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公开(公告)号：US20230066704A1
公开(公告)日：2023-03-02
申请号：US17681396
申请日：2022-02-25
发明人： Hiroya KANO , Hiroshi OHNO
IPC分类号： G01N21/88
摘要： According to the embodiment, an optical inspection method includes: emitting, acquiring, and comparing. The emitting includes emitting light beams having a first wavelength and a second wavelength toward an imaging unit in accordance with light beam directions from a subject, with light beam intensities of the first wavelength and the second wavelength being in a complementary relationship. The acquiring includes acquiring each of information of a first image related to the first wavelength and information of a second image related to the second wavelength with the imaging unit. The comparing includes comparing the information of the first image and the information of the second image to extract unevenness information of the subject.
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公开(公告)号：US20230077793A1
公开(公告)日：2023-03-16
申请号：US17652493
申请日：2022-02-25
发明人： Hiroshi OHNO , Hiroya KANO , Takahiro KAMIKAWA , Hideaki OKANO , Akifumi Ohno , Akio KAWASAKI , Toshihiro KIKKAWA
摘要： According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.
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3.发明公开公开(公告)号：US20240319111A1
公开(公告)日：2024-09-26
申请号：US18493995
申请日：2023-10-25
发明人： Hiroshi OHNO , Hideaki OKANO , Kenta TAKANASHI , Takahiro KAMIKAWA , Hiroya KANO
IPC分类号： G01N21/956 , G01N21/88
CPC分类号： G01N21/95607 , G01N21/8806 , G01N21/8851 , G01N2021/8825
摘要： According to one embodiment, an optical inspection method includes projecting first pattern light in a first basic modulation mode that periodically changes in bright and dark, onto an object, acquiring a first image by capturing an image of the object onto which the first pattern light has been projected, projecting second pattern light in a first inverted modulation mode in which bright and dark are inverted with respect to the first basic modulation mode, onto the object, acquiring a second image by capturing an image of the object onto which the second pattern light has been projected, and generating a singular light-scattered image in which a singular region including uniquely-scattered light that is extracted based at least on the first image and the second image is intensified.
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公开(公告)号：US20180101958A1
公开(公告)日：2018-04-12
申请号：US15699187
申请日：2017-09-08
发明人： Hiroya KANO , Hideaki OKANO
CPC分类号： G06T7/13 , G01B11/022 , G01B11/028 , G06K9/6215 , G06T7/174 , G06T2207/10016 , G06T2207/10024 , G06T2207/10152 , G06T2207/30108 , H04N5/2256
摘要： According to one embodiment, an edge detection device includes a light source, an imaging part, and a detector. The light source includes at least three light-emitting parts for irradiating a plurality of objects adjacent with a light. The imaging part images a surface of the objects irradiated by each of the light-emitting parts, and generates a plurality of image data of the surface. The detector detects edges of the surface imaged, based on at least two different combinations of the plurality of image data.
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公开(公告)号：US20230288619A1
公开(公告)日：2023-09-14
申请号：US18320525
申请日：2023-05-19
发明人： Hiroya KANO , Hiroshi OHNO , Hideaki OKANO
CPC分类号： G02B5/20 , H04N5/911 , G01N21/455
摘要： According to one embodiment, an optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.
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公开(公告)号：US20210131961A1
公开(公告)日：2021-05-06
申请号：US17006933
申请日：2020-08-31
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO , Takahiro KAMIKAWA
摘要： According to one embodiment, an optical inspection apparatus includes a first illuminator, an image-forming optical system, a scattering light selector, and an imaging element. The first illuminator is configured to emit a first light beam. The first light beam reflected by an object is incident on the image-forming optical system. The scattering light selector is configured to emit passing light beams of at least two mutually different wavelength regions, at the same time as the first light beam passes, a wavelength spectrum of at least one of the passing light beams being different from a wavelength spectrum of the reflected first light beam. The passing light beams simultaneously form an image on the imaging element.
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公开(公告)号：US20240094115A1
公开(公告)日：2024-03-21
申请号：US18174367
申请日：2023-02-24
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO
CPC分类号： G01N21/31 , G06T5/003 , G06T5/10 , G06T5/20 , G06T7/0008 , G06T2207/10152 , G06T2207/20048
摘要： According to an embodiment, a non-transitory storage medium stores an optical inspection program. The optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.
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公开(公告)号：US20230314335A1
公开(公告)日：2023-10-05
申请号：US17823780
申请日：2022-08-31
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO
CPC分类号： G01N21/8851 , G01N21/01 , G01N21/41 , G01N21/8806 , G01N2021/8845
摘要： According to an embodiment, an optical inspection method includes calculating irradiation field information concerning an irradiation field on a surface of a subject when irradiating the surface of the subject with a light beam from an illumination device that is supported by a movable body and moved; and performing path calculation processing of calculating, based on the irradiation field information, a path for the illumination device to move.
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公开(公告)号：US20230304929A1
公开(公告)日：2023-09-28
申请号：US17823957
申请日：2022-09-01
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO , Takahiro KAMIKAWA
CPC分类号： G01N21/4738 , G01N21/27 , G01N21/255
摘要： According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.
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公开(公告)号：US20200333247A1
公开(公告)日：2020-10-22
申请号：US16911473
申请日：2020-06-25
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO
摘要： According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.
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