/0802

    CPC分类号： G02B5/208 ,  G01K11/006 ,  G01T1/1606 ,  G02B1/04 ,  G01J5/0802

    摘要： Epoxy-based inline infrared (IR) filter assembly, and manufacture and use of the same. Co-axial infrared filter assemblies comprise a substantially cylindrical filter body forming a central cavity characterized by opposing holes at each end. The filter body forms an outer conductor, and SMA connectors coupled to the opposing holes at each end of the body are electrically coupled to form an inner conductor positioned along a long axis of the filter body. An infrared absorbing material (such as castable epoxy resin) fills the central cavity of the filter body. Methods for producing the co-axial infrared filter include pressing SMA connectors into the respective ends of the filter body, electrically coupling the SMA connectors, and filling the filter body with epoxy. Electronic systems for operating a dark matter detector include a feedline comprising a coaxial filter configured to advantageously block infrared noise.

    MEASUREMENT DEVICE
    6.
    发明公开
    MEASUREMENT DEVICE 审中-公开

    公开(公告)号：US20230221169A1

    公开(公告)日：2023-07-13

    申请号：US17726607

    申请日：2022-04-22

    申请人： WISTRON CORP.

    发明人： Yu-Ju LIU ,  Chia Ming LIANG ,  Chin-Kun TSAI

    IPC分类号： G01G19/52 ,  G01J5/00 ,  G01J5/0802

    CPC分类号： G01G19/52 ,  G01J5/0037 ,  G01J5/0802

    摘要： A measurement device includes a base, a platform, a temperature sensor, and a weighing component. The platform is movably disposed on the base. The temperature sensor is disposed on the base or the platform. The weighing component is accommodated in the base. The platform has a weight-measuring area and a temperature-measuring area which is located within the weight-measuring area and corresponding to the temperature sensor.

    Optical sensor
    8.
    发明授权
    Optical sensor 有权

    公开(公告)号：US12050134B2

    公开(公告)日：2024-07-30

    申请号：US17719519

    申请日：2022-04-13

    申请人： Murata Manufacturing Co., Ltd.

    发明人： Masatsugu Matsui

    IPC分类号： G01J5/04 ,  G01J5/02 ,  G01J5/0802

    CPC分类号： G01J5/046 ,  G01J5/0215 ,  G01J5/0225 ,  G01J5/0802

    摘要： An optical sensor includes a light receiver, a circuit portion having an electronic component electrically connected to the light receiver, a metal cap covering an upper portion of the light receiver and includes a cavity facing the light receiver, an optical filter in the cavity of the metal cap, and a metal stem connected to the metal cap, and the circuit portion is on the metal stem.

    Systems and methods of adaptive two-wavelength single-camera imaging thermography (ATSIT) for accurate and smart in-situ process temperature measurement during metal additive manufacturing
    9.
    发明授权
    Systems and methods of adaptive two-wavelength single-camera imaging thermography (ATSIT) for accurate and smart in-situ process temperature measurement during metal additive manufacturing 有权

    公开(公告)号：US11874176B2

    公开(公告)日：2024-01-16

    申请号：US17015062

    申请日：2020-09-08

    申请人： UNIVERSITY OF PITTSBURGH—OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION

    发明人： Xiayun Zhao ,  Chaitanya Krishna Prasad Vallabh

    IPC分类号： G01J5/08 ,  G01J5/59 ,  G02B27/28 ,  G01J5/0802 ,  G01J5/0804 ,  G01J5/00 ,  G01J5/48

    CPC分类号： G01J5/59 ,  G01J5/0802 ,  G01J5/0804 ,  G02B27/283 ,  G02B27/286 ,  G01J5/48 ,  G01J2005/0077

    摘要： A two-wavelength, single-camera imaging thermography system for in-situ temperature measurement of a target, comprising: a target light path inlet conduit for receiving a target light beam reflected from the target; a beam splitter installed in a splitter housing at a distal end of the target light path conduit, wherein the beam splitter divides the target light beam into a first light beam and a second light beam; a first light path conduit emanating from the splitter housing comprising a first aperture iris installed within the first light path conduit for aligning the first light beam; a first band pass filter installed within the first light path conduit for regulating the first light beam to a first wavelength λ1 and an optional half waveplate installed within the first light path conduit to modulate a polarization ratio of the first light beam of λ1 wavelength; a second light path conduit emanating from the splitter housing comprising a second aperture iris installed within the second light path conduit for aligning the second light beam; a second band pass filter installed within the second light path conduit for regulating the second light beam to a second wavelength λ2; a junction housing, wherein distal ends of each of the first and second light path conduits are connected to the junction housing; a polarizing beam splitter installed in the junction housing, wherein the polarizing beam splitter reflects the first light beam of λ1 wavelength along the same path or a parallel path of the second light beam of λ2 wavelength that passes directly through the polarizing beam splitter unreflected to create a merged light beam comprising light of λ1 and λ2 wavelengths; and a light path outlet conduit connected to the junction for directing the merged beam to a high-speed camera for imaging.

    Methods and apparatus for measuring edge ring temperature
    10.
    发明授权
    Methods and apparatus for measuring edge ring temperature 有权

    公开(公告)号：US11664250B2

    公开(公告)日：2023-05-30

    申请号：US17728461

    申请日：2022-04-25

    申请人： APPLIED MATERIALS, INC.

    发明人： Ji-Dih Hu ,  Wolfgang R. Aderhold ,  Dongming Iu

    IPC分类号： G01J5/00 ,  H01L21/00 ,  H01L21/67 ,  G01K7/01 ,  G01J5/0802 ,  G01J5/0818 ,  G01J5/0806

    CPC分类号： H01L21/67248 ,  G01J5/0802 ,  G01J5/0806 ,  G01J5/0818 ,  G01K7/01 ,  H01L21/67115

    摘要： An apparatus for measuring a temperature of an assembly that is internal to a process chamber. The apparatus may include a light pipe positioned between a lamp radiation filtering window and the assembly, the light pipe has a first end with a bevel configured to redirect infrared radiation emitted from the assembly through the light pipe and has a second end distal to the first end, an optical assembly configured to collimate, filter, and focus infrared radiation from the second end of the light pipe, an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation, a temperature circuit that transforms the at least one signal into a temperature value, and a controller that is configured to receive the temperature value and to make adjustments to other process parameters of process chamber based on the temperature value.