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公开(公告)号:US11875063B2
公开(公告)日:2024-01-16
申请号:US18082759
申请日:2022-12-16
Applicant: KIOXIA CORPORATION
Inventor: Marie Takada , Masanobu Shirakawa , Tsukasa Tokutomi
IPC: G11C29/00 , G06F3/06 , G11C16/26 , G11C16/10 , G11C16/16 , G11C16/08 , G06F11/10 , G11C29/52 , G11C16/04 , G11C11/56 , H10B41/27 , H10B41/35 , H10B43/27 , H10B43/35
CPC classification number: G06F3/0659 , G06F3/0604 , G06F3/0679 , G06F11/1068 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/26 , G11C29/52 , G11C11/5621 , G11C11/5671 , H10B41/27 , H10B41/35 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The memory system is capable of executing a first operation and a second operation. In the first operation, the controller issues a first command sequence, the semiconductor memory applies a first voltage to a first word line and applies a second voltage to a second word line to read data from the first memory, and the read data is transmitted to the controller from the semiconductor memory. In the second operation, the controller issues a second command sequence, the semiconductor memory applies a third voltage to the first word line and applies a fourth voltage to the second word line, and data held in the memory cell array is left untransmitted to the controller.
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2.
公开(公告)号:US11790986B2
公开(公告)日:2023-10-17
申请号:US17874926
申请日:2022-07-27
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada
IPC: G11C11/00 , G11C16/04 , G11C11/56 , G11C16/26 , G06F11/10 , G11C16/30 , G11C16/08 , H10B43/27 , H10B43/35
CPC classification number: G11C11/5642 , G06F11/1068 , G11C11/5671 , G11C16/0483 , G11C16/26 , G11C16/08 , G11C16/30 , G11C2211/563 , G11C2211/5642 , H10B43/27 , H10B43/35
Abstract: A memory system is provided, including a semiconductor storage device including memory cells that can store data of n bits, and a word line connected to the cells; and a memory controller to control the device and being configured to send a first read request, in response to which the device can perform a first read operation of reading first data out of the cells with a first voltage applied to the word line, to send a second read request, in response to which the device can perform a second read operation of reading second data out of the cells with a second voltage within a first voltage range and a third voltage within a second voltage range applied to the word line, perform a first logical operation of logically processing the first and the second data, and send third data generated by the first logical operation to the controller.
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公开(公告)号:US11756642B2
公开(公告)日:2023-09-12
申请号:US17476229
申请日:2021-09-15
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Kiwamu Watanabe , Kengo Kurose
CPC classification number: G11C29/12 , G06F3/0619 , G06F3/0658 , G06F3/0673 , G11C16/08 , G11C16/26 , G11C2029/1202
Abstract: A memory system according to an embodiment includes a semiconductor memory, and a memory controller. The semiconductor memory comprises memory cells and word lines. Each of the word lines is connected to the memory cells. The memory controller executes a patrol operation including a read operation of the semiconductor memory. The word lines are classified into one of first and second groups. The memory controller executes patrol operations in which the word lines are respectively selected in a first patrol period and, in a second patrol period subsequent to the first patrol period, executes a patrol operation in which the word line included in the first group is selected and omits a patrol operation in which the word line included in the second group is selected.
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公开(公告)号:US11537465B2
公开(公告)日:2022-12-27
申请号:US17174399
申请日:2021-02-12
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada , Masamichi Fujiwara , Kazumasa Yamamoto , Naoaki Kokubun , Tatsuro Hitomi , Hironori Uchikawa
Abstract: In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.
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公开(公告)号:US11892907B2
公开(公告)日:2024-02-06
申请号:US17984309
申请日:2022-11-10
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada , Masamichi Fujiwara , Kazumasa Yamamoto , Naoaki Kokubun , Tatsuro Hitomi , Hironori Uchikawa
CPC classification number: G06F11/1068 , G06F11/1012 , G06F11/1048 , H03M13/1105 , H03M13/1108 , H03M13/1111 , H03M13/152 , H03M13/2906 , H03M13/3715 , H03M13/6505
Abstract: In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.
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公开(公告)号:US11763893B2
公开(公告)日:2023-09-19
申请号:US17568336
申请日:2022-01-04
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada , Shohei Asami , Masamichi Fujiwara
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C16/0483 , G11C11/5671 , G11C16/08 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes first to fourth word lines and first to fourth memory cells. The controller is configured to issue first and second instructions. The controller is further configured to execute a first operation to obtain a first read voltage based on a threshold distribution of the first memory cell, and a second operation to read data from the second memory cell.
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公开(公告)号:US11626167B2
公开(公告)日:2023-04-11
申请号:US17131026
申请日:2020-12-22
Applicant: KIOXIA CORPORATION
Inventor: Masanobu Shirakawa , Tsukasa Tokutomi , Marie Takada
IPC: G11C16/26 , G11C11/56 , G11C16/04 , H01L27/11582 , H01L27/1157
Abstract: According to one embodiment, a memory system includes a semiconductor memory device and a controller. The device includes a plurality of memory cells capable of storing at least first to third data and a word line coupled to the plurality of memory cells. The first data is determined by a first read operation including a first read level. The second data is determined by a second read operation including a second read level. The third data is determined by a third read operation including a third read level. The controller controls the semiconductor memory device to perform a forth read operation including the first and second read levels in a search operation for first to third read voltages corresponding to the first to third read levels, respectively.
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公开(公告)号:US11315643B2
公开(公告)日:2022-04-26
申请号:US16892817
申请日:2020-06-04
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa
Abstract: According to one embodiment, a controller is configured to write four-bit data in each of memory cells, and read first data item from the memory cells through application of a first voltage to a word line. The controller is configured to read second data items by repeating a first operation of reading data including data of respective first bits of the memory cells through application of two voltages to the word line at different timings while changing the two voltages in each first operation from the two voltages in another first operation. The controller is configured to mask part of each of the second data items using the first data.
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公开(公告)号:US11211138B2
公开(公告)日:2021-12-28
申请号:US17003937
申请日:2020-08-26
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Kiwamu Watanabe , Yuko Noda
Abstract: A memory system includes a memory chip and a memory controller. The memory chip has a first plane and a second plane. A threshold voltage corresponding to multiple bit data is set for each of the memory cells. The memory controller causes the memory chip to execute a first read process on the first plane and the second plane in parallel by using a plurality of first read voltages different from each other for the first plane and the second plane. The first read process being a process of reading a data group of one bit among the multiple bits by using the first read voltages. The memory controller subsequently adjusts the voltage levels of the first read voltages on the basis of the data group read from the memory cells of the first plane and the data group read from the memory cells of the second plane.
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公开(公告)号:US12094541B2
公开(公告)日:2024-09-17
申请号:US17452463
申请日:2021-10-27
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Kengo Kurose , Marie Takada , Ryo Yamaki , Kiyotaka Iwasaki , Yoshihisa Kojima
IPC: G11C7/00 , G06F3/06 , G06F11/10 , G11C11/56 , G11C16/04 , G11C16/26 , G11C29/52 , G11C16/08 , H10B43/27 , H10B43/35
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G06F11/1068 , G11C11/5671 , G11C16/0483 , G11C29/52 , G11C16/08 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller. The memory controller is configured: to store, in a buffer, a data set read from a cell unit, and an expected data set generated by an error correction on the data set; to count a number of first and second memory cells corresponding to a first and a second combination of data in the data set and the expected data set, respectively, among the memory cells in the cell unit; to calculate a shift amount of a read voltage used in a read operation from the cell unit, based on the number of the first and second memory cells; and to apply the shift amount to a next read operation from the first cell unit.
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