摘要:
A method for manufacturing a composite shoe insole includes a) placing EVA material having at least one bonding zone into a die, b) applying a PU film around a peripheral wall of the bonding zone of the EVA material, c) heating the EVA material, d) placing PU material at a liquid state into the bonding zone, e) solidifying the PU material so that the PU material is combined with the bonding zone to form a shoe insole, and f) stripping the shoe insole from the die to remove the shoe insole. Thus, the composite shoe insole closely combine the EVA material with the PU material, so that the composite shoe insole has a lighter weight by the EVA material and has a soft elastic feature by the PU material.
摘要:
A new type of partially-depleted SOI MOSFET is described in which a tunneling connection between the gate and the base is introduced. This is achieved by using a gate dielectric whose thickness is below its tunneling threshold. The gate pedestal is made somewhat longer than normal and a region near one end is implanted to be P+ (or N+ in a PMOS device). This allows holes (electrons for PMOS) to tunnel from gate to base. Since the hole current is self limiting, applied voltages greater than 0.7 volts may be used without incurring excessive leakage (as is the case with prior art DTMOS devices). A process for manufacturing the device is also described.
摘要:
An EVA sole molding die assembly for molding integral EVA (ethylene vinyl acetate) soles having different color layers, the molding die assembly including a bottom die for molding the bottoms of EVA outsoles, an outsole molding die hinged to the bottom die for molding EVA outsoles, an insole molding die hinged to the outsole molding die for molding EVA insoles on EVA outsoles being molded in the outsole molding die, and a top die hinged to the insole molding die for molding EVA insoles.
摘要:
A semiconductor structure and a method for its manufacture are provided. In one example, the structure includes a well region doped with a first type dopant (e.g., a P-type or N-type dopant). A gate pedestal formed over the well region has two ends, one of which at least partially overlies the well region and is doped with the first type dopant. A dielectric layer is positioned between the gate pedestal and the well region. Source and drain regions formed on opposite sides of the gate pedestal within the well region are doped with a second type dopant opposite in type to the first type dopant.
摘要:
A new type of partially-depleted SOI MOSFET is described in which a tunneling connection between the gate and the base is introduced. This is achieved by using a gate dielectric whose thickness is below its tunneling threshold. The gate pedestal is made somewhat longer than normal and a region near one end is implanted to be P+ (or N+ in a PMOS device). This allows holes (electrons for PMOS) to tunnel from gate to base. Since the hole current is self limiting, applied voltages greater than 0.7 volts may be used without incurring excessive leakage (as is the case with prior art DTMOS devices). A process for manufacturing the device is also described.
摘要:
A method for forming an air chamber in a shoe sole includes disposing a film between two EVA sheet materials and hot-pressing the sheet materials so as to fuse the sheet materials together. The film prevents the sheet materials from being fused together so as to form a gap between the sheet materials. The air generated during hot-pressing and foaming process is accumulated in the gap so as to form an air chamber in the shoe sole such that the air chamber can be formed in the shoe sole without air bags and without injecting pressurized air into the shoe soles.
摘要:
An EVA insole manufacturing process includes a step of making a molding by injecting molding an EVA resin and foaming agent mixture without through crushing or cutting procedure, and a step of heating the molding thus obtained in a mold so that it forms into a predetermined shape. Two or more moldings which respectively contain a different concentration of foaming agent or a different pigment color may be molded together so as to produce an insole which has different hardness and color at different parts thereof.
摘要:
A method for making a SOI wafer with a strained silicon layer for increased electron and hole mobility is achieved. The method forms a porous silicon layer on a seed wafer. A H2 anneal is used to form a smooth surface on the porous silicon. A strain free (relaxed) epitaxial SixGe1-x layer is deposited and a bonding layer is formed. The seed wafer is then bonded to a handle wafer having an insulator on the surface. A spray etch is used to etch the porous Si layer resulting in a SOI handle wafer having portions of the porous Si layer on the relaxed SixGe1-x. The handle wafer is then annealed in H2 to convert the porous Si to a smooth strained Si layer on the relaxed SiGe layer of the SOI wafer.
摘要翻译:实现了制造具有用于增加电子和空穴迁移率的应变硅层的SOI晶片的方法。 该方法在种子晶片上形成多孔硅层。 使用H 2 H 2退火在多孔硅上形成光滑表面。 沉积无应变的(松弛的)外延的Si 1 x 1-x层,并形成结合层。 然后将种子晶片结合到在表面上具有绝缘体的手柄晶片。 使用喷涂蚀刻来蚀刻多孔Si层,导致SOI处理晶片,其具有在松弛的Si 1 x 1-x x上的多孔Si层的部分。 然后将手柄晶片在H 2 2中退火以将多孔Si转化为SOI晶片的松弛SiGe层上的平滑应变Si层。
摘要:
A method for fabricating a Finfet device with body contacts and a device fabricated using the method are provided. In one example, a silicon-on-insulator substrate is provided. A T-shaped active region is defined in the silicon layer of the silicon-on-insulator substrate. A source region and a drain region form two ends of a cross bar of the T-shaped active region and a body contact region forms a leg of the T-shaped active region. A gate oxide layer is grown on the active region. A polysilicon layer is deposited overlying the gate oxide layer and patterned to form a gate, where an end of the gate partially overlies the body contact region to complete formation of a Finfet device with body contact.
摘要:
A method of fabricating a double gate, FINFET device structure in a silicon on insulator layer, in which the channel region formed in the SOI layer is defined with a narrowed, or necked shape, and wherein a composite insulator spacer is formed on the sides of the device structure, has been developed. A FINFET device structure shape is formed in an SOI layer via anisotropic RIE procedures, followed by a growth of a silicon dioxide gate insulator layer on the sides of the FINFET device structure shape. A gate structure is fabricated traversing the device structure and overlying the silicon dioxide gate insulator layer located on both sides of the narrowest portion of channel region. After formation of a source/drain region in wider, non-channel regions of the FINFET device structure shape, composite insulator spacers are formed on the sides of the FINFET shape and on the sides of the gate structure. Metal silicide is next formed on source/drain regions resulting in a FINFET device structure featuring a narrow channel region, and surrounded by composite insulator spacers located on the sides of the device structure.