Method for manufacturing composite shoe insole
    1.
    发明申请
    Method for manufacturing composite shoe insole 审中-公开
    复合鞋垫制造方法

    公开(公告)号:US20070126146A1

    公开(公告)日:2007-06-07

    申请号:US11294594

    申请日:2005-12-05

    申请人: Kuo-Nan Yang

    发明人: Kuo-Nan Yang

    IPC分类号: B29C41/22 B29C41/42

    摘要: A method for manufacturing a composite shoe insole includes a) placing EVA material having at least one bonding zone into a die, b) applying a PU film around a peripheral wall of the bonding zone of the EVA material, c) heating the EVA material, d) placing PU material at a liquid state into the bonding zone, e) solidifying the PU material so that the PU material is combined with the bonding zone to form a shoe insole, and f) stripping the shoe insole from the die to remove the shoe insole. Thus, the composite shoe insole closely combine the EVA material with the PU material, so that the composite shoe insole has a lighter weight by the EVA material and has a soft elastic feature by the PU material.

    摘要翻译: 一种制造复合鞋内底的方法包括:a)将具有至少一个粘合区的EVA材料放入模具中,b)在EVA材料的接合区的周壁周围施加PU膜,c)加热EVA材料, d)将PU材料以液体状态放置到粘合区域中,e)固化PU材料,使得PU材料与粘合区域结合以形成鞋内底,以及f)从模具剥离鞋垫以除去 鞋垫。 因此,复合鞋内底将EVA材料与PU材料紧密结合,使得复合鞋内底由EVA材料具有较轻的重量,并且由PU材料具有柔软的弹性特征。

    High performance PD SOI tunneling-biased MOSFET
    2.
    发明授权
    High performance PD SOI tunneling-biased MOSFET 有权
    高性能PD SOI隧道偏置MOSFET

    公开(公告)号:US06674130B2

    公开(公告)日:2004-01-06

    申请号:US10316601

    申请日:2002-12-11

    IPC分类号: H01L2362

    摘要: A new type of partially-depleted SOI MOSFET is described in which a tunneling connection between the gate and the base is introduced. This is achieved by using a gate dielectric whose thickness is below its tunneling threshold. The gate pedestal is made somewhat longer than normal and a region near one end is implanted to be P+ (or N+ in a PMOS device). This allows holes (electrons for PMOS) to tunnel from gate to base. Since the hole current is self limiting, applied voltages greater than 0.7 volts may be used without incurring excessive leakage (as is the case with prior art DTMOS devices). A process for manufacturing the device is also described.

    摘要翻译: 描述了一种新型的部分耗尽的SOI MOSFET,其中引入了栅极和基极之间的隧道连接。 这通过使用其厚度低于其隧道阈值的栅极电介质实现。 栅极基座比正常长一些,一端附近的区域植入P +(或PMOS器件中的N +)。 这允许空穴(PMOS的电子)从栅极到基极隧道。 由于空穴电流是自限制的,所以可以使用大于0.7伏的施加电压,而不会引起过大的泄漏(如现有技术的DTMOS器件的情况)。 还描述了用于制造该装置的方法。

    EVA sole molding die assembly
    3.
    发明授权
    EVA sole molding die assembly 失效
    EVA鞋底成型模具总成

    公开(公告)号:US5352105A

    公开(公告)日:1994-10-04

    申请号:US185005

    申请日:1994-01-24

    申请人: Kuo-Nan Yang

    发明人: Kuo-Nan Yang

    摘要: An EVA sole molding die assembly for molding integral EVA (ethylene vinyl acetate) soles having different color layers, the molding die assembly including a bottom die for molding the bottoms of EVA outsoles, an outsole molding die hinged to the bottom die for molding EVA outsoles, an insole molding die hinged to the outsole molding die for molding EVA insoles on EVA outsoles being molded in the outsole molding die, and a top die hinged to the insole molding die for molding EVA insoles.

    摘要翻译: 一种用于模制具有不同颜色层的整体EVA(乙烯 - 乙酸乙烯酯)鞋底的EVA鞋底模制组件,该成型模具组件包括用于模制EVA外底的底部的底模,用于模塑EVA外底的底模的外底成型模 ,一个内底成型模具,铰接到外底模具上,用于模塑在外底模具中的EVA外底上的EVA鞋垫,以及铰接到用于模制EVA鞋垫的鞋内底模具的顶模。

    High performance tunneling-biased MOSFET and a process for its manufacture
    4.
    发明授权
    High performance tunneling-biased MOSFET and a process for its manufacture 有权
    高性能隧道偏置MOSFET及其制造工艺

    公开(公告)号:US07187000B2

    公开(公告)日:2007-03-06

    申请号:US11081993

    申请日:2005-03-16

    IPC分类号: H01L23/62 H01L29/10

    摘要: A semiconductor structure and a method for its manufacture are provided. In one example, the structure includes a well region doped with a first type dopant (e.g., a P-type or N-type dopant). A gate pedestal formed over the well region has two ends, one of which at least partially overlies the well region and is doped with the first type dopant. A dielectric layer is positioned between the gate pedestal and the well region. Source and drain regions formed on opposite sides of the gate pedestal within the well region are doped with a second type dopant opposite in type to the first type dopant.

    摘要翻译: 提供半导体结构及其制造方法。 在一个示例中,该结构包括掺杂有第一类型掺杂剂的阱区(例如,P型或N型掺杂剂)。 形成在阱区上方的栅极基座具有两个端部,其中一个端部至少部分地覆盖阱区域并且掺杂有第一类型的掺杂剂。 电介质层位于门基座和阱区之间。 形成在阱区内的栅极基座的相对侧上的源极和漏极区域掺杂有与第一类型掺杂物类型相反的第二类型掺杂物。

    High performance PD SOI tunneling-biased MOSFET
    5.
    发明授权
    High performance PD SOI tunneling-biased MOSFET 有权
    高性能PD SOI隧道偏置MOSFET

    公开(公告)号:US06518105B1

    公开(公告)日:2003-02-11

    申请号:US10021702

    申请日:2001-12-10

    IPC分类号: H01L2100

    摘要: A new type of partially-depleted SOI MOSFET is described in which a tunneling connection between the gate and the base is introduced. This is achieved by using a gate dielectric whose thickness is below its tunneling threshold. The gate pedestal is made somewhat longer than normal and a region near one end is implanted to be P+ (or N+ in a PMOS device). This allows holes (electrons for PMOS) to tunnel from gate to base. Since the hole current is self limiting, applied voltages greater than 0.7 volts may be used without incurring excessive leakage (as is the case with prior art DTMOS devices). A process for manufacturing the device is also described.

    摘要翻译: 描述了一种新型的部分耗尽的SOI MOSFET,其中引入了栅极和基极之间的隧道连接。 这通过使用其厚度低于其隧道阈值的栅极电介质实现。 栅极基座比正常长一些,一端附近的区域植入P +(或PMOS器件中的N +)。 这允许空穴(PMOS的电子)从栅极到基极隧道。 由于空穴电流是自限制的,所以可以使用大于0.7伏的施加电压,而不会引起过大的泄漏(如现有技术的DTMOS器件的情况)。 还描述了用于制造该装置的方法。

    Method for forming air chamber in shoe sole
    6.
    发明授权
    Method for forming air chamber in shoe sole 失效
    鞋底形成气室的方法

    公开(公告)号:US5503786A

    公开(公告)日:1996-04-02

    申请号:US515207

    申请日:1995-08-15

    申请人: Kuo-Nan Yang

    发明人: Kuo-Nan Yang

    IPC分类号: B29C44/06 B29C44/12

    CPC分类号: B29C44/06

    摘要: A method for forming an air chamber in a shoe sole includes disposing a film between two EVA sheet materials and hot-pressing the sheet materials so as to fuse the sheet materials together. The film prevents the sheet materials from being fused together so as to form a gap between the sheet materials. The air generated during hot-pressing and foaming process is accumulated in the gap so as to form an air chamber in the shoe sole such that the air chamber can be formed in the shoe sole without air bags and without injecting pressurized air into the shoe soles.

    摘要翻译: 用于在鞋底中形成空气室的方法包括在两个EVA片材之间设置膜并热压片材以便将片材熔合在一起。 该膜防止片状材料熔合在一起,从而在片材之间形成间隙。 在热压和发泡过程中产生的空气积聚在间隙中,以在鞋底中形成空气室,使得空气室可以形成在鞋底中而没有气袋,并且不将加压空气注入鞋底 。

    EVA insole manufacturing process
    7.
    发明授权
    EVA insole manufacturing process 失效
    EVA鞋垫制造工艺

    公开(公告)号:US5308420A

    公开(公告)日:1994-05-03

    申请号:US20391

    申请日:1993-02-22

    申请人: Kuo-Nan Yang

    发明人: Kuo-Nan Yang

    摘要: An EVA insole manufacturing process includes a step of making a molding by injecting molding an EVA resin and foaming agent mixture without through crushing or cutting procedure, and a step of heating the molding thus obtained in a mold so that it forms into a predetermined shape. Two or more moldings which respectively contain a different concentration of foaming agent or a different pigment color may be molded together so as to produce an insole which has different hardness and color at different parts thereof.

    摘要翻译: EVA鞋垫制造方法包括通过注射成型EVA树脂和发泡剂混合物而不经过粉碎或切割过程来制造成型的步骤,以及在模具中加热由此获得的模制物以使其形成预定形状的步骤。 可以将分别含有不同浓度的发泡剂或不同颜料颜色的两种或更多种模制品一起模制,以便生产在其不同部分具有不同硬度和颜色的鞋垫。

    Method of fabricating a wafer with strained channel layers for increased electron and hole mobility for improving device performance
    8.
    发明授权
    Method of fabricating a wafer with strained channel layers for increased electron and hole mobility for improving device performance 有权
    制造具有应变通道层的晶片以提高电子和空穴迁移率以提高器件性能的方法

    公开(公告)号:US07312136B2

    公开(公告)日:2007-12-25

    申请号:US10899270

    申请日:2004-07-26

    IPC分类号: H01L21/20

    摘要: A method for making a SOI wafer with a strained silicon layer for increased electron and hole mobility is achieved. The method forms a porous silicon layer on a seed wafer. A H2 anneal is used to form a smooth surface on the porous silicon. A strain free (relaxed) epitaxial SixGe1-x layer is deposited and a bonding layer is formed. The seed wafer is then bonded to a handle wafer having an insulator on the surface. A spray etch is used to etch the porous Si layer resulting in a SOI handle wafer having portions of the porous Si layer on the relaxed SixGe1-x. The handle wafer is then annealed in H2 to convert the porous Si to a smooth strained Si layer on the relaxed SiGe layer of the SOI wafer.

    摘要翻译: 实现了制造具有用于增加电子和空穴迁移率的应变硅层的SOI晶片的方法。 该方法在种子晶片上形成多孔硅层。 使用H 2 H 2退火在多孔硅上形成光滑表面。 沉积无应变的(松弛的)外延的Si 1 x 1-x层,并形成结合层。 然后将种子晶片结合到在表面上具有绝缘体的手柄晶片。 使用喷涂蚀刻来蚀刻多孔Si层,导致SOI处理晶片,其具有在松弛的Si 1 x 1-x x上的多孔Si层的部分。 然后将手柄晶片在H 2 2中退火以将多孔Si转化为SOI晶片的松弛SiGe层上的平滑应变Si层。

    Method for Fabricating a Body Contact in a Finfet Structure and a Device Including the Same
    9.
    发明申请
    Method for Fabricating a Body Contact in a Finfet Structure and a Device Including the Same 有权
    在Finfet结构中制造身体接触的方法和包括其的设备

    公开(公告)号:US20070228372A1

    公开(公告)日:2007-10-04

    申请号:US11761547

    申请日:2007-06-12

    IPC分类号: H01L23/58

    摘要: A method for fabricating a Finfet device with body contacts and a device fabricated using the method are provided. In one example, a silicon-on-insulator substrate is provided. A T-shaped active region is defined in the silicon layer of the silicon-on-insulator substrate. A source region and a drain region form two ends of a cross bar of the T-shaped active region and a body contact region forms a leg of the T-shaped active region. A gate oxide layer is grown on the active region. A polysilicon layer is deposited overlying the gate oxide layer and patterned to form a gate, where an end of the gate partially overlies the body contact region to complete formation of a Finfet device with body contact.

    摘要翻译: 提供了一种用于制造具有主体触点的Finfet器件的方法和使用该方法制造的器件。 在一个示例中,提供绝缘体上硅衬底。 在绝缘体上硅衬底的硅层中限定T形有源区。 源极区域和漏极区域形成T形有源区域的横杆的两个端部,并且主体接触区域形成T形有源区域的腿部。 在有源区上生长栅氧化层。 沉积覆盖栅极氧化物层的多晶硅层并图案化以形成栅极,其中栅极的一端部分覆盖在主体接触区域上,以完成具有身体接触的Finfet器件的形成。

    Method of fabricating a necked finfet device
    10.
    发明申请
    Method of fabricating a necked finfet device 有权
    制造颈缩鳍片装置的方法

    公开(公告)号:US20050253193A1

    公开(公告)日:2005-11-17

    申请号:US10835789

    申请日:2004-04-30

    IPC分类号: H01L21/336 H01L29/786

    摘要: A method of fabricating a double gate, FINFET device structure in a silicon on insulator layer, in which the channel region formed in the SOI layer is defined with a narrowed, or necked shape, and wherein a composite insulator spacer is formed on the sides of the device structure, has been developed. A FINFET device structure shape is formed in an SOI layer via anisotropic RIE procedures, followed by a growth of a silicon dioxide gate insulator layer on the sides of the FINFET device structure shape. A gate structure is fabricated traversing the device structure and overlying the silicon dioxide gate insulator layer located on both sides of the narrowest portion of channel region. After formation of a source/drain region in wider, non-channel regions of the FINFET device structure shape, composite insulator spacers are formed on the sides of the FINFET shape and on the sides of the gate structure. Metal silicide is next formed on source/drain regions resulting in a FINFET device structure featuring a narrow channel region, and surrounded by composite insulator spacers located on the sides of the device structure.

    摘要翻译: 一种在绝缘体上硅层制造双栅极FINFET器件结构的方法,其中形成在SOI层中的沟道区域被限定为窄的或颈部形状,并且其中复合绝缘体隔离物形成在 器件结构,已经开发。 通过各向异性RIE工艺在SOI层中形成FINFET器件结构形状,随后在FINFET器件结构形状的侧面上生长二氧化硅栅极绝缘体层。 制造横跨器件结构并覆盖位于沟道区域最窄部分两侧的二氧化硅栅极绝缘体层的栅极结构。 在FINFET器件结构形状的较宽的非沟道区域中形成源极/漏极区域之后,在FINFET形状的侧面和栅极结构的侧面上形成复合绝缘体间隔物。 金属硅化物接着形成在源极/漏极区域上,导致FINFET器件结构的特征是窄的沟道区域,并被位于器件结构侧面的复合绝缘体隔离物围绕。