Method of testing an object and apparatus for performing the same

    公开(公告)号:US10444162B2

    公开(公告)日:2019-10-15

    申请号:US15938570

    申请日:2018-03-28

    Abstract: An apparatus for testing an object includes a moving unit configured to hold and move the object. A transmissive illuminating unit includes a light source generating light and a transmissive mask pattern. The transmissive mask pattern includes a first region configured to convert the light generated from the light source into a slit light, and a second region arranged in a movement direction of the object with respect to the first region to partially transmit the light generated from the light source. The transmissive illuminating unit is configured to project a measuring light, which is provided by transmitting the light generated from the light source through the transmissive mask pattern, to the object. A detecting unit is configured to receive a reflected light of the measuring light from the object and to detect a height and surface state of the object based on the reflected light.

    INSPECTION DEVICE
    2.
    发明公开
    INSPECTION DEVICE 审中-公开

    公开(公告)号:US20240201104A1

    公开(公告)日:2024-06-20

    申请号:US18533528

    申请日:2023-12-08

    CPC classification number: G01N21/9501 G01N21/01 G01N35/0099

    Abstract: An inspection device improves accuracy characteristics of an (MRAM), the inspection device including a stage on which a MRAM element is fixed, and electromagnets generating a first magnetic field. A magnetic field having a component in a direction perpendicular to the stage is changeable from a first direction to a second direction according to a position on the stage. A second magnetic field in which a direction of a magnetic field component is parallel to the stage changes from a third direction to a fourth direction according to the position on the stage, an optical system illuminating the MRAM element with light including polarized light, and condensing reflected light from reflected illumination light from the MRAM element, and a detector detecting reflected light when the position of the MRAM element is changed, and when the position of the MRAM element in the second magnetic field is changed.

    SEMICONDUCTOR MANUFACTURING DEVICE AND SEMICONDUCTOR MANUFACTURING METHOD

    公开(公告)号:US20240272245A1

    公开(公告)日:2024-08-15

    申请号:US18427676

    申请日:2024-01-30

    CPC classification number: G01R33/0325

    Abstract: A semiconductor manufacturing device includes a detection unit that detects an extinction response of a perpendicular magnetic anisotropy PMA film in a sample from a polar Kerr effect signal, and a derivation unit that derives an anisotropic magnetic field (Hk) of the PMA film by extrapolating and fitting the detected extinction response, in magneto-optical Kerr effect measurement that uses a plurality of electromagnets that electrically apply magnetic fields to the sample on the stage by convert a perpendicular magnetic field that includes a vertical component normal to an upper surface of a stage, and a horizontal magnetic field parallel to the upper surface of the stage.

    Magnetic property measurement apparatus

    公开(公告)号:US11796608B2

    公开(公告)日:2023-10-24

    申请号:US17467967

    申请日:2021-09-07

    CPC classification number: G01R33/0325 G01R33/007 G01R33/0017

    Abstract: The inventive concepts provide a magnetic property measurement apparatus capable of quickly measuring a magnetic property of a subject without a decrease in a measurement speed that might occur due to an electromagnet. In addition, the inventive concepts provide a magnetic property measurement apparatus capable of monitoring a magnetization distribution of a memory device as an image and integrating images by using a TDI camera, thereby being capable of performing highly sensitive measurement and not having to capture images for a long time. The magnetic property measurement apparatus includes: a magnetic field generation unit configured to generate a magnetic field which is constant with time and varies with relative position; a mobile unit configured to move a subject to be measured in the magnetic field; and a measurement unit configured to measure a magnetic property of the subject moving in the magnetic field.

    Semiconductor chip bonding apparatus and method of forming semiconductor device using the same
    9.
    发明授权
    Semiconductor chip bonding apparatus and method of forming semiconductor device using the same 有权
    半导体芯片接合装置及使用其形成半导体器件的方法

    公开(公告)号:US09082885B2

    公开(公告)日:2015-07-14

    申请号:US14283238

    申请日:2014-05-21

    Abstract: A method of manufacturing a semiconductor device includes: providing a first substrate that includes internal wiring, the first substrate including an array of chip mounting regions that includes a first chip mounting region; placing the first substrate on a first carrier line; providing a first semiconductor chip; placing the first semiconductor chip on a first moveable tray; vertically aligning the first chip mounting region of the first substrate with the first semiconductor chip, and performing initial bonding of the first semiconductor chip to the first chip mounting region of the first substrate; and performing subsequent bonding on the initially-bonded first semiconductor chip and first mounting region of the first substrate, thereby more strongly bonding the first semiconductor chip to the first substrate at the first mounting region. The initial bonding occurs after performing a subsequent bonding of at least one other semiconductor chip on the first substrate.

    Abstract translation: 一种制造半导体器件的方法包括:提供包括内部布线的第一基板,所述第一基板包括具有第一芯片安装区域的芯片安装区域阵列; 将第一衬底放置在第一载体线上; 提供第一半导体芯片; 将第一半导体芯片放置在第一可移动托盘上; 将第一基板的第一芯片安装区域与第一半导体芯片垂直对准,并且将第一半导体芯片初始接合到第一基板的第一芯片安装区域; 以及在所述第一基板的初始结合的第一半导体芯片和第一安装区域上进行后续的接合,从而在所述第一安装区域将所述第一半导体芯片与所述第一基板更牢固地接合。 在执行第一衬底上的至少一个其它半导体芯片的后续接合之后发生初始接合。

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