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    BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME
    1.
    发明申请
    BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME 有权

    公开(公告)号：US20250076377A1

    公开(公告)日：2025-03-06

    申请号：US18954320

    申请日：2024-11-20

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Junhee Shin ,  Jooseong Kim ,  Yongjin Lee ,  Michael Choi ,  Kwangho Kim ,  Sangho Kim

    IPC: G01R31/317 ,  G01R31/28 ,  G01R31/30 ,  G01R31/3167 ,  G01R31/319 ,  G01R31/327 ,  H03K19/017

    Abstract: A temperature measurement circuit includes a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature, a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage, a sensing circuit configured to generate a temperature-variant voltage based on a bias current, where the temperature-variant voltage is varied depending on the operation temperature, an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage, and an analog built-in self-test (BIST) circuit configured to generate a plurality of flag signals indicating whether each of the band-gap reference voltage, the measurement reference voltage, and a bias voltage corresponding to the bias current is included in a predetermined range.

    System-on-chip including low-dropout regulator
    2.
    发明授权
    System-on-chip including low-dropout regulator 有权

    公开(公告)号：US11846958B2

    公开(公告)日：2023-12-19

    申请号：US17845541

    申请日：2022-06-21

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Seki Kim ,  Sangho Kim ,  Yongjin Lee ,  Hyongmin Lee ,  Dongha Lee ,  Byeongbae Lee ,  Sungyong Lee

    IPC: G05F1/575

    CPC classification number: G05F1/575

    Abstract: A system-on-chip according to an embodiment includes a core including a header switch circuit configured to transmit a power supply voltage applied to a first power rail as a supply voltage to a second power rail and a logic circuit configured to operate based on the supply voltage from the second power rail, and a low-dropout (LDO) regulator configured to regulate a magnitude of first current output to the second power rail based on a change in the supply voltage, wherein the LDO regulator is further configured to control on/off of a plurality of first header switches included in the header switch circuit based on an amount of the change in the supply voltage.

    Mobile device, and method for releasing lock of the mobile device
    5.
    发明授权
    Mobile device, and method for releasing lock of the mobile device 有权
    移动设备和用于释放移动设备的锁定的方法

    公开(公告)号：US09497634B2

    公开(公告)日：2016-11-15

    申请号：US13787142

    申请日：2013-03-06

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Sangho Kim ,  Musik Kwon ,  Moorim Kim ,  Seongtaek Hwang

    IPC: H04W12/08 ,  H04W52/02 ,  G06F3/0481

    CPC classification number: H04W12/08 ,  G06F3/0481 ,  H04W52/0254 ,  Y02D70/00

    Abstract: A lock state releasing method and a mobile device that releases the lock state by identifying input features of a signature, are provided. The method includes detecting an input signature for releasing the lock state, identifying an input means corresponding to the input, extracting an input feature of the input, calculating similarities and setting weights according to input features, calculating a total similarity, based on the similarities, determining whether the verification is successful, based on the total similarity, and releasing the lock state if the verification has succeeded.

    Abstract translation: 提供了通过识别签名的输入特征来释放锁定状态的锁定状态释放方法和移动设备。 该方法包括检测用于释放锁定状态的输入签名，识别对应于输入的输入装置，提取输入的输入特征，基于输入特征来计算相似度和设置权重，基于相似度计算总相似度， 基于总相似度确定验证是否成功，以及如果验证成功则释放锁定状态。

    Device and method for monitoring function circuit and outputting result of monitoring
    6.
    发明授权
    Device and method for monitoring function circuit and outputting result of monitoring 有权

    公开(公告)号：US12276691B2

    公开(公告)日：2025-04-15

    申请号：US18094860

    申请日：2023-01-09

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Hyunseok Nam ,  Yus Ko ,  Sangho Kim ,  Jaehyuk Yang

    IPC: G01R31/28

    Abstract: A device includes a function circuit that operates based on power provided by a first positive supply voltage and a first negative supply voltage, a monitoring circuit that operates based on power provided by a second positive supply voltage and a second negative supply voltage and that generates a first monitor signal based on monitoring an operation of the function circuit, and an output circuit that generates a second monitor signal based on monitoring the first positive supply voltage, generates a third monitor signal based on monitoring the second positive supply voltage, and generates an output signal that is output through one or more output pins, based on the first monitor signal, the second monitor signal, and the third monitor signal.

    System-on-chip including low-dropout regulator
    7.
    发明授权
    System-on-chip including low-dropout regulator 有权

    公开(公告)号：US12228955B2

    公开(公告)日：2025-02-18

    申请号：US18501721

    申请日：2023-11-03

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Seki Kim ,  Sangho Kim ,  Yongjin Lee ,  Hyongmin Lee ,  Dongha Lee ,  Byeongbae Lee ,  Sungyong Lee

    IPC: G05F1/575 ,  G05F1/46

    Abstract: A system-on-chip according to an embodiment includes a core including a header switch circuit configured to transmit a power supply voltage applied to a first power rail as a supply voltage to a second power rail and a logic circuit configured to operate based on the supply voltage from the second power rail, and a low-dropout (LDO) regulator configured to regulate a magnitude of first current output to the second power rail based on a change in the supply voltage, wherein the LDO regulator is further configured to control on/off of a plurality of first header switches included in the header switch circuit based on an amount of the change in the supply voltage.

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