公开(公告)号：US11653308B2

公开(公告)日：2023-05-16

申请号：US17408700

申请日：2021-08-23

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Junghun Heo ,  Youngduk Kim ,  Joonseok Kim ,  Dongsuk Shin

IPC: G06F1/32 ,  H04W52/02

CPC classification number: H04W52/0287 ,  G06F1/32 ,  H04W52/0261 ,  Y02D30/70

Abstract: A power management approach for a mobile device includes comparing a battery provided power supply voltage to a reference voltage in order to generate an alarm signal. In response to the alarm signal the frequency of an operating clock applied to a system-on-chip is changed.

公开(公告)号：US20170082552A1

公开(公告)日：2017-03-23

申请号：US15218584

申请日：2016-07-25

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kwang Soo Kim ,  Taejoong Kim ,  Byeonghwan Jeon ,  Yongsuk Choi ,  Youngduk Kim ,  Taeseok Oh ,  SangYun Lee ,  Yong-Ho Choi

IPC: G01N21/88 ,  G01N21/95 ,  G02B3/00 ,  G02B27/09 ,  G02B13/00

CPC classification number: G01N21/9501 ,  G01N21/95623 ,  G02B3/0006 ,  G02B13/0095 ,  G02B27/0988

Abstract: An optical inspection apparatus includes an inspection target unit on which an inspection target is loaded, an illumination optical unit configured to irradiate incident light to the inspection target, an objective lens unit disposed between the illumination optical unit and the inspection target unit, a detection optical unit configured to receive reflective light reflected from the inspection target to thereby detect a presence or absence of a defect on the inspection target, and a control unit configured to control the illumination optical unit and the detection optical unit. The illumination optical unit includes a light source part configured to irradiate the incident light, and a spatial filter array configured to modify a transmission region of the incident light irradiated from the light source part. The spatial filter array includes a spatial filter part, and a filter movement part configured to move the spatial filter part.

公开(公告)号：US11122513B2

公开(公告)日：2021-09-14

申请号：US16537869

申请日：2019-08-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Junghun Heo ,  Youngduk Kim ,  Joonseok Kim ,  Dongsuk Shin

IPC: H04W52/02 ,  G06F1/32

Abstract: A power management approach for a mobile device includes comparing a battery provided power supply voltage to a reference voltage in order to generate an alarm signal. In response to the alarm signal the frequency of an operating clock applied to a system-on-chip is changed.

公开(公告)号：US20170116727A1

公开(公告)日：2017-04-27

申请号：US15247537

申请日：2016-08-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kwang Soo KIM ,  Sangbong Park ,  Byeonghwan Jeon ,  Youngduk Kim

IPC: G06T7/00 ,  G02B13/00 ,  G02B27/14 ,  H01L21/66 ,  G01N21/95 ,  G01N21/956 ,  H01L21/67 ,  G02B27/09 ,  H04N5/247

CPC classification number: G06T7/0008 ,  G01N21/9501 ,  G01N21/95623 ,  G01N2201/061 ,  G02B13/0095 ,  G02B27/0988 ,  G02B27/14 ,  G06T7/001 ,  G06T2207/20224 ,  G06T2207/30148 ,  H01L21/67276 ,  H01L22/12 ,  H04N5/247

Abstract: An inspection apparatus includes a light source device providing incident light to a substrate, an objective lens receiving reflection light reflected from the substrate, a light splitting device disposed over the objective lens, first and second optical sensors disposed at both sides of the light splitting device, respectively, and first and second spatial filters disposed between the first optical sensor and the substrate and between the second optical sensor and the substrate, respectively. The first and second spatial filters transmit the reflection light in different forms from each other.

公开(公告)号：US12137419B2

公开(公告)日：2024-11-05

申请号：US18143105

申请日：2023-05-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Junghun Heo ,  Youngduk Kim ,  Joonseok Kim ,  Dongsuk Shin

IPC: G06F1/32 ,  H04W52/02

Abstract: A power management approach for a mobile device includes comparing a battery provided power supply voltage to a reference voltage in order to generate an alarm signal. In response to the alarm signal the frequency of an operating clock applied to a system-on-chip is changed.

公开(公告)号：US09915623B2

公开(公告)日：2018-03-13

申请号：US15218584

申请日：2016-07-25

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kwang Soo Kim ,  Taejoong Kim ,  Byeonghwan Jeon ,  Yongsuk Choi ,  Youngduk Kim ,  Taeseok Oh ,  SangYun Lee ,  Yong-Ho Choi

IPC: G01N21/00 ,  G01N21/95 ,  G02B27/09 ,  G02B13/00 ,  G02B3/00 ,  G01N21/956

CPC classification number: G01N21/9501 ,  G01N21/95623 ,  G02B3/0006 ,  G02B13/0095 ,  G02B27/0988

Abstract: An optical inspection apparatus includes an inspection target unit on which an inspection target is loaded, an illumination optical unit configured to irradiate incident light to the inspection target, an objective lens unit disposed between the illumination optical unit and the inspection target unit, a detection optical unit configured to receive reflective light reflected from the inspection target to thereby detect a presence or absence of a defect on the inspection target, and a control unit configured to control the illumination optical unit and the detection optical unit. The illumination optical unit includes a light source part configured to irradiate the incident light, and a spatial filter array configured to modify a transmission region of the incident light irradiated from the light source part. The spatial filter array includes a spatial filter part, and a filter movement part configured to move the spatial filter part.