公开(公告)号：US20190223337A1

公开(公告)日：2019-07-18

申请号：US16161088

申请日：2018-10-16

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Katsuki NAKAJIMA ,  Takako ONISHI ,  Isao NAKANISHI ,  Mayuko TANAKA

IPC分类号： H05K13/08 ,  G01N21/956 ,  G01N23/083

CPC分类号： G05B19/41875 ,  G05B2219/32186 ,  G05B2219/32196 ,  G05B2219/32197 ,  H05K13/083

摘要： An inspection management system having a plurality of processes and managing final inspection performed to inspect a completed product and one or more intermediate inspections performed to inspect an intermediate product manufactured in the processes earlier than a final process includes: an inspection content data acquisition unit that acquires inspection content data including an inspection standard for each inspection item of the product; an inspection content setting unit that sets inspection content based on the inspection content data acquired by the inspection content data acquisition unit; a simulation unit that simulates inspection in accordance with assumed inspection content; an inspection standard calculation unit that calculates an inspection standard more appropriate than a current inspection standard based on the simulation; and an output unit that outputs base information indicating that at least the inspection standard calculated by the inspection standard calculation unit is more appropriate than the current inspection standard.

公开(公告)号：US20240085896A1

公开(公告)日：2024-03-14

申请号：US18259736

申请日：2021-03-11

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA ,  Katsuki NAKAJIMA

IPC分类号： G05B23/02

CPC分类号： G05B23/0216

摘要： A quality improvement support apparatus that supports improvement in quality of a product produced by a production facility, including: a display unit that displays production condition information in which identification information, operation instruction state information, and a condition evaluation index are associated with each other for each operation instruction, the identification information identifying an improvement target that is a production member or a component included in the production facility and that is to be improved to improve quality of the product, the operation instruction state information indicating a state of an operation instruction to perform an operation in relation to the improvement target, the condition evaluation index being an index for evaluating conditions of the production facility relating to the quality of the product; and an additional operation instruction accepting unit accepting an additional operation instruction for additionally giving an instruction to perform an operation on the production facility.

公开(公告)号：US20240062401A1

公开(公告)日：2024-02-22

申请号：US18259749

申请日：2021-03-08

申请人： OMRON Corporation

发明人： Takako ONISHI ,  Takayuki NISHI ,  Shimpei FUJII ,  Hironori KASAHARA ,  Yuji KARITA ,  Hiroyuki MORI

IPC分类号： G06T7/55 ,  G01B11/26 ,  G01B15/04 ,  G06T7/00 ,  G06T7/73

CPC分类号： G06T7/55 ,  G01B11/26 ,  G01B15/04 ,  G06T7/001 ,  G06T7/74 ,  G06T2207/10116 ,  G06T2207/20221 ,  G06T2207/30108

摘要： A measurement system includes a first feature point data generator, a second feature point data generator, and a calculator. The first feature point data generator generates first feature point data from first image data or from first shape data. The first image data is obtained from imaging of a measurement target and includes a predetermined portion of the measurement target. The first shape data is generated based on the first image data. The second feature point data generator generates second feature point data from second image data different from the first image data or from second shape data. The calculator calculates a positional correspondence of the predetermined portion of the measurement target between the first image data and the second image data or between the first shape data and the second shape data based on the first feature point data and the second feature point data.

公开(公告)号：US20240061405A1

公开(公告)日：2024-02-22

申请号：US18259667

申请日：2021-03-11

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA ,  Katsuki NAKAJIMA

IPC分类号： G05B19/418

CPC分类号： G05B19/4183 ,  G05B19/41835 ,  G05B2219/45026 ,  G05B2219/45029

摘要： A management apparatus of a production facility, including: a facility condition collecting unit collecting facility condition information regarding conditions of the production facility from the production facility; an operation instruction creating unit creating operation instruction information indicating an instruction to perform an operation relating to the production facility on the facility condition information; an instruction transmitting unit transmitting the operation instruction information to a target; an operation information receiving unit receiving operation information regarding status of response to the operation instruction information; a management state information creating unit creating management state information including the operation instruction information, the operation information, and the production facility condition information; and an additional operation instruction issuing unit receiving additional operation instruction information indicating an instruction to perform an additional operation on the management state information, and causing the operation instruction creating unit to create operation instruction information including the additional operation instruction information.

公开(公告)号：US20240061402A1

公开(公告)日：2024-02-22

申请号：US18259757

申请日：2021-03-08

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Mayuko TANAKA ,  Isao NAKANISHI ,  Katsuki NAKAJIMA

IPC分类号： G05B19/4155

CPC分类号： G05B19/4155 ,  G05B2219/31372

摘要： A management system includes a production data obtainer that obtains production data being information including a production condition for a product, an optimal value calculator that calculates, based on the production data, an optimal production condition being a production condition optimal to produce the product, an optimal value setting determiner that performs determination as to whether the optimal production condition is to be set as a renewed production condition for the production facility, and an optimal value setter that sets the optimal production condition for the production facility under a predetermined condition. The optimal value setting determiner determines that the optimal production condition is to be set as the renewed production condition for the production facility in response to the production condition at a time of the determination being identical to the production condition used to calculate the optimal production condition by the optimal value calculator.

公开(公告)号：US20240027364A1

公开(公告)日：2024-01-25

申请号：US18258457

申请日：2021-03-08

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA

IPC分类号： G01N21/95

CPC分类号： G01N21/9501

摘要： A management system for a manufacturing facility including a manufacturing device including one or more device members for manufacturing a product, and an inspection device, the system including a display unit, a device member information acquisition unit, a product member information acquisition unit, a manufacturing abnormality information acquisition unit, an improvement candidate information acquisition unit configured to acquire improvement candidate information about candidates for improvement in the manufacturing facility, and a management work support unit configured to create list information and to cause the display unit to display the list information, the list information including an aggregated value of abnormalities of each sort during manufacturing the product and an aggregated value of abnormalities of each sort during inspecting the product within a predetermined aggregation time period, for each device member and/or product member as the candidate for improvement.

公开(公告)号：US20190219521A1

公开(公告)日：2019-07-18

申请号：US16162409

申请日：2018-10-17

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Katsuki NAKAJIMA ,  Mayuko TANAKA ,  Takako ONISHI ,  Isao NAKANISHI

IPC分类号： G01N21/956 ,  G01B11/24 ,  G01N21/93 ,  G01N23/04

CPC分类号： G05B19/41875 ,  G05B2219/32186 ,  G05B2219/32196 ,  G05B2219/32197 ,  H05K13/083

摘要： An inspection management system that manages inspection of an inspection apparatus in a production line including a manufacturing apparatus of a product and the inspection apparatus includes: an acquisition unit configured to acquire inspection content data including an inspection standard for each component; an inspection content setting unit configured to set inspection content; a setting-related information acquisition unit configured to acquire setting-related information including at least a time at which new inspection content is set when the inspection content setting unit sets the new inspection content; a storage unit configured to retain the setting-related information in association with a history of the setting of the inspection content; a setting-related information reading unit configured to read the setting-related information retained in the storage unit; and an output unit configured to be able to output the setting-related information.

公开(公告)号：US20180049356A1

公开(公告)日：2018-02-15

申请号：US15653667

申请日：2017-07-19

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Mayuko KISHIMOTO ,  Shimpei FUJII ,  Katsuki NAKAJIMA

IPC分类号： H05K13/08 ,  B23K3/08 ,  H05K3/34 ,  B23K1/00 ,  G05B19/418 ,  H05K1/02

摘要： An inspection apparatus includes an imaging unit that captures an image of a board having a land on which a solder piece has been printed, an image of the board having a component mounted on the solder piece, or an image of the board having the component soldered to the land, a land determination unit that determines a position of an element on the board other than the land from the image of the board captured by the imaging unit, and determines a position of the land in the image based on the determined position of the element, and an inspection unit that inspects the solder piece or component on the land using the position of the land determined by the land determination unit as a reference.

公开(公告)号：US20240319703A1

公开(公告)日：2024-09-26

申请号：US18259455

申请日：2021-03-08

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Mayuko TANAKA

IPC分类号： G05B19/406

CPC分类号： G05B19/406 ,  G05B2219/37448

摘要： An inspection management system manages, in a production line for a product including a plurality of processes, a final inspection for a product finished through the plurality of processes and a plurality of intermediate inspections before the final inspection. The production line includes a plurality of manufacturing apparatuses and a plurality of inspection apparatuses corresponding to the plurality of processes. The inspection management system includes an inspection data obtainer, an inspection result obtainer, and an inspection setting supporter that generates an inspection record diagram showing, as information about an inspection item in one of the plurality of intermediate inspections, a presence or an absence of a product determined defective in the final inspection and information identifying whether the product determined defective in the final inspection is determined defective under an inspection item in another of the plurality of intermediate inspections, and displays the inspection record diagram.

公开(公告)号：US20240061408A1

公开(公告)日：2024-02-22

申请号：US18259547

申请日：2021-03-11

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA

IPC分类号： G05B19/418

CPC分类号： G05B19/41875 ,  G05B19/41865 ,  G05B2219/32368

摘要： A quality improvement support apparatus that supports improvement in quality of products produced by a production facility includes a display unit that displays production condition information in which quality information regarding the quality occurring or detected in a production step performed by the production facility is arranged in time series in association with a production member or a component included in the production facility, wherein, in the production condition information, the quality information of each product or a plurality of the products occurring or detected in relation to the production member or the component included in the production facility is arranged in an order in which the products are produced.