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公开(公告)号:US20210344861A1
公开(公告)日:2021-11-04
申请号:US17375100
申请日:2021-07-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H04N5/345 , H04N5/347 , H04N5/3745 , H04N9/04 , H04N5/369 , H01L27/146
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US20200053306A1
公开(公告)日:2020-02-13
申请号:US16658522
申请日:2019-10-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang Hyun Cho , Ji Yong Park , Dae Hwa Paik , Kyoung Min Koh , Min Ho Kwon , Seung Hyun Lim
Abstract: An image sensor chip includes an internal voltage generator for generating internal voltages using an external voltage received at a first terminal of the image sensor chip, a temperature sensor for generating a temperature voltage, a selection circuit for outputting one of the external voltage, the internal voltages, and the temperature voltage, a digital code generation circuit for generating a digital code using an output voltage of the selection circuit, and a second terminal for outputting the digital code from the image sensor chip.
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公开(公告)号:US10531032B2
公开(公告)日:2020-01-07
申请号:US15591626
申请日:2017-05-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang Hyun Cho , Ji Yong Park , Dae Hwa Paik , Kyoung Min Koh , Min Ho Kwon , Seung Hyun Lim
IPC: H04N5/369 , H04N5/374 , H03M1/18 , H03M1/12 , H04N5/378 , H03M7/30 , H03M1/08 , H03M5/02 , H03M1/56
Abstract: An image sensor chip includes an internal voltage generator for generating internal voltages using an external voltage received at a first terminal of the image sensor chip, a temperature sensor for generating a temperature voltage, a selection circuit for outputting one of the external voltage, the internal voltages, and the temperature voltage, a digital code generation circuit for generating a digital code using an output voltage of the selection circuit, and a second terminal for outputting the digital code from the image sensor chip.
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公开(公告)号:US09972636B2
公开(公告)日:2018-05-15
申请号:US15626395
申请日:2017-06-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jong Won Kim , Seung Hyun Lim , Chang Seok Kang , Young Woo Park , Dae Hoon Bae , Dong Seog Eun , Woo Sung Lee , Jae Duk Lee , Jae Woo Lim , Hanmei Choi
IPC: H01L27/115 , H01L27/11565 , H01L27/11519 , H01L27/11524 , H01L27/11556 , H01L27/11529 , H01L27/1157 , H01L27/11582 , H01L27/11573 , H01L29/04
CPC classification number: H01L27/11565 , H01L27/11519 , H01L27/11521 , H01L27/11524 , H01L27/11529 , H01L27/11556 , H01L27/11568 , H01L27/1157 , H01L27/11573 , H01L27/11582 , H01L28/00 , H01L29/04
Abstract: A memory device includes a plurality of channel regions that each extend in a direction perpendicular to an upper surface of a substrate, a plurality of gate electrode layers and a plurality of insulating layers stacked on the substrate adjacent the channel regions, each of the gate electrodes extending different lengths, and a plurality of dummy channel regions adjacent first ends of the plurality of gate electrode layers, wherein the substrate includes a substrate insulating layer formed below the plurality of dummy channel regions.
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公开(公告)号:US12027541B2
公开(公告)日:2024-07-02
申请号:US17502499
申请日:2021-10-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jae Hong Kim , Dae Hwa Paik , Seung Hyun Lim , Sin Hwan Lim
IPC: H01L27/146 , H04N25/75 , H04N25/767 , H04N25/778 , H04N25/78
CPC classification number: H01L27/14609 , H01L27/14603 , H04N25/75 , H04N25/767 , H04N25/778 , H04N25/78
Abstract: An image sensor includes a first column line and a second column line configured to extend in a first direction, a plurality of pixel groups configured to connect to the first column line or the second column line and to comprise a plurality of pixels in each of the plurality of pixel groups, a bias circuit configured to comprise a first current circuit and a second current circuit configured to output different bias currents in a first operational mode, and a switching circuit configured to connect the first column line to the first current circuit and connect the second column line to the second current circuit during a first time period, and to connect the first column line to the second current circuit and connect the second column line to the first current circuit during a second time period subsequent to the first time period in the first operational mode.
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公开(公告)号:US20240170483A1
公开(公告)日:2024-05-23
申请号:US18347919
申请日:2023-07-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Gunho Jo , Heesub Kim , Seung Hyun Lim , Bomi Kim , Eunho Cho
IPC: H01L27/088 , H01L21/8234 , H01L23/528
CPC classification number: H01L27/088 , H01L21/823475 , H01L23/5286
Abstract: An integrated circuit device includes a fin-type active region including a first fin portion and a second fin portion apart from each other in a first lateral direction with a contact space therebetween, a first source/drain region on the fin-type active region at a position overlapping the contact space in a vertical direction, a gate line on the first fin portion, a device isolation film covering both sidewalls of each of the first and second fin portions and defining a width of the contact space, a back side source/drain contact electrically connected to the first source/drain region, filling the contact space, and having a sidewall facing each of the first and second fin portions and the device isolation film, and an etch stop layer contacting a top surface of each of the first and second fin portions between the first fin portion and the gate line.
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公开(公告)号:US11516424B2
公开(公告)日:2022-11-29
申请号:US17375100
申请日:2021-07-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H04N5/345 , H04N5/347 , H04N5/3745 , H04N9/04 , H04N5/369 , H01L27/146
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US10972693B2
公开(公告)日:2021-04-06
申请号:US16727571
申请日:2019-12-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jae Hong Kim , Seung Hyun Lim , Han Kook Cho , Dong Hun Lee , Seog Heon Ham
IPC: H04N5/374 , H04N5/3745 , H04N5/365 , H04N5/378
Abstract: An image sensor and an image processing system including the same are provided. The image sensor includes a pixel array including a plurality of pixels each connected to one of first through m-th column lines to output a pixel signal, where “m” is an integer of at least 2; analog-to-digital converters each configured to receive the pixel signal corresponding to one of the first through m-th column lines, to compare the pixel signal with a ramp signal, and to convert the pixel signal to a digital pixel signal; and a blocking circuit connected to an input terminal of at least one of the analog-to-digital converters to block an influence of an operation of others among the analog-to-digital converters.
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公开(公告)号:US20200154071A1
公开(公告)日:2020-05-14
申请号:US16740545
申请日:2020-01-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minji Hwang , Hyosang Kim , Haesick Sul , Seung Hyun Lim
IPC: H04N5/378 , H01L27/146 , H04N9/04 , H04N5/3745 , H04N5/347 , H04N5/345
Abstract: Disclosed is an image sensor. The image sensor includes an active pixel sensor array including first to fourth pixel units sequentially arranged in a column direction, and each of the first to fourth pixel units is composed of a plurality of pixels. A first pixel group including the first and second pixel units is connected to a first column line, and a second pixel group including the third pixel unit and the fourth pixel unit is connected to a second column line. The image sensor includes a correlated double sampling circuit including first and second correlated double samplers and configured to convert a first sense voltage sensed from a selected pixel of the first pixel group and a second sense voltage sensed from a selected pixel of the second pixel group into a first correlated double sampling signal and a second correlated double sampling signal, respectively.
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公开(公告)号:US20240178274A1
公开(公告)日:2024-05-30
申请号:US18366922
申请日:2023-08-08
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Gunho Jo , Heesub Kim , Seung Hyun Lim , Bomi Kim , Eunho Cho
IPC: H01L29/06 , H01L27/092 , H01L29/423 , H01L29/66 , H01L29/775
CPC classification number: H01L29/0673 , H01L27/092 , H01L29/42392 , H01L29/66545 , H01L29/775
Abstract: An integrated circuit device includes a first fin-type active region and a second fin-type active region, a device isolation film adjacent to each of the first and second fin-type active regions, a first gate line on the first fin-type active region, a second gate line on the second fin-type active region, and a gate cut insulating pattern separating the first and second gate lines, wherein the device isolation film includes a first local isolation portion and a second local isolation portion, which are separating the first fin-type active region from the second fin-type active region to be apart from each other with the gate cut insulating pattern therebetween.
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