摘要:
An Infrared Detector Dewar system includes a housing and an infrared detector. The system also includes one or more strut members coupled on a first end to the housing. The system further includes cold shield coupled to the infrared detector and to a second end of the one or more strut members. The cold shield includes a reinforcement ring aligned with the one or more strut members. The cold shield is formed by forming a support member having disc encased by a support ring. The support member is positioned within a mandrel such that the reinforcement ring is disposed to align with a strut position. The cold shield is then formed by electroplating copper over the mandrel and at least a portion of the support member, and then by removing/dissolving all aforementioned mandrels.
摘要:
A flame detector includes a beam splitter to split mid-wave infrared radiation (MWIR) and long-wave infrared radiation (LWIR) into an MWIR component and an LWIR component. An MWIR detector detects the MWIR component and an LWIR detector detects the LWIR component. The flame detector analyzes the MWIR component to determine the presence of a flame and analyzes the LAIR component to determine whether the system is functioning properly.
摘要:
A motion sensor includes an infrared detector with a first set of detector elements and a second set of detector elements. The motion sensor also includes an optical system to direct electromagnetic energy from a first set of monitored volumes spaced at a pitch in a first direction onto the first set of detector elements and to direct electromagnetic energy from a second set of monitored volumes spaced at the pitch in the first direction onto the second set of detector elements. The second set of monitored volumes have an offset from the first set of monitored volumes in the first direction.
摘要:
A surface inspection apparatus and method of inspecting chip surfaces includes a laser generator that generates a periodic CW laser and is transformed into an inspection laser beam having a beam size smaller than a surface size of the chip. Thus, the inspection laser beam is irradiated onto a plurality of the semiconductor chips such that the semiconductor chips are partially and simultaneously heated. Thermal waves are detected in response to the inspection laser beam and thermal images are generated corresponding to the thermal waves. A surface image is generated by a lock-in thermography technique and hold exponent analysis of the thermal image, thereby generating surface image in which a surface defect is included. Time and accuracy of the surface inspection process is improved.
摘要:
An infrared detector (301) is provided which comprises a pyroelectric detector (303) having first and second sensing elements (345), an aperture stop (311), and a Fresnel lens array (305). The detector may be used as a passive infrared sensor unit for detecting intrusion into large openings.
摘要:
The wearable device incorporates a device for measuring the ambient temperature, which comprises an infrared sensor. In an ambient temperature measurement mode a control circuit activates the infrared sensor several times so that it can supply a plurality of measurement signals over a certain period of time. A circuit for processing measurement signals is then arranged in order to supply temperature values corresponding to at least a portion of the measurement signals and to take a mean for at least a portion of these temperature values to obtain an average temperature value that is considered to be representative of the ambient temperature. The invention also relates to a method for measuring the ambient temperature that can be implemented by means of this wearable device.
摘要:
Systems, methods, and apparatus for providing electromagnetic radiation sensing. The apparatus includes a radiation detection sensor including a plurality of micromechanical radiation sensing pixels having a reflecting top surface and configured to deflect light incident on the reflective surface as a function of an intensity of sensed radiation. In some implementations, the apparatus has equal sensitivities for at least some of the sensing pixels. In some implementations, the apparatus can provide adjustable sensitivity and measurement range. The apparatus can be utilized for human detection, fire detection, gas detection, temperature measurements, environmental monitoring, energy saving, behavior analysis, surveillance, information gathering and for human-machine interfaces.
摘要:
A surface inspection apparatus and method of inspecting chip surfaces includes a laser generator that generates a periodic CW laser and is transformed into an inspection laser beam having a beam size smaller than a surface size of the chip. Thus, the inspection laser beam is irradiated onto a plurality of the semiconductor chips such that the semiconductor chips are partially and simultaneously heated. Thermal waves are detected in response to the inspection laser beam and thermal images are generated corresponding to the thermal waves. A surface image is generated by a lock-in thermography technique and hold exponent analysis of the thermal image, thereby generating surface image in which a surface defect is included. Time and accuracy of the surface inspection process is improved.
摘要:
A semiconductor device comprising an infrared sensor assembly for sensing infrared radiation is described. The infrared sensor assembly comprises a single sensing element for sensing infrared radiation and an aperture means comprising a plurality of apertures. The sensing element and the aperture means thereby are positioned with respect to each other so that the plurality of apertures are positioned in front of the same, single sensing element so that the plurality of apertures limit the field of view of the same, single sensing element for impinging radiation.