DETERMINATION DEVICE, INSPECTION SYSTEM, DETERMINATION METHOD, AND STORAGE MEDIUM

    公开(公告)号:US20240355093A1

    公开(公告)日:2024-10-24

    申请号:US18762464

    申请日:2024-07-02

    CPC classification number: G06V10/764 G06T7/0008 G06V10/82 G06T2207/30164

    Abstract: According to one embodiment, a determination device is configured to determine a suitability of a classification model. The classification model includes a neural network. The classification model is further configured to output a classification result according to an input of an image. The determination device is further configured to acquire intermediate data of an intermediate layer of the neural network when an input image is input to the classification model. The classification model is further configured to determine the suitability by using a plurality of sets of the intermediate data and a plurality of sets of reference data. The plurality of sets of reference data being prepared beforehand.

    IMAGE FORMING SYSTEM
    3.
    发明公开

    公开(公告)号:US20240338810A1

    公开(公告)日:2024-10-10

    申请号:US18626140

    申请日:2024-04-03

    CPC classification number: G06T7/0008 H04N1/00045 H04N1/00082 G06T2207/30144

    Abstract: An image forming system comprising an image forming apparatus forms an image, a reading apparatus reads the image, an inspection unit inspects the image read by the reading apparatus to detect defect on the image, and a controller configured to control, in a case where a first type of defect is detected by the inspection unit during formation of a plurality of images by the image forming apparatus, the image forming apparatus to stop the formation, and execute an adjustment operation for adjusting a quality of an image to be formed by the image forming apparatus, and control, in a case where a second type of defect is detected by the inspection unit during the formation, the image forming apparatus to continue the formation, wherein the second type of defect is different from the first type of defect.

    APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION METHOD, AND APPEARANCE INSPECTION PROGRAM

    公开(公告)号:US20240289941A1

    公开(公告)日:2024-08-29

    申请号:US17768612

    申请日:2020-10-05

    CPC classification number: G06T7/0008 G06T7/62 G06T2207/30156 G06T2207/30204

    Abstract: A conversion equation calculation unit 81 calculates, based on a defect image with marker in which a marker of a predetermined size that can be recognized regardless of color of appearance of an object to be inspected and a defect of the object to be inspected are taken, a conversion equation from size of the defect image with marker to actual size. A defect type determination unit 82 determines, by using a model for detecting the defect of the object to be inspected from an image and determining a defect type, the defect type included in the defect image with marker. A defect measuring unit 83 measures defect size included in the defect image with marker by using the conversion equation. A defect content output unit 84 outputs the determined defect type and the measured defect size.

    INFORMATION PROCESSING DEVICE AND STORAGE MEDIUM

    公开(公告)号:US20240281957A1

    公开(公告)日:2024-08-22

    申请号:US18443593

    申请日:2024-02-16

    Inventor: Ryotaro HAYASHI

    Abstract: An information processing device includes an obtainer configured to obtain color information of a spot color patch targeted for a color difference inspection and inspection result information indicating a result of the color difference inspection for the spot color patch, a determiner configured to determine, among colors included in image data, a color to be printed as the spot color patch based on the color information and the inspection result information, and a print controller configured to cause a printing device to print the image data and the spot color patch of the color determined by the determiner. The determiner is configured to change the number of colors to be printed as the spot color patch based on the inspection result information on the colors included in the image data.

Patent Agency Ranking