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公开(公告)号：US20230304929A1
公开(公告)日：2023-09-28
申请号：US17823957
申请日：2022-09-01
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO , Takahiro KAMIKAWA
CPC分类号： G01N21/4738 , G01N21/27 , G01N21/255
摘要： According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.
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2.发明公开公开(公告)号：US20240319078A1
公开(公告)日：2024-09-26
申请号：US18464425
申请日：2023-09-11
发明人： Hiroshi OHNO , Hiroya KANO , Takahiro KAMIKAWA , Hideaki OKANO , Sayuri SUZUKI , Chisa HIRAKAWA , Akifumi OHNO , Yoshiaki TAKAGI
IPC分类号： G01N21/25
CPC分类号： G01N21/255 , G01N2021/1776 , G01N2021/3155 , G01N2021/4711
摘要： According to an embodiment, an optical inspection method includes: causing a wavelength selection portion to selectively pass light components including at least two different wavelength spectra from an object point and causing an imaging portion including at least two color channels configured to receive the light components of the wavelength spectra to capture the object point; defining the light components of the at least two different wavelength spectra as signal vectors having different directions based on light reception data in the at least two color channels for the object point; and estimating spread of a direction distribution of light at the object point based on the directions of the signal vectors.
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公开(公告)号：US20210080543A1
公开(公告)日：2021-03-18
申请号：US16804259
申请日：2020-02-28
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO , Takahiro KAMIKAWA
摘要： According to one embodiment, an optical imaging apparatus includes a polarizer assembly, a polarization image sensor, and a lens assembly. The polarizer assembly is configured to acquire a first light ray of a first polarization component and a second light ray of a second polarization component which is different from the first polarization component, by using a light flux from an identical direction. The polarization image sensor is located in a position facing the polarizer assembly. The polarization image sensor is configured to acquire an image of the first polarization component and an image of the second polarization component at once or at the same time. The lens assembly includes a first lens configured to form the images on the polarization image sensor.
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公开(公告)号：US20200088933A1
公开(公告)日：2020-03-19
申请号：US16288301
申请日：2019-02-28
发明人： Hiroshi OHNO , Takahiro KAMIKAWA , Takehiro HATO , Hiroya KANO
IPC分类号： F21V8/00
摘要： According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.
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5.发明公开公开(公告)号：US20240319111A1
公开(公告)日：2024-09-26
申请号：US18493995
申请日：2023-10-25
发明人： Hiroshi OHNO , Hideaki OKANO , Kenta TAKANASHI , Takahiro KAMIKAWA , Hiroya KANO
IPC分类号： G01N21/956 , G01N21/88
CPC分类号： G01N21/95607 , G01N21/8806 , G01N21/8851 , G01N2021/8825
摘要： According to one embodiment, an optical inspection method includes projecting first pattern light in a first basic modulation mode that periodically changes in bright and dark, onto an object, acquiring a first image by capturing an image of the object onto which the first pattern light has been projected, projecting second pattern light in a first inverted modulation mode in which bright and dark are inverted with respect to the first basic modulation mode, onto the object, acquiring a second image by capturing an image of the object onto which the second pattern light has been projected, and generating a singular light-scattered image in which a singular region including uniquely-scattered light that is extracted based at least on the first image and the second image is intensified.
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公开(公告)号：US20210041372A1
公开(公告)日：2021-02-11
申请号：US17079668
申请日：2020-10-26
发明人： Takahiro KAMIKAWA , Hiroshi OHNO , Takehiro HATO
摘要： An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
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公开(公告)号：US20230077793A1
公开(公告)日：2023-03-16
申请号：US17652493
申请日：2022-02-25
发明人： Hiroshi OHNO , Hiroya KANO , Takahiro KAMIKAWA , Hideaki OKANO , Akifumi Ohno , Akio KAWASAKI , Toshihiro KIKKAWA
摘要： According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.
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公开(公告)号：US20210131961A1
公开(公告)日：2021-05-06
申请号：US17006933
申请日：2020-08-31
发明人： Hiroshi OHNO , Hiroya KANO , Hideaki OKANO , Takahiro KAMIKAWA
摘要： According to one embodiment, an optical inspection apparatus includes a first illuminator, an image-forming optical system, a scattering light selector, and an imaging element. The first illuminator is configured to emit a first light beam. The first light beam reflected by an object is incident on the image-forming optical system. The scattering light selector is configured to emit passing light beams of at least two mutually different wavelength regions, at the same time as the first light beam passes, a wavelength spectrum of at least one of the passing light beams being different from a wavelength spectrum of the reflected first light beam. The passing light beams simultaneously form an image on the imaging element.
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公开(公告)号：US20190219515A1
公开(公告)日：2019-07-18
申请号：US16120551
申请日：2018-09-04
发明人： Takahiro KAMIKAWA , Hiroshi Ohno , Takehiro Hato
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N2201/0636
摘要： An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
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