• 专利标题: INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTION MANAGEMENT METHOD, AND PROGRAM
  • 申请号: US18259455
    申请日: 2021-03-08
  • 公开(公告)号: US20240319703A1
    公开(公告)日: 2024-09-26
  • 发明人: Hiroyuki MORIMayuko TANAKA
  • 申请人: OMRON Corporation
  • 申请人地址: JP Kyoto-shi, Kyoto
  • 专利权人: OMRON Corporation
  • 当前专利权人: OMRON Corporation
  • 当前专利权人地址: JP Kyoto-shi, Kyoto
  • 优先权: JP 21007225 2021.01.20
  • 国际申请: PCT/JP2021/009048 2021.03.08
  • 进入国家日期: 2023-06-27
  • 主分类号: G05B19/406
  • IPC分类号: G05B19/406
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTION MANAGEMENT METHOD, AND PROGRAM
摘要:
An inspection management system manages, in a production line for a product including a plurality of processes, a final inspection for a product finished through the plurality of processes and a plurality of intermediate inspections before the final inspection. The production line includes a plurality of manufacturing apparatuses and a plurality of inspection apparatuses corresponding to the plurality of processes. The inspection management system includes an inspection data obtainer, an inspection result obtainer, and an inspection setting supporter that generates an inspection record diagram showing, as information about an inspection item in one of the plurality of intermediate inspections, a presence or an absence of a product determined defective in the final inspection and information identifying whether the product determined defective in the final inspection is determined defective under an inspection item in another of the plurality of intermediate inspections, and displays the inspection record diagram.
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