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    Semiconductor hybrid component
    1.
    发明授权
    Semiconductor hybrid component 失效
    半导体混合元件

    公开(公告)号：US5726500A

    公开(公告)日：1998-03-10

    申请号：US549812

    申请日：1995-12-07

    Applicant: Jean-Yves Duboz ,  Emmanuel Rosencher ,  Philippe Bois

    Inventor： Jean-Yves Duboz ,  Emmanuel Rosencher ,  Philippe Bois

    IPC: H01L27/146 ,  H01L23/48 ,  H01L23/50 ,  H01L29/44

    CPC classification number: H01L27/1465 ,  H01L2224/48091 ,  H01L2224/48463 ,  H01L2924/10253

    Abstract: Semiconductor hybrid components, especially linear infrared detectors produced by hybridization. A main substrate has integrated thereon active elements which cannot be produced on a silicon substrate. The substrate is made, for example, of AsGa, InP, HgCdTe or PbTe. Several silicon chips are mounted on the main substrate, by hybridization using indium balls. These chips include the read and multiplexing circuits. The silicon chips remain of limited size (a few millimeters) so that the differential thermal expansion stresses are limited, but the detection array may be produced as one piece without butt-joining. It is therefore possible to produce arrays of great length (several centimeters) and of high resolution (at least a thousand points).

    Abstract translation: PCT No.PCT / FR95 / 00448第 371 1995年12月7日第 102（e）日期1995年12月7日PCT提交1995年4月7日PCT公布。 公开号WO95 / 28006 日期1995年10月19日半导体混合元件，特别是通过杂交产生的线性红外探测器。 主衬底上集成有不能在硅衬底上产生的有源元件。 衬底例如由AsGa，InP，HgCdTe或PbTe制成。 通过使用铟球杂交，将几个硅芯片安装在主基板上。 这些芯片包括读和多路复用电路。 硅芯片保持有限的尺寸（几毫米），使得差分热膨胀应力受到限制，但是检测阵列可以制成一体而不具有对接。 因此，可以生产长度（几厘米）和高分辨率（至少一千点）的阵列。

    Integrated direction finder
    2.
    发明授权
    Integrated direction finder 失效
    集成式取向器

    公开(公告)号：US5719670A

    公开(公告)日：1998-02-17

    申请号：US555323

    申请日：1995-11-08

    Applicant: Jean-Yves Duboz ,  Philippe Bois

    Inventor： Jean-Yves Duboz ,  Philippe Bois

    IPC: G01S3/784 ,  G01B11/26

    CPC classification number: G01S3/784

    Abstract: Disclosed is an integrated direction finder that can be used to determine the direction of a light beam and, in particular, a laser beam. This direction finder has a substrate transparent to the light beam and means on the rear face to channel a part of the light flux received on this face to the front face which has several photodetector elements. Application to optical measurements.

    Abstract translation: 公开了一种可用于确定光束的方向，特别是激光束的集成测向器。 该测向器具有对光束透明的基板和背面上的装置，以将接收在该表面上的光通量的一部分引导到具有若干光电检测器元件的正面。 应用于光学测量。

    Large photodetector array
    3.
    发明授权
    Large photodetector array 失效
    大型光电探测器阵列

    公开(公告)号：US5712499A

    公开(公告)日：1998-01-27

    申请号：US555079

    申请日：1995-11-08

    Applicant: Jean-Yves Duboz ,  Philippe Bois

    Inventor： Jean-Yves Duboz ,  Philippe Bois

    IPC: H01L27/146 ,  H01L31/062 ,  H01L31/113 ,  H01L31/00

    CPC classification number: H01L27/14643

    Abstract: A photodetector arrangement capable of detecting high-power-light flux and including a set of elementary photodetectors each one of which is individually tested to determine that it has no defects. Each of the photodetectors which is found to be free of objectionable defects is connected in parallel to a common conducting line to thus produce a combined output when radiation impinges on the detector surface. The connection can be hard wired or provided through a set of transistors acting as connection control intermediaries between the good photodetectors and the common conducting line. The active areas of only good photodetectors are thus combined to form a large photodetector area of any desired shape or size without the usual reliability problems. The selective control of the transistors can further be provided by auxiliary control photodetectors to additionally automatically control the size of the active area in response to the area of light being detected or a control light beam.

    Abstract translation: 一种能够检测高功率光通量并且包括一组基本光电检测器的光电检测器装置，其中每一个被单独测试以确定其没有缺陷。 发现没有令人反感的缺陷的每个光电检测器与公共导线并联连接，从而当辐射照射在检测器表面上时产生组合的输出。 连接可以通过一组晶体管进行硬连线或提供，这些晶体管充当良好光电检测器和公共导线之间的连接控制中介。 因此，只有良好的光电检测器的有效区域被组合以形成任何期望的形状或尺寸的大的光电检测器区域，而没有通常的可靠性问题。 晶体管的选择性控制可以由辅助控制光电探测器进一步提供，以响应于正被检测的光的面积或控制光束另外自动控制有效面积的大小。

    Quantum-well electronic bolometer and application to a radiation detector
    6.
    发明授权
    Quantum-well electronic bolometer and application to a radiation detector 失效
    QUANTUM-WELL ELECTRONIC BOLOMETER和应用于辐射探测器

    公开(公告)号：US5228777A

    公开(公告)日：1993-07-20

    申请号：US788354

    申请日：1991-11-06

    Applicant: Emmanuel Rosencher ,  Philippe Bois

    Inventor： Emmanuel Rosencher ,  Philippe Bois

    IPC: H01L31/0352

    CPC classification number: G01J5/20 ,  B82Y20/00 ,  H01L31/0352 ,  H01L31/035236

    Abstract: An electronic bolometer comprises at least a quantum well between two barrier layers. It has an input side parallel to the quantum-well layer and receiving a beam at a quasi-normal incidence angle. Two electrodes disposed perpendicularly to the quantum-well layers allow to measure a change in the resistivity of said quantum well.

    Abstract translation: 电子测辐射热谱计包括两个阻挡层之间的至少一个量子阱。 它具有与量子阱层平行的输入侧，并且以准正入射角接收光束。 垂直于量子阱层设置的两个电极允许测量所述量子阱的电阻率的变化。

    Electromagnetic wave detector
    8.
    发明授权
    Electromagnetic wave detector 失效
    电磁波探测器

    公开(公告)号：US5326984A

    公开(公告)日：1994-07-05

    申请号：US906659

    申请日：1992-06-30

    Applicant: Emmanuel Rosencher ,  Philippe Bois

    Inventor： Emmanuel Rosencher ,  Philippe Bois

    IPC: H01L31/0352 ,  H01L29/205 ,  H01L29/56 ,  H01L31/06

    CPC classification number: B82Y20/00 ,  H01L31/035236

    Abstract: An electromagnetic wave detector comprises a stack of quantum wells included between an ohmic contact and a rectifier junction which may be a barrier (Al.sub.y Ga.sub.1-y As) with a forbidden band width that is greater than that of the barriers of the quantum wells.

    Abstract translation: 电磁波检测器包括包括在欧姆接触和整流器结之间的量子阱堆，其可以是阻挡带（AlyGa1-yAs），其禁带宽度大于量子阱的阻挡带宽。

    Bi-functional optical detector including four optical detectors used to detect combination of two wavelengths
    9.
    发明授权
    Bi-functional optical detector including four optical detectors used to detect combination of two wavelengths 有权
    双功能光学检测器，包括用于检测两个波长的组合的四个光学检测器

    公开(公告)号：US06627868B2

    公开(公告)日：2003-09-30

    申请号：US09852211

    申请日：2001-05-10

    Applicant: Philippe Bois ,  Eric Costard ,  Marcel-Francis Audier ,  Eric Herniou

    Inventor： Philippe Bois ,  Eric Costard ,  Marcel-Francis Audier ,  Eric Herniou

    IPC: H01L2714

    CPC classification number: B82Y20/00 ,  H01L27/14649

    Abstract: A bi-functional optical detector including a first active photoconduction detection element configured to detect light within first and second wavelength ranges, a first diffraction grating associated with the first detection element and configured to couple the light within the first wavelength range so that the first active photoconducting detection element detects the light in the first wavelength range, a second active photoconduction detection element configured to detect light within the first and second wavelength ranges, and a second diffraction grating associated with the second detection element and configured to couple the light within the second wavelength range so that the second active photoconduction detection element detects the light in the second wavelength range. Also included is a third active photoconduction detection element associated with the first detection element and configured to detect the light within the first and second wavelength ranges, a fourth active photoconduction detection element associated with the second detection element and configured to detect the light within the first and second wavelength ranges, and a common contact layer separating the first and second detection elements from the third and fourth detection elements.

    Abstract translation: 一种双功能光学检测器，包括被配置为检测第一和第二波长范围内的光的第一有源光电导检测元件，与第一检测元件相关联并被配置为将光耦合在第一波长范围内的第一衍射光栅， 光电导检测元件检测第一波长范围内的光，配置成检测第一和第二波长范围内的光的第二有源光电导检测元件，以及与第二检测元件相关联的第二衍射光栅， 使得第二有源光电导检测元件检测第二波长范围内的光。 还包括与第一检测元件相关联并被配置为检测第一和第二波长范围内的光的第三有源光电导检测元件，与第二检测元件相关联并被配置为检测第一和第二波长范围内的光的第四有源光电导检测元件， 和第二波长范围，以及将第一和第二检测元件与第三和第四检测元件分开的公共接触层。

    Bispectral electromagnetic wave detector
    10.
    发明授权
    Bispectral electromagnetic wave detector 失效
    双频电磁波探测器

    公开(公告)号：US6157020A

    公开(公告)日：2000-12-05

    申请号：US984950

    申请日：1997-12-04

    Applicant: Pascal Krapf ,  Eric Costard ,  Philippe Bois

    Inventor： Pascal Krapf ,  Eric Costard ,  Philippe Bois

    IPC: H01L31/0248 ,  H01L25/04 ,  H01L27/146 ,  H01J40/14

    CPC classification number: H01L25/043 ,  H01L27/1465 ,  H01L2924/0002

    Abstract: The disclosure relates to a bispectral electromagnetic wave detector including at least one first and one second overlaid plane active detector elements separated by a common layer, said first and second detector elements being sensitive to the different wavelengths; a first means of connection connected in common to said first and second detector elements, a second means of connection connected to said first detector element, and a third means of connection connected to said second detector element; means for applying successively a control voltage to each means of connection; and means connected to said first means of connection to detect a photoconduction current each time a control voltage is applied. The invention is used in applications requiring detection of electromagnetic waves in two bands of different wavelengths.

    Abstract translation: 本发明涉及一种双谱电磁波检测器，包括由公共层分离的至少一个第一和第二叠层有源检测器元件，所述第一和第二检测器元件对不同波长敏感; 连接到所述第一和第二检测器元件的第一连接装置，连接到所述第一检测器元件的第二连接装置和连接到所述第二检测器元件的第三连接装置; 用于连续地对每个连接装置施加控制电压的装置; 以及连接到所述第一连接装置的装置，以在每次施加控制电压时检测光电导电流。 本发明用于需要检测不同波长的两个波段中的电磁波的应用中。

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