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公开(公告)号：US20230066704A1
公开(公告)日：2023-03-02
申请号：US17681396
申请日：2022-02-25
发明人： Hiroya KANO , Hiroshi OHNO
IPC分类号： G01N21/88
摘要： According to the embodiment, an optical inspection method includes: emitting, acquiring, and comparing. The emitting includes emitting light beams having a first wavelength and a second wavelength toward an imaging unit in accordance with light beam directions from a subject, with light beam intensities of the first wavelength and the second wavelength being in a complementary relationship. The acquiring includes acquiring each of information of a first image related to the first wavelength and information of a second image related to the second wavelength with the imaging unit. The comparing includes comparing the information of the first image and the information of the second image to extract unevenness information of the subject.
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公开(公告)号：US20230077793A1
公开(公告)日：2023-03-16
申请号：US17652493
申请日：2022-02-25
发明人： Hiroshi OHNO , Hiroya KANO , Takahiro KAMIKAWA , Hideaki OKANO , Akifumi Ohno , Akio KAWASAKI , Toshihiro KIKKAWA
摘要： According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.
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3.发明公开公开(公告)号：US20240319111A1
公开(公告)日：2024-09-26
申请号：US18493995
申请日：2023-10-25
发明人： Hiroshi OHNO , Hideaki OKANO , Kenta TAKANASHI , Takahiro KAMIKAWA , Hiroya KANO
IPC分类号： G01N21/956 , G01N21/88
CPC分类号： G01N21/95607 , G01N21/8806 , G01N21/8851 , G01N2021/8825
摘要： According to one embodiment, an optical inspection method includes projecting first pattern light in a first basic modulation mode that periodically changes in bright and dark, onto an object, acquiring a first image by capturing an image of the object onto which the first pattern light has been projected, projecting second pattern light in a first inverted modulation mode in which bright and dark are inverted with respect to the first basic modulation mode, onto the object, acquiring a second image by capturing an image of the object onto which the second pattern light has been projected, and generating a singular light-scattered image in which a singular region including uniquely-scattered light that is extracted based at least on the first image and the second image is intensified.
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公开(公告)号：US20230120069A1
公开(公告)日：2023-04-20
申请号：US17688940
申请日：2022-03-08
发明人： Kiminori TOYA , Hiroshi OHNO
IPC分类号： G06T7/70
摘要： According to one embodiment, a processing device includes an acquisition part, and a processor. The acquisition part and the processor are configured to perform a first operation. The acquisition part is configured to acquire first image data, second image data, and third image data in the first operation. The first image data includes data related to a first object member image of an object member transmitting a first light. The second image data includes data related to a second object member image of the object member transmitting a second light. The third image data includes data related to a third object member image of the object member transmitting a third light. The processor is configured to derive first derived data based on the first, second, and third image data in the first operation.
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公开(公告)号：US20230070461A1
公开(公告)日：2023-03-09
申请号：US17653366
申请日：2022-03-03
发明人： Rei HASHIMOTO , Hiroshi OHNO , Shinji SAITO , Tsutomu KAKUNO , Kei KANEKO
摘要： A surface-emitting semiconductor light-emitting device includes a semiconductor substrate; a first semiconductor layer on a front surface of the semiconductor substrate, an active layer on the first semiconductor layer; a photonic crystal layer on the active layer, a second semiconductor layer on the photonic crystal layer, a first electrode on the second semiconductor layer; and a second electrode on a back surface of the semiconductor substrate. The photonic crystal layer includes a plurality of protrusions arranged along an upper surface of the active layer. The second electrode includes a planar contact portion contacting the back surface of the semiconductor substrate, and at least one fine wire contact portion extending into a surface-emitting region in the back surface of the semiconductor substrate. The light radiated from the active layer is externally emitted from the surface-emitting region. The fine wire contact portion is arranged in the surface-emitting region with rotationally asymmetric.
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公开(公告)号：US20210041372A1
公开(公告)日：2021-02-11
申请号：US17079668
申请日：2020-10-26
发明人： Takahiro KAMIKAWA , Hiroshi OHNO , Takehiro HATO
摘要： An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
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公开(公告)号：US20190084226A1
公开(公告)日：2019-03-21
申请号：US16132683
申请日：2018-09-17
申请人： Technology Research Association for Future Additive Manufacturing , Kabushiki Kaisha Toshiba , Toshiba Kikai Kabushiki Kaisha
发明人： Hiroshi OHNO , Satoshi TSUNO , Mitsuo SASAKI , Tomohiko YAMADA , Yasutomo SHIOMI , Shimpei FUJIMAKI
IPC分类号： B29C64/209 , B29C64/153 , B29C64/371
摘要： A nozzle according to one embodiment includes a nozzle unit and a guide surface. A first passage, a second passage, and the guide surface are provided to the nozzle unit. The first passage has a first open end. The second passage has a second open end, and a section that is positioned upstream of the second open end and that extends in a second direction. The guide surface has an edge in a first direction. The guide surface is exposed on the outer side at the edge, is along a third direction at the edge, the third direction being a direction becoming more distanced from an axis than the second direction does, as the third direction is extended further toward the first direction. A flow of fluid ejected from the second open end follows the guide surface, and becomes separated from the nozzle unit at the edge.
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公开(公告)号：US20240094115A1
公开(公告)日：2024-03-21
申请号：US18174367
申请日：2023-02-24
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO
CPC分类号： G01N21/31 , G06T5/003 , G06T5/10 , G06T5/20 , G06T7/0008 , G06T2207/10152 , G06T2207/20048
摘要： According to an embodiment, a non-transitory storage medium stores an optical inspection program. The optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.
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公开(公告)号：US20230314335A1
公开(公告)日：2023-10-05
申请号：US17823780
申请日：2022-08-31
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO
CPC分类号： G01N21/8851 , G01N21/01 , G01N21/41 , G01N21/8806 , G01N2021/8845
摘要： According to an embodiment, an optical inspection method includes calculating irradiation field information concerning an irradiation field on a surface of a subject when irradiating the surface of the subject with a light beam from an illumination device that is supported by a movable body and moved; and performing path calculation processing of calculating, based on the irradiation field information, a path for the illumination device to move.
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公开(公告)号：US20230304929A1
公开(公告)日：2023-09-28
申请号：US17823957
申请日：2022-09-01
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO , Takahiro KAMIKAWA
CPC分类号： G01N21/4738 , G01N21/27 , G01N21/255
摘要： According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.
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