Semiconductor devices
    2.
    发明授权

    公开(公告)号:US10770560B2

    公开(公告)日:2020-09-08

    申请号:US16214537

    申请日:2018-12-10

    Abstract: A semiconductor device according to an example embodiment of the present inventive concept includes a substrate having a first region and a second region horizontally separate from the first region; a first gate line in the first region, the first gate line including a first lower work function layer and a first upper work function layer disposed on the first lower work function layer; and a second gate line including a second lower work function layer in the second region, the second gate line having a width in a first, horizontal direction equal to or narrower than a width of the first gate line in the first direction, wherein an uppermost end of the first upper work function layer and an uppermost end of the second lower work function layer are each located at a vertical level higher than an uppermost end of the first lower work function layer with respect to a second direction perpendicular to the first direction.

    SEMICONDUCTOR DEVICE
    4.
    发明申请

    公开(公告)号:US20220059533A1

    公开(公告)日:2022-02-24

    申请号:US17219083

    申请日:2021-03-31

    Abstract: A semiconductor device includes first and second active patterns disposed on a substrate, a field insulating film disposed between the first and second active patterns, a first gate structure intersecting the first active pattern, and a second gate structure intersecting the second active pattern, in which the first gate structure includes a first gate insulating film on the first active pattern, a first upper insertion film on the first gate insulating film, and a first upper conductive film on the first upper insertion film, and the second gate structure includes a second gate insulating film on the second active pattern, a second upper insertion film on the second gate insulating film, and a second upper conductive film on the second upper insertion film. Each of the first and second upper insertion films may include an aluminum nitride film. Each of the first and second upper conductive films may include aluminum.

    Semiconductor device and method for fabricating the same

    公开(公告)号:US10600913B2

    公开(公告)日:2020-03-24

    申请号:US16100804

    申请日:2018-08-10

    Abstract: A semiconductor device and a method for fabricating the same are provided. The semiconductor device includes first and second gate stack structures formed in first and second regions, respectively, wherein the first gate stack structure is formed adjacent a first channel region and comprises a first gate insulating film having a first thickness formed on the first channel region, a first function film having a second thickness formed on the first gate insulating film and a first filling film having a third thickness formed on the first function film, wherein the second gate stack structure is formed adjacent a second channel region and comprises a second gate insulating film having the first thickness formed on the second channel region, a second function film having the second thickness formed on the second gate insulating film and a second filling film having the third thickness formed on the second function film, wherein the first and second function films, respectively, comprise TiN and Si concentrations that are different from each other.

    Media Clock Recovery Device And A Method For Recovering Media Clock, And An Electronic Device

    公开(公告)号:US20230262119A1

    公开(公告)日:2023-08-17

    申请号:US18056545

    申请日:2022-11-17

    CPC classification number: H04L67/1095 H04L67/1097

    Abstract: A media clock recovery device, a method for recovering media clock, and an electronic device are provided. The media clock recovery device comprising processing circuitry configured to determine whether a time stamp is normal, the time stamp being received in a packet through a network, calculate an average time interval of a dummy time stamp, the calculated average time interval of the dummy time stamp being used for generating a media clock in response to determining the time stamp is not normal, generate the dummy time stamp based on the calculated average time interval of the dummy time stamp, wherein the processing circuitry is configured to determine the time stamp is not normal, in response to the packet not being received within a time threshold value from a reception time of a previously received packet.

    SEMICONDUCTOR PACKAGE AND METHOD OF FABRICATING THE SAME

    公开(公告)号:US20230026211A1

    公开(公告)日:2023-01-26

    申请号:US17814828

    申请日:2022-07-25

    Abstract: A semiconductor package includes a wiring structure that includes a first insulating layer and a first conductive pattern inside the first insulating layer, a first semiconductor chip disposed on the wiring structure, an interposer that includes a second insulating layer, a second conductive pattern inside the second insulating layer, and a recess that includes a first sidewall formed on a first surface of the interposer that faces the first semiconductor chip and a first bottom surface connected with the first sidewall, where the recess exposes at least a portion of the second insulating layer, a first element bonded to the interposer and that faces the first semiconductor chip inside the recess, and a mold layer that covers the first semiconductor chip and the first element.

    Media clock recovery device and a method for recovering media clock, and an electronic device

    公开(公告)号:US12069130B2

    公开(公告)日:2024-08-20

    申请号:US18056545

    申请日:2022-11-17

    CPC classification number: H04L67/1095 H04L67/1097

    Abstract: A media clock recovery device, a method for recovering media clock, and an electronic device are provided. The media clock recovery device comprising processing circuitry configured to determine whether a time stamp is normal, the time stamp being received in a packet through a network, calculate an average time interval of a dummy time stamp, the calculated average time interval of the dummy time stamp being used for generating a media clock in response to determining the time stamp is not normal, generate the dummy time stamp based on the calculated average time interval of the dummy time stamp, wherein the processing circuitry is configured to determine the time stamp is not normal, in response to the packet not being received within a time threshold value from a reception time of a previously received packet.

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