公开(公告)号：US20240061408A1

公开(公告)日：2024-02-22

申请号：US18259547

申请日：2021-03-11

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA

IPC分类号： G05B19/418

CPC分类号： G05B19/41875 ,  G05B19/41865 ,  G05B2219/32368

摘要： A quality improvement support apparatus that supports improvement in quality of products produced by a production facility includes a display unit that displays production condition information in which quality information regarding the quality occurring or detected in a production step performed by the production facility is arranged in time series in association with a production member or a component included in the production facility, wherein, in the production condition information, the quality information of each product or a plurality of the products occurring or detected in relation to the production member or the component included in the production facility is arranged in an order in which the products are produced.

公开(公告)号：US20240085896A1

公开(公告)日：2024-03-14

申请号：US18259736

申请日：2021-03-11

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA ,  Katsuki NAKAJIMA

IPC分类号： G05B23/02

CPC分类号： G05B23/0216

摘要： A quality improvement support apparatus that supports improvement in quality of a product produced by a production facility, including: a display unit that displays production condition information in which identification information, operation instruction state information, and a condition evaluation index are associated with each other for each operation instruction, the identification information identifying an improvement target that is a production member or a component included in the production facility and that is to be improved to improve quality of the product, the operation instruction state information indicating a state of an operation instruction to perform an operation in relation to the improvement target, the condition evaluation index being an index for evaluating conditions of the production facility relating to the quality of the product; and an additional operation instruction accepting unit accepting an additional operation instruction for additionally giving an instruction to perform an operation on the production facility.

公开(公告)号：US20240061405A1

公开(公告)日：2024-02-22

申请号：US18259667

申请日：2021-03-11

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA ,  Katsuki NAKAJIMA

IPC分类号： G05B19/418

CPC分类号： G05B19/4183 ,  G05B19/41835 ,  G05B2219/45026 ,  G05B2219/45029

摘要： A management apparatus of a production facility, including: a facility condition collecting unit collecting facility condition information regarding conditions of the production facility from the production facility; an operation instruction creating unit creating operation instruction information indicating an instruction to perform an operation relating to the production facility on the facility condition information; an instruction transmitting unit transmitting the operation instruction information to a target; an operation information receiving unit receiving operation information regarding status of response to the operation instruction information; a management state information creating unit creating management state information including the operation instruction information, the operation information, and the production facility condition information; and an additional operation instruction issuing unit receiving additional operation instruction information indicating an instruction to perform an additional operation on the management state information, and causing the operation instruction creating unit to create operation instruction information including the additional operation instruction information.

公开(公告)号：US20240027364A1

公开(公告)日：2024-01-25

申请号：US18258457

申请日：2021-03-08

申请人： OMRON Corporation

发明人： Hiroyuki MORI ,  Keita SAJI ,  Mayuko TANAKA

IPC分类号： G01N21/95

CPC分类号： G01N21/9501

摘要： A management system for a manufacturing facility including a manufacturing device including one or more device members for manufacturing a product, and an inspection device, the system including a display unit, a device member information acquisition unit, a product member information acquisition unit, a manufacturing abnormality information acquisition unit, an improvement candidate information acquisition unit configured to acquire improvement candidate information about candidates for improvement in the manufacturing facility, and a management work support unit configured to create list information and to cause the display unit to display the list information, the list information including an aggregated value of abnormalities of each sort during manufacturing the product and an aggregated value of abnormalities of each sort during inspecting the product within a predetermined aggregation time period, for each device member and/or product member as the candidate for improvement.