PRINTED CIRCUIT BOARD AND SEMICONDUCTOR PACKAGE
    1.
    发明申请
    PRINTED CIRCUIT BOARD AND SEMICONDUCTOR PACKAGE 有权
    印刷电路板和半导体封装

    公开(公告)号:US20160135326A1

    公开(公告)日:2016-05-12

    申请号:US14820784

    申请日:2015-08-07

    Inventor: Won-young KIM

    Abstract: Provided is a printed circuit board including a first conductive layer including a first conductive layer including a recessed portion, a protruding portion disposed at a higher level than that of the recessed portion, and a connecting portion connecting the recessed portion with the protruding portion. A second conductive layer is disposed above the recessed portion of the first conductive layer. A core layer is disposed between the first conductive layer and the second conductive layer. An upper solder resist layer is disposed on the second conductive layer. The upper solder resist layer exposes at least a portion of the protruding portion. A lower solder resist layer is disposed below the first conductive layer.

    Abstract translation: 提供了一种印刷电路板,包括:第一导电层,包括第一导电层,第一导电层包括凹部,突出部分设置在比凹部更高的位置;以及连接部分,其将凹部与突出部分连接。 第二导电层设置在第一导电层的凹部的上方。 芯层设置在第一导电层和第二导电层之间。 上部阻焊层设置在第二导电层上。 上部阻焊层暴露突出部分的至少一部分。 下部阻焊层设置在第一导电层的下方。

    SEMICONDUCTOR PACKAGE HAVING CHIP STACK

    公开(公告)号:US20210183818A1

    公开(公告)日:2021-06-17

    申请号:US17169701

    申请日:2021-02-08

    Inventor: Won-young KIM

    Abstract: A semiconductor package includes a substrate, a master chip on the substrate, a first slave chip on a top surface of the master chip and partially exposing the top surface of the master chip, the first slave chip having a same size as the master chip and having a same storage capacity as the master chip, and a first chip connector on the exposed top surface of the master chip and coupled to the master chip and the first slave chip.

    METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE

    公开(公告)号:US20190115235A1

    公开(公告)日:2019-04-18

    申请号:US16140877

    申请日:2018-09-25

    Abstract: A method of manufacturing a semiconductor package includes obtaining a plurality of individual chips classified according to a test bin item as a result of performing an electrical die sorting (EDS) process including testing electrical characteristics of a plurality of chips at a wafer level, packaging the individual chips on corresponding chip mounting regions of a circuit substrate and forming a plurality of individual packages based on position information of the chip mounting regions, each of the individual packages having test bin item information corresponding to the test bin item, classifying the plurality of individual packages according to the test bin item based on the test bin item information, and testing the individual packages classified according to the test bin item.

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