摘要:
A magnetic memory device includes a first magnetic line which has a plurality of cells made of magnetic domains partitioned by domain walls, and in which information is recorded in each cell, a first write element formed at one end portion of the first magnetic line, and a first read element formed at the other end portion of the first magnetic line.
摘要:
A magnetic memory device includes a first magnetic line which has a plurality of cells made of magnetic domains partitioned by domain walls, and in which information is recorded in each cell, a first write element formed at one end portion of the first magnetic line, and a first read element formed at the other end portion of the first magnetic line.
摘要:
A semiconductor memory device comprises word lines, bit lines, memory cells, a row decoder, a column decoder, and a write circuit. The word lines are formed along a first direction. The bit lines are formed along a second direction. Memory cells include magneto-resistive elements and are arranged at intersections of the word lines and the bit lines. The row decoder selects at least one of the word lines. The column decoder selects at least one of the bit lines. The write circuit supplies first and second write currents to a selected word line and selected bit line respectively and writes data into a selected memory cell arranged at the intersection of the selected word line and the selected bit line. The write circuit changes the current values of the first and second write currents according to a temperature change.
摘要:
An MRAM has an internal test circuit. This test circuit detects a bit in a memory cell array, which has a shift in write characteristics, as a defective bit by using a method of applying a one-axis write current along an axis of hard magnetization.
摘要:
An MRAM has an internal test circuit. This test circuit detects a bit in a memory cell array, which has a shift in write characteristics, as a defective bit by using a method of applying a one-axis write current along an axis of hard magnetization.
摘要:
A semiconductor memory device comprises word lines, bit lines, memory cells, a row decoder, a column decoder, and a write circuit. The word lines are formed along a first direction. The bit lines are formed along a second direction. Memory cells include magneto-resistive elements and are arranged at intersections of the word lines and the bit lines. The row decoder selects at least one of the word lines. The column decoder selects at least one of the bit lines. The write circuit supplies first and second write currents to a selected word line and selected bit line respectively and writes data into a selected memory cell arranged at the intersection of the selected word line and the selected bit line. The write circuit changes the current values of the first and second write currents according to a temperature change.
摘要:
A semiconductor memory comprises a memory cell, a pair of reference cells for use in generation of a reference electric potential, a first read circuit which compares a read electric potential obtained from the memory cell with the reference electric potential and determines data in the memory cell, a second read circuit which detects a state of the pair of reference cells and outputs a detection signal indicating the state of the pair of reference cells, and a control circuit which controls a write operation for the pair of reference cells based on the detection signal.
摘要:
A magnetic random access memory includes memory cells which store information using an internal magnetization direction. A first write line includes a first extending portion, a second extending portion and a first connection portion. The first extends portion extends along a first direction and has a first end and a second end. The second extending portion extends along the first direction and has a third end facing the first end and a fourth end facing the second end. The first connection portion connects the first end and the third end. A second write line and the first write line sandwiches one of the memory cells. First peripheral circuits are connected to the first connection portion and to at least one of the second end and the fourth end.
摘要:
A magnetic random access memory includes memory cells which store information using an internal magnetization direction. A first write line includes a first extending portion, a second extending portion and a first connection portion. The first extends portion extends along a first direction and has a first end and a second end. The second extending portion extends along the first direction and has a third end facing the first end and a fourth end facing the second end. The first connection portion connects the first end and the third end. A second write line and the first write line sandwiches one of the memory cells. First peripheral circuits are connected to the first connection portion and to at least one of the second end and the fourth end.
摘要:
A semiconductor memory comprises a memory cell, a pair of reference cells for use in generation of a reference electric potential, a first read circuit which compares a read electric potential obtained from the memory cell with the reference electric potential and determines data in the memory cell, a second read circuit which detects a state of the pair of reference cells and outputs a detection signal indicating the state of the pair of reference cells, and a control circuit which controls a write operation for the pair of reference cells based on the detection signal.