All-digital phase locked loop using switched capacitor voltage doubler

    公开(公告)号:US11177810B2

    公开(公告)日:2021-11-16

    申请号:US17112450

    申请日:2020-12-04

    摘要: An all-digital phase locked loop (ADPLL) receives an analog input supply voltage which is utilized to operate analog circuitry within the ADPLL. The ADPLL of the present disclosure scales this analog input supply voltage to provide a digital input supply voltage which is utilized to operate digital circuitry within the ADPLL. The analog circuitry includes a time-to-digital converter (TDC) to measure phase errors within the ADPLL. The TDC can be characterized as having a resolution of the TDC which is dependent, at least in part, upon the digital input supply voltage. In some situations, process, voltage, and/or temperature (PVT) variations within the ADPLL can cause the digital input supply voltage to fluctuate, which in turn, can cause fluctuations in the resolution of the TDC. These fluctuations in the resolution of the TDC can cause in-band phase noise of the ADPLL to vary across the PVT variations. The digital circuitry regulates the digital input supply voltage to stabilize the resolution of the TDC across the PVT variations. This stabilization of the resolution of the TDC can cause the ADPLL to maintain a fixed in-band phase noise across the PVT variations.

    All-digital phase locked loop using switched capacitor voltage doubler

    公开(公告)号:US10326454B2

    公开(公告)日:2019-06-18

    申请号:US15965110

    申请日:2018-04-27

    摘要: An all-digital phase locked loop (ADPLL) receives an analog input supply voltage which is utilized to operate analog circuitry within the ADPLL. The ADPLL of the present disclosure scales this analog input supply voltage to provide a digital input supply voltage which is utilized to operate digital circuitry within the ADPLL. The analog circuitry includes a time-to-digital converter (TDC) to measure phase errors within the ADPLL. The TDC can be characterized as having a resolution of the TDC which is dependent, at least in part, upon the digital input supply voltage. In some situations, process, voltage, and/or temperature (PVT) variations within the ADPLL can cause the digital input supply voltage to fluctuate, which in turn, can cause fluctuations in the resolution of the TDC. These fluctuations in the resolution of the TDC can cause in-band phase noise of the ADPLL to vary across the PVT variations. The digital circuitry regulates the digital input supply voltage to stabilize the resolution of the TDC across the PVT variations. This stabilization of the resolution of the TDC can cause the ADPLL to maintain a fixed in-band phase noise across the PVT variations.

    PVT-free calibration circuit for TDC resolution in ADPLL
    7.
    发明授权
    PVT-free calibration circuit for TDC resolution in ADPLL 有权
    ADPLL中用于TDC分辨率的无PVT校准电路

    公开(公告)号:US08570082B1

    公开(公告)日:2013-10-29

    申请号:US13778478

    申请日:2013-02-27

    IPC分类号: H03L7/06

    摘要: The present disclosure relates to an all digital phase locked loop (APDLL) that can account for variations in PVT conditions, and a related method of formation. In some embodiments, the ADPLL has a controllable time-to-digital converter (TDC) having a plurality of variable delay elements. The controllable TDC is determines a phase difference between a frequency reference signal and a local oscillator clock signal and to generate a phase error therefrom. A digitally controlled oscillator (DCO) varies a phase of the local oscillator clock signal based upon the phase error. A calibration unit determines an effect of variations in PVT (process, voltage, and temperature) conditions based upon the phase error and to generate a TDC tuning word that adjusts a delay introduced by one or more of the plurality of variable delay elements to account for the variations in PVT conditions.

    摘要翻译: 本公开涉及可以解释PVT条件变化的全数字锁相环(APDLL)以及相关的形成方法。 在一些实施例中,ADPLL具有具有多个可变延迟元件的可控时间 - 数字转换器(TDC)。 可控TDC确定频率参考信号和本地振荡器时钟信号之间的相位差,并从其产生相位误差。 数字控制振荡器(DCO)根据相位误差改变本地振荡器时钟信号的相位。 校准单元基于相位误差来确定PVT(过程,电压和温度)变化的变化的影响,并且生成调整由多个可变延迟元件中的一个或多个引入的延迟的TDC调谐字以解释 PVT条件的变化。

    Germanium Photodetector Embedded in a Multi-Mode Interferometer

    公开(公告)号:US20220326443A1

    公开(公告)日:2022-10-13

    申请号:US17808813

    申请日:2022-06-24

    IPC分类号: G02B6/293 G02B6/122

    摘要: A method includes etching a silicon layer to form a silicon slab and an upper silicon region over the silicon slab, and implanting the silicon slab and the upper silicon region to form a p-type region, an n-type region, and an intrinsic region between the p-type region and the n-type region. The method further includes etching the p-type region, the n-type region, and the intrinsic region to form a trench. The remaining portions of the upper silicon region form a Multi-Mode Interferometer (MMI) region. An epitaxy process is performed to grow a germanium region in the trench. Electrical connections are made to connect to the p-type region and the n-type region.