摘要:
A crankshaft is normally and reversely rotated at a constant speed, during which the singular points of crankshaft driving motor current responding to the drive torque change of the crankshaft are detected. A crankshaft rotational angle reference point is set based on the midpoint between the crankshaft rotational positions obtained when, among these singular points, singular points having the same type appear during the respective normal and reverse rotations. Therefore, the crankshaft rotational angle reference point can be reliably set regardless of the variations and errors.
摘要:
An unlocking controller is provided for an irreversible rotary transmission system having the irreversible rotary transmission system having an irreversible rotation transmission element arranged between an input shaft and an output shaft. The unlocking controller includes an input shaft rotation direction determination section and an unlocking torque setting section. The input shaft rotation direction determination section determines whether an input shaft rotational direction is the same as, or opposite to, a direction of the load torque of the output shaft. The unlocking torque setting section conducts an unlocking torque control that sets the unlocking torque a higher value when the input shaft rotational direction and the direction of the load torque of the output shaft are the same as while the lock is released, than when the input shaft rotational direction is opposite to the direction of the direction of the load torque of the output shaft.
摘要:
An unlocking controller is provided for an irreversible rotary transmission system having the irreversible rotary transmission system having an irreversible rotation transmission element arranged between an input shaft and an output shaft. The unlocking controller includes an input shaft rotation direction determination section and an unlocking torque setting section. The input shaft rotation direction determination section determines whether an input shaft rotational direction is the same as, or opposite to, a direction of the load torque of the output shaft. The unlocking torque setting section conducts an unlocking torque control that sets the unlocking torque a higher value when the input shaft rotational direction and the direction of the load torque of the output shaft are the same as while the lock is released, than when the input shaft rotational direction is opposite to the direction of the direction of the load torque of the output shaft.
摘要:
A crankshaft is normally and reversely rotated at a constant speed, during which the singular points of crankshaft driving motor current responding to the drive torque change of the crankshaft are detected. A crankshaft rotational angle reference point is set based on the midpoint between the crankshaft rotational positions obtained when, among these singular points, singular points having the same type appear during the respective normal and reverse rotations. Therefore, the crankshaft rotational angle reference point can be reliably set regardless of the variations and errors.
摘要:
A packaging and filling machine that is capable of easily preforming with the forming flaps by keeping the pressure of the filled liquid food in the tube at positive pressure, capable of preventing the pressure of the liquid food from dropping to negative pressure, even if the pressure of the liquid food decreases due to the change in the liquid food pressure, and capable of preventing outside atmosphere materials from invading into the tube.A pressure flange fixed on a periphery of the filling pipe absorbs fluctuation of the pressure of the liquid food in the tube below the pressure flange, and prevents the liquid food pressure from dropping to negative pressure to keep the pressure of the liquid food in the tube below the pressure flange at a positive pressure.
摘要:
Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer.The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.
摘要:
A first expansion valve is provided in an outdoor unit, and a second expansion valve is provided in an indoor unit. A pipe line connects a first joint pipe of the first expansion valve and a second joint pipe of the second expansion valve. When a refrigerant flows in from the second joint pipe and flows out from the first joint pipe, the first and second expansion valves are in a full open state due to pressure of the refrigerant. When the refrigerant flows in from the first joint pipe and flows out from the second joint pipe, the first and second expansion valves are in semi-closed state (flow rate controlling state). In a cooling mode, the second expansion valve expands the refrigerant just before an indoor heat exchanger, and in a heating mode, the first expansion valve expands the refrigerant just before an outdoor heat exchanger. In both heating and cooling mode, a large amount of refrigerant flows through the pipe line to reduce pressure loss.
摘要:
A first expansion valve is provided in an outdoor unit, and a second expansion valve is provided in an indoor unit. A pipe line connects a first joint pipe of the first expansion valve and a second joint pipe of the second expansion valve. When a refrigerant flows in from the second joint pipe and flows out from the first joint pipe, the first and second expansion valves are in a full open state due to pressure of the refrigerant. When the refrigerant flows in from the first joint pipe and flows out from the second joint pipe, the first and second expansion valves are in semi-closed state (flow rate controlling state). In a cooling mode, the second expansion valve expands the refrigerant just before an indoor heat exchanger, and in a heating mode, the first expansion valve expands the refrigerant just before an outdoor heat exchanger. In both heating and cooling mode, a large amount of refrigerant flows through the pipe line to reduce pressure loss.
摘要:
Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer.The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.
摘要:
An apparatus for inspecting a sample using a scanning electron microscope includes a sample stage, a first electron-optical system to scan an electron beam of a first beam current on the sample, a second electron-optical system to scan an electron beam of a second beam current smaller than the first beam current on the sample, a mechanism to move the sample stage, a detector provided in each of the first and second electron-optical systems to detect a secondary electron. The first electron-optical system is operable in a first mode and the second electron-optical system is operable in a second mode with higher resolution than that of the first mode. In the first mode, the sample is observed while the sample stage is moved continuously, and in the second mode, the sample is observed by detecting a secondary electron using the detector while the sample stage is held stationary.