MICROSCOPE SYSTEM
    2.
    发明公开
    MICROSCOPE SYSTEM 审中-公开

    公开(公告)号:US20230418038A1

    公开(公告)日:2023-12-28

    申请号:US18464660

    申请日:2023-09-11

    发明人: Yoshimasa SUZUKI

    IPC分类号: G02B21/08 G02B21/36

    CPC分类号: G02B21/084 G02B21/365

    摘要: A microscope system includes an incoherent light source, a detection optical system, and an imager. The incoherent light source is a light source that emits light that is temporally not coherent. In a sample, a plurality of coherent illuminations are performed simultaneously by light emitted from the incoherent light source. The coherent illuminations are illumination by light that is spatially coherent. The direction in which the sample is irradiated with a light beam is different for each coherent illumination. In a pupil plane of the detection optical system, the respective light beams of the coherent illuminations pass through first regions different from each other. Each of the first regions satisfies the following Condition (1). At least one distance among distances between the two adjacent first regions satisfies the following Condition (2).


    LS

    SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

    公开(公告)号:US20180073865A1

    公开(公告)日:2018-03-15

    申请号:US15815867

    申请日:2017-11-17

    IPC分类号: G01B11/25 G01B11/26 G02B21/08

    摘要: A sample shape measuring method includes a step of preparing illumination light passing through a predetermined illumination region, a step of applying the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set so as not to include the optical axis at a pupil position of the illumination optical system and is set such that the illumination light is applied to part of the inside of the pupil and the outside of the pupil at a pupil position of the observation optical system. The predetermined processing step includes a step of receiving light, a step of obtaining the quantity of light, a step of calculating the difference or the ratio between the quantity of light and a reference quantity of light, and a step of calculating the amount of tilt in the surface of the sample from the difference or the ratio.

    SYSTEM AND APPARATUS FOR ILLUMINATING A SPECIMEN

    公开(公告)号:US20170090174A1

    公开(公告)日:2017-03-30

    申请号:US15378239

    申请日:2016-12-14

    IPC分类号: G02B21/08

    CPC分类号: G02B21/084

    摘要: An adjustable lighting apparatus for illuminating a specimen while facilitating access to the specimen includes an elongated post defining a first axis, a hub movably attached to the post, and a pair of pivotable curved plate jaws, each jaw connected to the hub and configured for independent movement relative to the hub. The hub is configured for movement parallel to the first axis of the post. Each jaw of the pair of pivotable curved plate jaws has a concave interior surface and has one or more light sources positioned within or against the interior surface between a proximate jaw end and a distal jaw end for illuminating a specimen located within the expandable boundary.

    Device and method for inspecting a sealing member
    8.
    发明授权
    Device and method for inspecting a sealing member 有权
    用于检查密封构件的装置和方法

    公开(公告)号:US09568303B2

    公开(公告)日:2017-02-14

    申请号:US14133940

    申请日:2013-12-19

    发明人: Wan-Jae Joo

    摘要: A sealing inspection device includes a scan unit through which a display device substrate including a top plate coupled to a bottom plate by a sealing member in the sealed area passes; and a photographing unit through which the display device substrate which has passed through the scan unit, further passes. The scan unit generates coordinate values of the sealed area of the display device substrate, detects a defective region in the sealed area of the display device substrate, and includes a plurality of scan cameras. The photographing unit generates an image of the sealed area of the display device substrate using the generated coordinate values, measures an effective sealing width of the sealed area using the generated image, and comprises a measuring camera.

    摘要翻译: 密封检查装置包括扫描单元,包括通过密封区域中的密封构件联接到底板的顶板的显示装置基板通过该扫描单元; 以及通过扫描单元的显示装置基板通过的拍摄单元。 扫描单元产生显示装置基板的密封区域的坐标值,检测显示装置基板的密封区域中的缺陷区域,并且包括多个扫描相机。 拍摄单元使用产生的坐标值生成显示装置基板的密封区域的图像,使用所生成的图像测量密封区域的有效密封宽度,并且包括测量相机。

    Adjustable total internal reflectance microscopy (TIRFM) illuminator apparatus
    10.
    发明授权
    Adjustable total internal reflectance microscopy (TIRFM) illuminator apparatus 有权
    可调整内反射显微镜(TIRFM)照明器

    公开(公告)号:US09335533B2

    公开(公告)日:2016-05-10

    申请号:US13879404

    申请日:2011-10-13

    摘要: A new apparatus and method of delivering light to the hack aperture of a High Numerical Aperture (NA) Microscopy Objective lens for Total Internal Reflectance Microscopy (TIRFM) is provided. The apparatus and method include pumping light generated by a laser through an optical fiber which is optically coupled to the objective lens by a collimating optical element, such as, for example a lens or prism. The apparatus and method also include providing a fiber axial translator which is mechanically adjustable for focusing the laser light optically coupled to the objective lens. The apparatus also includes a mechanical coupler for mechanically coupling the apparatus to the object lens such that the laser light optically coupled to the objective lens can be adjusted to exceed, or not exceed, a critical angle associated with TIRFM illumination.

    摘要翻译: 提供了一种将光输送到用于全内反射显微镜(TIRFM)的高数值孔径(NA)显微镜物镜的入口孔的新设备和方法。 该装置和方法包括通过光学器件激发激光产生的光,该光纤通过诸如透镜或棱镜的准直光学元件光学耦合到物镜。 该装置和方法还包括提供一种光学轴向平移器,其可机械调节以聚焦光学耦合到物镜的激光。 该设备还包括机械耦合器,用于将设备机械地耦合到物镜,使得光学耦合到物镜的激光可以被调节以超过或不超过与TIRFM照明相关联的临界角度。