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公开(公告)号：US20170082552A1
公开(公告)日：2017-03-23
申请号：US15218584
申请日：2016-07-25
Applicant: Samsung Electronics Co., Ltd.
Inventor： Kwang Soo Kim , Taejoong Kim , Byeonghwan Jeon , Yongsuk Choi , Youngduk Kim , Taeseok Oh , SangYun Lee , Yong-Ho Choi
CPC classification number: G01N21/9501 , G01N21/95623 , G02B3/0006 , G02B13/0095 , G02B27/0988
Abstract: An optical inspection apparatus includes an inspection target unit on which an inspection target is loaded, an illumination optical unit configured to irradiate incident light to the inspection target, an objective lens unit disposed between the illumination optical unit and the inspection target unit, a detection optical unit configured to receive reflective light reflected from the inspection target to thereby detect a presence or absence of a defect on the inspection target, and a control unit configured to control the illumination optical unit and the detection optical unit. The illumination optical unit includes a light source part configured to irradiate the incident light, and a spatial filter array configured to modify a transmission region of the incident light irradiated from the light source part. The spatial filter array includes a spatial filter part, and a filter movement part configured to move the spatial filter part.
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公开(公告)号：US20230007205A1
公开(公告)日：2023-01-05
申请号：US17941205
申请日：2022-09-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hyeokjong LEE , Yongsuk Choi
Abstract: A correlated double sampling (CDS) circuit, an operating method thereof, and an image sensor including the CDS circuit are disclosed. The CDS circuit includes a first comparator configured to operate based on a first bias current, and compare, with a ramp signal, a pixel voltage that is output from a pixel, during a first period and a fourth period during which the pixel operates in a low conversion gain (LCG) mode, a second comparator configured to operate based on a second bias current, and compare, with the ramp signal, the pixel voltage output from the pixel, during a second period and a third period during which the pixel operates in a high conversion gain (HCG) mode, the second period being after the first period, the third period being after the second period, and the fourth period being after the third period.
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公开(公告)号：US11445141B2
公开(公告)日：2022-09-13
申请号：US17355443
申请日：2021-06-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hyeokjong Lee , Yongsuk Choi
Abstract: A correlated double sampling (CDS) circuit, an operating method thereof, and an image sensor including the CDS circuit are disclosed. The CDS circuit includes a first comparator configured to operate based on a first bias current, and compare, with a ramp signal, a pixel voltage that is output from a pixel, during a first period and a fourth period during which the pixel operates in a low conversion gain (LCG) mode, a second comparator configured to operate based on a second bias current, and compare, with the ramp signal, the pixel voltage output from the pixel, during a second period and a third period during which the pixel operates in a high conversion gain (HCG) mode, the second period being after the first period, the third period being after the second period, and the fourth period being after the third period.
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Patent Agency Ranking
公开(公告)号：US12237035B2
公开(公告)日：2025-02-25
申请号：US18113165
申请日：2023-02-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Myeongjin Oh , Kyungjin Park , Yongsuk Choi
Abstract: A semiconductor device includes: a memory test circuit that outputs a fourth signal based on a logic level of a second signal corresponding to a first signal output by a host and a logic level of a third signal; a memory device that becomes active or inactive based on a logic level of the fourth signal; and a test logic that outputs the third signal and performs a retention test on the memory device based on the logic level of the second signal.
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公开(公告)号：US12224295B2
公开(公告)日：2025-02-11
申请号：US17455246
申请日：2021-11-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hakyu Choi , Yongsuk Choi , Keo-Sung Park , Dongwook Won
IPC: H01L27/146
Abstract: A method of manufacturing an image sensor includes forming a first dopant region having a second conductivity type in a semiconductor substrate including first and second surfaces. The semiconductor substrate has a first conductivity type different from the second conductivity type. The method further includes forming a pixel isolation structure defining pixel regions in the semiconductor substrate, forming a vertical trench by patterning the first surface in each of the pixel regions, forming a mask pattern exposing each of the pixel regions on the first surface, in which the mask pattern includes a residual mask pattern filling at least a portion of the vertical trench, forming a second dopant region having the second conductivity type in the semiconductor substrate by using the mask pattern as an ion-implantation mask, in which the second dopant region is adjacent to the vertical trench, and forming a transfer gate electrode in the vertical trench.
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公开(公告)号：US11825227B2
公开(公告)日：2023-11-21
申请号：US17941205
申请日：2022-09-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hyeokjong Lee , Yongsuk Choi
Abstract: A correlated double sampling (CDS) circuit, an operating method thereof, and an image sensor including the CDS circuit are disclosed. The CDS circuit includes a first comparator configured to operate based on a first bias current, and compare, with a ramp signal, a pixel voltage that is output from a pixel, during a first period and a fourth period during which the pixel operates in a low conversion gain (LCG) mode, a second comparator configured to operate based on a second bias current, and compare, with the ramp signal, the pixel voltage output from the pixel, during a second period and a third period during which the pixel operates in a high conversion gain (HCG) mode, the second period being after the first period, the third period being after the second period, and the fourth period being after the third period.
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公开(公告)号：US20220060647A1
公开(公告)日：2022-02-24
申请号：US17355443
申请日：2021-06-23
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyeokjong Lee , Yongsuk Choi
Abstract: A correlated double sampling (CDS) circuit, an operating method thereof, and an image sensor including the CDS circuit are disclosed. The CDS circuit includes a first comparator configured to operate based on a first bias current, and compare, with a ramp signal, a pixel voltage that is output from a pixel, during a first period and a fourth period during which the pixel operates in a low conversion gain (LCG) mode, a second comparator configured to operate based on a second bias current, and compare, with the ramp signal, the pixel voltage output from the pixel, during a second period and a third period during which the pixel operates in a high conversion gain (HCG) mode, the second period being after the first period, the third period being after the second period, and the fourth period being after the third period.
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公开(公告)号：US09915623B2
公开(公告)日：2018-03-13
申请号：US15218584
申请日：2016-07-25
Applicant: Samsung Electronics Co., Ltd.
Inventor： Kwang Soo Kim , Taejoong Kim , Byeonghwan Jeon , Yongsuk Choi , Youngduk Kim , Taeseok Oh , SangYun Lee , Yong-Ho Choi
CPC classification number: G01N21/9501 , G01N21/95623 , G02B3/0006 , G02B13/0095 , G02B27/0988
Abstract: An optical inspection apparatus includes an inspection target unit on which an inspection target is loaded, an illumination optical unit configured to irradiate incident light to the inspection target, an objective lens unit disposed between the illumination optical unit and the inspection target unit, a detection optical unit configured to receive reflective light reflected from the inspection target to thereby detect a presence or absence of a defect on the inspection target, and a control unit configured to control the illumination optical unit and the detection optical unit. The illumination optical unit includes a light source part configured to irradiate the incident light, and a spatial filter array configured to modify a transmission region of the incident light irradiated from the light source part. The spatial filter array includes a spatial filter part, and a filter movement part configured to move the spatial filter part.
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