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公开(公告)号:US12179273B2
公开(公告)日:2024-12-31
申请号:US17380301
申请日:2021-07-20
Applicant: Guehring KG
Inventor: Hans-Peter Hollfelder
Abstract: The invention relates to a machine tool (1) comprising a clamping holder (10) which extends along a longitudinal axis (3) and a cutting element (20) that can be inserted into an open tool-side recess (40), which passes through the clamping holder (10), transversely to the longitudinal axis (3). The machine tool (1) has a stop (30) which is secured in the recess (40) and against which the cutting element (20) rests in the direction transverse to the longitudinal axis (3).
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公开(公告)号:US12162222B2
公开(公告)日:2024-12-10
申请号:US17944374
申请日:2022-09-14
Applicant: EOS GmbH Electro Optical Systems
Inventor: Michael Prexler , Martin Schade
IPC: B29C64/393 , B22F10/20 , B22F10/25 , B22F10/30 , B22F10/31 , B22F10/366 , B22F12/13 , B22F12/44 , B22F12/45 , B22F12/49 , B22F12/90 , B29C64/153 , B29C64/268 , B29C64/277 , B33Y10/00 , B33Y30/00 , B33Y50/02
Abstract: A calibration method serves for calibrating a manufacturing device for additively producing a three-dimensional object by applying layer by layer and selectively solidifying a building material. The manufacturing device comprises at least two scanning units, each of which is capable of directing a beam to different target points in the working plane, which are located within a scanning region assigned to the respective scanning unit, wherein the scanning regions region of the at least two scanning units overlap in an overlap area. At least a first of the at least two scanning units is assigned a first monitoring unit whose monitoring region extends to a target point of the first scanning unit and its proximity, wherein a change of a position of the monitoring region is carried out as a function of a change of a position of the target point.
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公开(公告)号:US12134229B2
公开(公告)日:2024-11-05
申请号:US17618320
申请日:2020-06-11
Applicant: Voxeljet AG
Inventor: Bastian Heymel , Martin Sinzinger , Tobias Lachenmair
IPC: B29C64/165 , B22F10/10 , B22F10/20 , B22F12/52 , B22F12/67 , B28B1/00 , B29C64/214 , B29C64/255 , B29C64/329 , B29C64/35 , B29C64/371 , B33Y10/00 , B33Y30/00 , B33Y40/00
Abstract: The invention relates to a method and an apparatus for producing three-dimensional models by layering technology, and a recoater with a vacuum closure.
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公开(公告)号:US12128612B2
公开(公告)日:2024-10-29
申请号:US17045783
申请日:2018-08-27
Applicant: Hewlett-Packard Development Company, L.P.
Inventor: Kristopher J. Erickson , John Samuel Dilip Jangam , Adekunle Olubummo
IPC: B22F1/054 , B22F1/10 , B22F1/103 , B22F10/14 , B22F10/20 , B29C64/165 , B33Y10/00 , B33Y70/00 , C08L71/02 , B22F12/13 , B82Y30/00 , B82Y40/00
CPC classification number: B29C64/165 , B22F1/054 , B22F1/10 , B22F1/103 , B22F10/14 , B22F10/20 , B33Y10/00 , B33Y70/00 , C08L71/02 , B22F12/13 , B22F2999/00 , B82Y30/00 , B82Y40/00 , C08G2650/58 , B22F2999/00 , B22F1/054 , B22F10/10 , B22F10/20 , B22F1/103 , B22F2999/00 , B22F10/14 , B22F10/20 , B22F1/103 , B22F1/054
Abstract: Examples of binder agents for a three-dimensional (3D) printing process are disclosed. In an example, the binder agent includes copper nanoparticles and a liquid vehicle. In this example, the liquid vehicle includes an antioxidant, polyethylene glycol hexadecyl ether, and a balance of water. Another example of the binder agent includes stainless steel nanoparticles and a liquid vehicle. In this example, the liquid vehicle includes polyethylene glycol hexadecyl ether, and a balance of water. Still another example of the binder agent includes nickel nanoparticles and a liquid vehicle. The liquid vehicle includes an antioxidant; a symmetric triblock copolymer including poly(ethylene oxide) and poly(propylene oxide), and a balance of water.
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公开(公告)号:US20240342804A1
公开(公告)日:2024-10-17
申请号:US18731243
申请日:2024-06-01
Applicant: Araz Yacoubian
Inventor: Araz Yacoubian
IPC: B22F12/90 , B22F10/20 , B22F10/30 , B22F12/00 , B29C64/393 , B33Y30/00 , B33Y50/00 , B33Y50/02 , G01N21/21 , G01N21/47 , G01N21/88 , G01N21/95
CPC classification number: B22F12/90 , B22F10/20 , B22F12/00 , B29C64/393 , B33Y30/00 , B33Y50/00 , B33Y50/02 , G01N21/21 , G01N21/4788 , G01N21/9515 , B22F10/30 , G01N2021/4735 , G01N2021/479 , G01N2021/4792 , G01N2021/8848 , G01N2201/06113 , G01N2201/0634 , G01N2201/0638
Abstract: Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.
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公开(公告)号:US20240316691A1
公开(公告)日:2024-09-26
申请号:US18675212
申请日:2024-05-28
Applicant: General Electric Company
Inventor: Joshua Tyler Mook , William Joseph Steele , Mary Kathryn Thompson , David Scott Simmermon , Michael Thomas Gansler
IPC: B23K26/064 , B22F10/20 , B22F10/28 , B22F10/36 , B22F10/366 , B22F12/44 , B23K26/06 , B23K26/067 , B23K26/073 , B23K26/342 , B29C64/153 , B33Y30/00 , G02B3/00 , G02B26/08
CPC classification number: B23K26/064 , B22F10/20 , B22F10/28 , B22F10/36 , B22F10/366 , B22F12/44 , B23K26/0643 , B23K26/0676 , B23K26/0738 , B23K26/342 , B29C64/153 , B33Y30/00 , G02B3/0056 , G02B26/0833 , B23K26/0648
Abstract: An irradiation device for additively manufacturing three-dimensional objects may include a beam generation device configured to generate an energy beam, an optical modulator including a micromirror array disposed downstream from the beam generation device, and a focusing lens assembly disposed downstream from the optical modulator. The micromirror array may include a plurality of micromirror elements configured to reflect a corresponding plurality of beam segment of the energy beam along a beam path incident upon the focusing lens assembly. The focusing lens assembly may include one or more lenses configured to focus the plurality of beam segments such that for respective ones of a plurality of modulation groups including a subset of micromirror elements, a corresponding subset of beam segments are focused to at least partially overlap with one another at a combination zone corresponding to the respective modulation group.
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公开(公告)号:US12059725B2
公开(公告)日:2024-08-13
申请号:US18083634
申请日:2022-12-19
Applicant: Metal Powder Works, LLC
Inventor: John E. Barnes , Christopher B. Aldridge
IPC: B22F1/05 , B22F1/052 , B22F1/065 , B22F1/14 , B22F9/04 , B22F9/08 , B22F10/20 , B22F10/28 , B22F10/34 , B22F12/90 , B23B1/00 , B23B5/00 , B23B29/12 , B23P17/06 , B23P25/00 , B29B9/02 , B29B9/12 , B33Y10/00 , B33Y70/00 , C04B35/622
CPC classification number: B22F1/05 , B22F1/052 , B22F1/065 , B22F1/14 , B22F9/04 , B22F9/082 , B22F10/20 , B22F10/34 , B22F12/90 , B23B1/00 , B23B5/00 , B23P17/06 , B29B9/02 , B29B9/12 , B33Y70/00 , C04B35/622 , B22F2009/046 , B22F10/28 , B22F2304/10 , B22F2998/10 , B22F2999/00 , B23B29/125 , B23P25/006 , B29B2009/125 , B33Y10/00 , C04B2235/6026 , Y02P10/25 , B22F2999/00 , B22F1/14 , B22F1/065 , B22F2998/10 , B22F2009/046 , B22F10/34 , B22F10/28 , B22F2999/00 , B22F2009/046 , B22F2201/01
Abstract: A powder production method includes providing an elongated workpiece and repeatedly contacting an outer surface of the elongated workpiece with a reciprocating cutter according to a predetermined at least one frequency to produce a powder. The powder includes a plurality of particles, wherein at least 95% of the produced particles have a diameter or maximum dimension ranging from about 10 μm to about 200 μm. A system for producing powders having a plurality of particles including a cutter and at least one controller is also provided herein.
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8.
公开(公告)号:US20240264533A1
公开(公告)日:2024-08-08
申请号:US18635589
申请日:2024-04-15
Applicant: ASML NETHERLANDS B.V.
Inventor: Raymond Wilhelmus Louis LAFARRE , Sjoerd Nicolaas Lambertus DONDERS , Nicolaas TEN KATE , Nina Vladimirovna DZIOMKINA , Yogesh Pramod KARADE , Elisabeth Corinne RODENBURG
IPC: G03F7/00 , B05D3/06 , B05D5/00 , B22F7/06 , B22F10/00 , B22F10/20 , B22F10/25 , B22F10/28 , B22F10/66 , B23K26/342 , B23K26/354 , B23Q3/18 , B33Y10/00 , B33Y80/00 , G03F7/20
CPC classification number: G03F7/70341 , B05D3/06 , B05D5/00 , B22F7/062 , B22F10/00 , B22F10/20 , B23K26/342 , B23K26/354 , B23Q3/18 , B33Y10/00 , B33Y80/00 , G03F7/20 , G03F7/70416 , G03F7/707 , G03F7/70708 , G03F7/70716 , G03F7/70733 , G03F7/708 , B22F10/25 , B22F10/28 , B22F10/66
Abstract: A substrate holder for a lithographic apparatus has a main body having a thin-film stack provided on a surface thereof. The thin-film stack forms an electronic or electric component such as an electrode, a sensor, a heater, a transistor or a logic device, and has a top isolation layer. A plurality of burls to support a substrate are formed on the thin-film stack or in apertures of the thin-film stack.
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9.
公开(公告)号:US12023860B2
公开(公告)日:2024-07-02
申请号:US17967391
申请日:2022-10-17
Applicant: General Electric Company
Inventor: Vipul Kumar Gupta , Natarajan Chennimalai Kumar , Anthony Joseph Vinciquerra , Laura Cerully Dial , Voramon Supatarawanich Dheeradhada , Timothy Hanlon , Lembit Salasoo , Xiaohu Ping , Subhrajit Roychowdhury , Justin John Gambone
IPC: B29C64/153 , B22F10/20 , B22F10/31 , B22F10/85 , B29C64/393 , B33Y50/00 , B22F3/24 , B22F10/28 , B22F10/30 , B22F10/366 , B22F12/90 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B33Y50/02
CPC classification number: B29C64/153 , B22F10/20 , B22F10/31 , B22F10/85 , B29C64/393 , B33Y50/00 , B22F2003/245 , B22F10/28 , B22F10/30 , B22F10/366 , B22F12/90 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B33Y50/02
Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
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公开(公告)号:US12017278B2
公开(公告)日:2024-06-25
申请号:US18139864
申请日:2023-04-26
Applicant: Araz Yacoubian
Inventor: Araz Yacoubian
IPC: B22F12/90 , B22F10/20 , B22F12/00 , B29C64/393 , B33Y30/00 , B33Y50/00 , B33Y50/02 , G01N21/21 , G01N21/47 , G01N21/95 , B22F10/30 , G01N21/88
CPC classification number: B22F12/90 , B22F10/20 , B22F12/00 , B29C64/393 , B33Y30/00 , B33Y50/00 , B33Y50/02 , G01N21/21 , G01N21/4788 , G01N21/9515 , B22F10/30 , G01N2021/4735 , G01N2021/479 , G01N2021/4792 , G01N2021/8848 , G01N2201/06113 , G01N2201/0634 , G01N2201/0638
Abstract: Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.
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