RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
    2.
    发明申请
    RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN 审中-公开
    树脂,耐蚀组合物和生产耐火图案的方法

    公开(公告)号:US20160291467A1

    公开(公告)日:2016-10-06

    申请号:US15085443

    申请日:2016-03-30

    Abstract: A resist composition contains: a resin having an acid-labile group, a resin having a structural unit represented by formula (I), an acid generator, and a solvent; wherein Ri41 represents a hydrogen atom or a methyl group, Ri42 represents a C1 to C10 hydrocarbon group that may be substituted with a hydroxy group, a C2 to C7 acyl group or a hydrogen atom, Ri43 in each occurrence independently represents a C1 to C6 alkyl group or a C1 to C6 alkoxy group, “p” represents an integer of 0 to 4, Z represents a divalent C3 to C20 hydrocarbon group having a group represented by formula (Ia), and a methylene group contained in the hydrocarbon group may be replaced by an oxygen atom, a sulfur atom or a carbonyl group, *—[(CH2)w—O]r— (Ia): wherein “w” and “r” each independently represents an integer of 1 to 10, and * represent a bonding position.

    Abstract translation: 式中,R 41表示氢原子或甲基,R 12表示可以被羟基,C 2〜C 7酰基或氢原子取代的C 1〜C 10烃基,R a 43各自独立地表示碳原子数1〜6的烷基 基团或C1〜C6烷氧基,“p”表示0〜4的整数,Z表示具有式(Ia)表示的基团的二价C 3〜C 20烃基,烃基中所含的亚甲基可以 由氧原子,硫原子或羰基取代,* - [(CH2)w-O] r-(Ia):其中“w”和“r”各自独立地表示1〜10的整数,* 表示粘合位置。

    Positive resist composition and patterning process
    5.
    发明授权
    Positive resist composition and patterning process 有权
    正抗蚀剂组成和图案化工艺

    公开(公告)号:US08778592B2

    公开(公告)日:2014-07-15

    申请号:US13404824

    申请日:2012-02-24

    CPC classification number: G03F7/0392 G03F7/0397 G03F7/085 H01L21/265

    Abstract: A positive resist composition based on a polymer comprising recurring units of (meth)acrylate having a cyclic acid labile group and a dihydroxynaphthalene novolak resin, and containing a photoacid generator is improved in resolution, step coverage and adhesion on a highly reflective stepped substrate, has high resolution, and forms a pattern of good profile and minimal edge roughness through exposure and development.

    Abstract translation: 具有包含具有环酸不稳定基团的(甲基)丙烯酸酯和二羟基萘酚醛清漆树脂的重复单元并含有光酸产生剂的聚合物的正性抗蚀剂组合物在高反射性阶梯基材上的分辨率,台阶覆盖率和粘附性得到改善,具有 高分辨率,并且通过曝光和显影形成良好轮廓和最小边缘粗糙度的图案。

    Positive resist composition and patterning process
    6.
    发明授权
    Positive resist composition and patterning process 有权
    正抗蚀剂组成和图案化工艺

    公开(公告)号:US08652756B2

    公开(公告)日:2014-02-18

    申请号:US13586602

    申请日:2012-08-15

    CPC classification number: G03F1/00 G03F7/0397 G03F7/085 G03F7/105

    Abstract: A positive resist composition comprising, as base resins contained therein, (A) a polymer having a weight-average molecular weight of 1000 to 500000 and containing a repeating unit which contains a structure having a hydrogen atom of a carboxyl group thereof substituted with an acid-labile group having a cyclic structure and (B) a novolak resin of a substituted or an unsubstituted fluorescein, and in addition, a photo acid generator. There can be provided a positive resist composition having an appropriate absorption to form a pattern on a highly reflective substrate with excellent pattern profile after light exposure, adhesion, implantation characteristics onto a non-planar substrate, and in addition, ion implantation resistance at the time of ion implantation; and to provide a patterning process.

    Abstract translation: 一种正型抗蚀剂组合物,其包含作为其中所含的基础树脂的(A)重均分子量为1000〜500000的聚合物,其含有具有被酸取代的羧基的氢原子的结构的重复单元 具有环状结构的脂肪族基团和(B)取代或未取代的荧光素的酚醛清漆树脂,以及光酸产生剂。 可以提供具有适当吸收的正性抗蚀剂组合物,以在曝光后具有优异的图案轮廓的高反射性基板上形成图案,在非平面基板上粘附,注入特性,此外,此时的离子注入电阻 的离子注入; 并提供图案化工艺。

    Positive resist composition and patterning process
    7.
    发明授权
    Positive resist composition and patterning process 有权
    正抗蚀剂组成和图案化工艺

    公开(公告)号:US08574816B2

    公开(公告)日:2013-11-05

    申请号:US13584463

    申请日:2012-08-13

    CPC classification number: G03F7/0397 G03F7/085

    Abstract: The invention provides a positive resist composition comprising, as base resins contained therein, (A) a polymer having a weight-average molecular weight of 1000 to 500000 and containing a repeating unit which contains a structure having a hydrogen atom of a carboxyl group thereof substituted with an acid-labile group having a cyclic structure and (B) a novolak resin of a substituted or an unsubstituted naphtholphthalein, and in addition, a photo acid generator. There can be provided a positive resist composition having an appropriate absorption to form a pattern on a highly reflective substrate, excellent characteristics in adhesion and implantation onto a non-planar substrate, a good pattern profile after light exposure, and an ion implantation resistance at the time of ion implantation; and a patterning process.

    Abstract translation: 本发明提供一种正型抗蚀剂组合物,其包含作为其中所含的基础树脂的(A)重均分子量为1000〜500000的聚合物,其含有具有取代基的羧基的氢原子的结构的重复单元 具有环状结构的酸不稳定基团和(B)取代或未取代的萘并噻吩的酚醛清漆树脂,另外还有光酸产生剂。 可以提供具有适当吸收的正性抗蚀剂组合物,以在高反射性基板上形成图案,在非平面基板上粘附和注入的优异特性,曝光后的良好图案轮廓,以及在 离子注入时间; 和图案化过程。

    METHOD FOR PRODUCING POLYMER, POLYMER FOR LITHOGRAPHY, RESIST COMPOSITION, AND METHOD FOR PRODUCING SUBSTRATE
    9.
    发明申请
    METHOD FOR PRODUCING POLYMER, POLYMER FOR LITHOGRAPHY, RESIST COMPOSITION, AND METHOD FOR PRODUCING SUBSTRATE 有权
    生产聚合物的方法,用于平版印刷的聚合物,耐蚀组合物和生产基材的方法

    公开(公告)号:US20120115086A1

    公开(公告)日:2012-05-10

    申请号:US13382397

    申请日:2010-07-07

    Abstract: A method for producing a polymer is provided. The polymer improves variations in the content ratio and molecular weights of a copolymer's constitutional units, solvent solubility, and the sensitivity of a resist composition using such a polymer. The method includes polymerizing two or more monomers while adding with a polymerization initiator to obtain the polymer, feeding a first solution containing first composition monomers in an initial polymerization stage, and starting dropwise addition of a second solution containing second composition monomers after or simultaneously with the feeding of the first solution. The second composition is equal to a target composition ratio of the polymer to be obtained. The first composition is calculated in advance based on a target composition ratio and the reactivity of the monomers. The above dropping rate is set to high.

    Abstract translation: 提供聚合物的制造方法。 聚合物改善共聚物的结构单元的含量比和分子量的变化,溶剂的溶解度以及使用这种聚合物的抗蚀剂组合物的灵敏度。 该方法包括聚合两种或更多种单体,同时加入聚合引发剂以获得聚合物,在初始聚合阶段中加入含有第一组合物单体的第一溶液,并在第二组合物单体或与其同时开始滴加含有第二组合物单体的第二溶液 喂养第一种方案。 第二组合物等于所得聚合物的目标组成比。 基于目标组成比和单体的反应性,预先计算第一组合物。 上述滴加速度设定为高。

    Resist polymer and method for producing the polymer
    10.
    发明授权
    Resist polymer and method for producing the polymer 有权
    抗蚀聚合物和聚合物的制造方法

    公开(公告)号:US08163852B2

    公开(公告)日:2012-04-24

    申请号:US12319492

    申请日:2009-01-08

    CPC classification number: G03F7/085 G03F7/0397

    Abstract: Solving problems in the prior art, provided are a resist polymer which is small in lot-to-lot, reactor-to-reactor and scale-to-scale variations, and contains no high polymer, is excellent in solubility and storage stability, and is suitable for fine pattern formation, and a method for production thereof. The present invention provides the resist polymer at least having a repeating unit having a structure which is decomposed by an acid to become soluble in an alkali developer and a repeating unit having a polar group to enhance adhesion to a substrate, characterized in that a peak area of a high molecular weight component (high polymer) with molecular weight of 100,000 or more is 0.1% or less based on an entire peak area in a molecular weight distribution determined, by gel permeation chromatography (GPC).

    Abstract translation: 解决现有技术中的问题,提供了一种抗批聚物,反应堆对反应器和尺度尺度变化小的抗蚀剂聚合物,不含高聚物,溶解性和储存稳定性优异, 适用于精细图案形成及其制造方法。 本发明提供的抗蚀剂聚合物至少具有由酸分解成可溶于碱性显影剂的结构的重复单元和具有极性基团的重复单元以增强与基材的粘附性,其特征在于峰面积 的分子量为100,000以上的高分子量成分(高分子量)为0.1%以下,通过凝胶渗透色谱法(GPC)测定的分子量分布中的全部峰面积。

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