Use of zeta potential during chemical mechanical polishing for end point detection
    1.
    发明授权
    Use of zeta potential during chemical mechanical polishing for end point detection 失效
    化学机械抛光期间使用ζ电位进行终点检测

    公开(公告)号:US06325706B1

    公开(公告)日:2001-12-04

    申请号:US09182570

    申请日:1998-10-29

    IPC分类号: B24B2100

    摘要: A technique for utilizing a sensor to monitor fluid pressure from a fluid bearing located under a polishing pad to detect a polishing end point. A sensor is located at the leading edge of a fluid bearing of a linear polisher, which is utilized to perform chemical-mechanical polishing on a semiconductor wafer. The sensor monitors the fluid pressure to detect a change in the fluid pressure during polishing, which change corresponds to a change in the shear force when the polishing transitions from one material layer to the next. In order to ensure that there is a noticeable difference in the shear force variation at the polishing end point, a slurry having a particular pH level is selected. The pH level ensures that the zeta potential changes noticeably from one material to the next, so as to induce a change in the shear force, which is detected by a change in the fluid pressure.

    摘要翻译: 一种利用传感器来监测来自位于抛光垫下方的流体轴承的流体压力以检测抛光终点的技术。 传感器位于线性抛光机的流体轴承的前缘,用于在半导体晶片上执行化学机械抛光。 传感器监测流体压力以检测抛光期间的流体压力的变化,该变化对应于当抛光从一个材料层转移到下一个材料层时的剪切力的变化。 为了确保在抛光终点处的剪切力变化存在显着的差异,选择具有特定pH值的浆料。 pH值确保ζ电位从一种材料明显变化到另一种材料,从而引起由流体压力变化所检测的剪切力的变化。

    Apparatus and method for performing end point detection on a linear planarization tool
    2.
    发明授权
    Apparatus and method for performing end point detection on a linear planarization tool 失效
    在线性平面化工具上进行端点检测的装置和方法

    公开(公告)号:US06186865B1

    公开(公告)日:2001-02-13

    申请号:US09182532

    申请日:1998-10-29

    IPC分类号: B24B722

    摘要: A technique for utilizing a sensor to monitor fluid pressure from a fluid bearing located under a polishing pad to detect a polishing end point. A sensor is located at the leading edge of a fluid bearing of a linear polisher, which is utilized to perform chemical-mechanical polishing on a semiconductor wafer. The sensor monitors the fluid pressure to detect a change in the fluid pressure during polishing, which change corresponds to a change in the shear force when the polishing transitions from one material layer to the next.

    摘要翻译: 一种利用传感器来监测来自位于抛光垫下方的流体轴承的流体压力以检测抛光终点的技术。 传感器位于线性抛光机的流体轴承的前缘,用于在半导体晶片上执行化学机械抛光。 传感器监测流体压力以检测抛光期间流体压力的变化,该变化对应于当抛光从一个材料层转移到下一个材料层时的剪切力的变化。

    RETAINING RING AND ARTICLES FOR CARRIER HEAD
    3.
    发明申请
    RETAINING RING AND ARTICLES FOR CARRIER HEAD 有权
    保留环和运输工具的文章

    公开(公告)号:US20130157549A1

    公开(公告)日:2013-06-20

    申请号:US13768314

    申请日:2013-02-15

    IPC分类号: B24B37/32

    CPC分类号: B24B37/32 B24B37/30

    摘要: A carrier head for chemical mechanical polishing that has a base, a mounting assembly connected to the base having a surface for contacting a substrate, and a retaining ring secured to the base. The retaining ring can include perfluoroalkoxy, polyetherketoneketone, polybenzimidazole, a semi-crystalline thermoplastic polyester, or a long molecular chain molecule produced from poly-paraphenylene terephthalamide.

    摘要翻译: 一种用于化学机械抛光的载体头,其具有基部,连接到基部的安装组件具有用于接触基底的表面和固定到基部的保持环。 保持环可以包括全氟烷氧基,聚醚酮酮,聚苯并咪唑,半结晶热塑性聚酯或由聚对苯二甲酰对苯二胺生产的长分子链分子。

    Carrier head with retaining ring and carrier ring
    4.
    发明授权
    Carrier head with retaining ring and carrier ring 有权
    带保护环和承载环的承载头

    公开(公告)号:US08021215B2

    公开(公告)日:2011-09-20

    申请号:US12698009

    申请日:2010-02-01

    IPC分类号: B24B41/06

    CPC分类号: B24B37/32 B24B37/30

    摘要: A carrier head that has a housing, a base assembly, a retaining ring, a carrier ring, and a flexible membrane is described. The base assembly is vertically movable relative to the housing. The retaining ring is connected to and vertically movable relative to the base assembly and has a lower surface configured to contact a polishing pad and an inner surface configured to circumferentially surround the edge of a substrate to retain the substrate. The carrier ring is connected to and vertically fixed relative to the base assembly, circumferentially surrounds the retaining ring to prevent lateral motion of the retaining ring, and has a bottom surface configured to contact a polishing pad.

    摘要翻译: 描述了具有壳体,基座组件,保持环,载体环和柔性膜的承载头。 基座组件相对于外壳可垂直移动。 保持环相对于基座组件连接并且可垂直移动,并且具有被配置为接触抛光垫的下表面和被配置为周向围绕衬底的边缘以保持衬底的内表面。 承载环相对于基座组件连接并且垂直固定,周向地包围保持环以防止保持环的横向运动,并且具有构造成接触抛光垫的底表面。

    Carrier ring for carrier head
    6.
    发明授权
    Carrier ring for carrier head 有权
    承载头用于承载头

    公开(公告)号:US07901273B2

    公开(公告)日:2011-03-08

    申请号:US12698912

    申请日:2010-02-02

    IPC分类号: B24B21/18

    CPC分类号: B24B37/32

    摘要: A carrier head that has a base assembly, a retaining ring assembly, a carrier ring, and a flexible membrane is described. A carrier ring has an annular upper portion and an annular lower portion having a lower surface with a smaller inner diameter than the upper surface of the annular upper portion, wherein the carrier ring circumferentially surrounds a retaining ring and has a lower surface to contact a polishing pad.

    摘要翻译: 描述了具有基座组件,保持环组件,载体环和柔性膜的承载头。 承载环具有环形上部和环形下部,其具有比环形上部的上表面更小的内径的下表面,其中承载环周向地包围保持环并且具有接触抛光的下表面 垫。

    Flexible membrane for carrier head
    8.
    发明授权
    Flexible membrane for carrier head 有权
    用于载体头的柔性膜

    公开(公告)号:US07727055B2

    公开(公告)日:2010-06-01

    申请号:US11741692

    申请日:2007-04-27

    IPC分类号: B24B5/35

    摘要: A carrier head that has a base assembly, a retaining ring assembly, a carrier ring, and a flexible membrane is described. The flexible membrane has a main portion and an outer annular portion, wherein a junction between the main portion and the outer annular portion comprises a peripheral edge hinge and an annular recess above the hinge along the outer wall of the outer annular portion.

    摘要翻译: 描述了具有基座组件,保持环组件,载体环和柔性膜的承载头。 柔性膜具有主要部分和外部环形部分,其中主要部分和外部环形部分之间的接合处包括周边边缘铰链和沿着外部环形部分的外壁的铰链上方的环形凹部。

    Retainer for Chemical Mechanical Polishing Carrier Head

    公开(公告)号:US20200276686A1

    公开(公告)日:2020-09-03

    申请号:US16799688

    申请日:2020-02-24

    IPC分类号: B24B37/32

    摘要: A carrier head for chemical mechanical polishing includes a base, an actuator, a substrate mounting surface, and a retainer. The retainer includes an inner section and an outer section connected by a flexure. A bottom of the inner section of the retainer provides an inner portion of a lower surface configured to contact a polishing pad. An inner surface of the inner section extends upwardly from an inner edge of the lower surface to circumferentially surround the substrate mounting surface. The inner section of the retainer is positioned to receive a controllable load from the actuator and is vertically movable relative to the base. A bottom of the outer section of the retainer provides an outer portion of the lower surface. The outer section of the retainer is vertically fixed to the base. The inner section of the retainer is vertically movable relative to the outer section of the retainer.