公开(公告)号：US20190295951A1

公开(公告)日：2019-09-26

申请号：US15934343

申请日：2018-03-23

Applicant: Intel Corporation

Inventor： Kristof DARMAWIKARTA ,  Hiroki TANAKA ,  Robert MAY ,  Sameer PAITAL ,  Bai NIE ,  Jesse JONES ,  Chung Kwang Christopher TAN

IPC: H01L23/538 ,  H01L23/522 ,  H01L23/00

Abstract: Embodiments include an electronic package with an embedded multi-interconnect bridge (EMIB) and methods of making such packages. Embodiments include a first layer, that is an organic material and a second layer disposed over the first layer. In an embodiment, a cavity is formed through the second layer to expose a first surface of the first layer. A bridge substrate is in the cavity and is supported by the first surface of the first layer. Embodiments include a first die over the second layer that is electrically coupled to a first contact on the bridge substrate, and a second die over the second layer that is electrically coupled to a second contact on the bridge substrate. In an embodiment the first die is electrically coupled to the second die by the bridge substrate.

公开(公告)号：US20240178145A1

公开(公告)日：2024-05-30

申请号：US18434347

申请日：2024-02-06

Applicant: Intel Corporation

Inventor： Kristof DARMAWIKARTA ,  Hiroki TANAKA ,  Robert MAY ,  Sameer PAITAL ,  Bai NIE ,  Jesse JONES ,  Chung Kwang Christopher TAN

IPC: H01L23/538 ,  H01L23/00 ,  H01L23/522

CPC classification number: H01L23/538 ,  H01L23/5226 ,  H01L23/5381 ,  H01L23/5385 ,  H01L24/82 ,  H01L2224/12105

Abstract: Embodiments include an electronic package with an embedded multi-interconnect bridge (EMIB) and methods of making such packages. Embodiments include a first layer, that is an organic material and a second layer disposed over the first layer. In an embodiment, a cavity is formed through the second layer to expose a first surface of the first layer. A bridge substrate is in the cavity and is supported by the first surface of the first layer. Embodiments include a first die over the second layer that is electrically coupled to a first contact on the bridge substrate, and a second die over the second layer that is electrically coupled to a second contact on the bridge substrate. In an embodiment the first die is electrically coupled to the second die by the bridge substrate.

公开(公告)号：US20220155539A1

公开(公告)日：2022-05-19

申请号：US16953146

申请日：2020-11-19

Applicant: Intel Corporation

Inventor： Srinivas V. PIETAMBARAM ,  Brandon C. MARIN ,  Sameer PAITAL ,  Sai VADLAMANI ,  Rahul N. MANEPALLI ,  Xiaoqian LI ,  Suresh V. POTHUKUCHI ,  Sujit SHARAN ,  Arnab SARKAR ,  Omkar KARHADE ,  Nitin DESHPANDE ,  Divya PRATAP ,  Jeremy ECTON ,  Debendra MALLIK ,  Ravindranath V. MAHAJAN ,  Zhichao ZHANG ,  Kemal AYGÜN ,  Bai NIE ,  Kristof DARMAWIKARTA ,  James E. JAUSSI ,  Jason M. GAMBA ,  Bryan K. CASPER ,  Gang DUAN ,  Rajesh INTI ,  Mozhgan MANSURI ,  Susheel JADHAV ,  Kenneth BROWN ,  Ankar AGRAWAL ,  Priyanka DOBRIYAL

IPC: G02B6/42

Abstract: Embodiments disclosed herein include optical packages. In an embodiment, an optical package comprises a package substrate, and a photonics die coupled to the package substrate. In an embodiment, a compute die is coupled to the package substrate, where the photonics die is communicatively coupled to the compute die by a bridge in the package substrate. In an embodiment, the optical package further comprises an optical waveguide embedded in the package substrate. In an embodiment, a first end of the optical waveguide is below the photonics die, and a second end of the optical waveguide is substantially coplanar with an edge of the package substrate.

公开(公告)号：US20220223527A1

公开(公告)日：2022-07-14

申请号：US17712944

申请日：2022-04-04

Applicant: Intel Corporation

Inventor： Kristof DARMAWIKARTA ,  Hiroki TANAKA ,  Robert MAY ,  Sameer PAITAL ,  Bai NIE ,  Jesse JONES ,  Chung Kwang Christopher TAN

IPC: H01L23/538 ,  H01L23/00 ,  H01L23/522

Abstract: Embodiments include an electronic package with an embedded multi-interconnect bridge (EMIB) and methods of making such packages. Embodiments include a first layer, that is an organic material and a second layer disposed over the first layer. In an embodiment, a cavity is formed through the second layer to expose a first surface of the first layer. A bridge substrate is in the cavity and is supported by the first surface of the first layer. Embodiments include a first die over the second layer that is electrically coupled to a first contact on the bridge substrate, and a second die over the second layer that is electrically coupled to a second contact on the bridge substrate. In an embodiment the first die is electrically coupled to the second die by the bridge substrate.

公开(公告)号：US20200343049A1

公开(公告)日：2020-10-29

申请号：US16392028

申请日：2019-04-23

Applicant: Intel Corporation

Inventor： Sameer PAITAL ,  Gang DUAN ,  Srinivas PIETAMBARAM ,  Kristof DARMAWIKARTA

IPC: H01G4/33 ,  H01L23/498 ,  H01L23/538 ,  H01G4/30 ,  H01G4/38 ,  H01G4/224 ,  H01L23/00

Abstract: Embodiments disclosed herein include an electronic package and methods of forming an electronic package. In an embodiment, the electronic package comprises a package substrate, an organic layer over the package substrate, and a capacitor embedded in the organic layer. In an embodiment, the capacitor comprises, a first electrode, where the first electrode comprises a seam between a first conductive layer and a second conductive layer, a dielectric layer over the first electrode, and a second electrode over the dielectric layer.

公开(公告)号：US20200005990A1

公开(公告)日：2020-01-02

申请号：US16024721

申请日：2018-06-29

Applicant: Intel Corporation

Inventor： Sameer PAITAL ,  Srinivas PIETAMBARAM ,  Yonggang LI ,  Bai NIE ,  Kristof DARMAWIKARTA ,  Gang DUAN

IPC: H01F27/28 ,  H01F27/24 ,  H01L21/48 ,  H01L25/16 ,  H01L23/498 ,  H01F41/04 ,  H01L49/02

Abstract: Embodiments herein relate to systems, apparatuses, or processes for embedding a magnetic core or a magnetic inductor in a substrate layer by applying a copper layer to a portion of the substrate layer, creating a structure in the substrate layer on top of at least part of the copper layer to identify a defined region within the substrate layer, and inserting a magnetic paste into the defined region where the copper layer identifies a side of the defined region and where the structure is to contain the magnetic paste within the defined region while the magnetic paste cures.

公开(公告)号：US20240243066A1

公开(公告)日：2024-07-18

申请号：US18622511

申请日：2024-03-29

Applicant: Intel Corporation

Inventor： Kristof DARMAWIKARTA ,  Hiroki TANAKA ,  Robert MAY ,  Sameer PAITAL ,  Bai NIE ,  Jesse JONES ,  Chung Kwang Christopher TAN

IPC: H01L23/538 ,  H01L23/00 ,  H01L23/522

CPC classification number: H01L23/538 ,  H01L23/5226 ,  H01L23/5381 ,  H01L23/5385 ,  H01L24/82 ,  H01L2224/12105

Abstract: Embodiments include an electronic package with an embedded multi-interconnect bridge (EMIB) and methods of making such packages. Embodiments include a first layer, that is an organic material and a second layer disposed over the first layer. In an embodiment, a cavity is formed through the second layer to expose a first surface of the first layer. A bridge substrate is in the cavity and is supported by the first surface of the first layer. Embodiments include a first die over the second layer that is electrically coupled to a first contact on the bridge substrate, and a second die over the second layer that is electrically coupled to a second contact on the bridge substrate. In an embodiment the first die is electrically coupled to the second die by the bridge substrate.

公开(公告)号：US20230420357A1

公开(公告)日：2023-12-28

申请号：US17848624

申请日：2022-06-24

Applicant: Intel Corporation

Inventor： Brandon C. MARIN ,  Suddhasattwa NAD ,  Srinivas V. PIETAMBARAM ,  Gang DUAN ,  Jeremy D. ECTON ,  Kristof DARMAWIKARTA ,  Sameer PAITAL

IPC: H01L23/498 ,  H01L21/02 ,  H01L21/48

CPC classification number: H01L23/49894 ,  H01L23/49811 ,  H01L23/49822 ,  H01L23/49838 ,  H01L21/0217 ,  H01L21/486 ,  H01L24/16

Abstract: Embodiments herein relate to systems, apparatuses, or processes directed to forming an LGA pad on a side of a substrate, with a layer of silicon nitride between the LGA pad and a dielectric layer of the substrate. The LGA pad may have a reduced footprint, or a reduced lateral dimension with respect to a plane of the substrate, as compared to legacy LGA pads to reduce insertion loss by reducing the resulting capacitance between the reduced LGA footprint and metal routings within the substrate. The layer of silicon nitride may provide additional mechanical support for the reduced footprint. Other embodiments may be described and/or claimed.

公开(公告)号：US20200312771A1

公开(公告)日：2020-10-01

申请号：US16366661

申请日：2019-03-27

Applicant: Intel Corporation

Inventor： Bai NIE ,  Gang DUAN ,  Srinivas PIETAMBARAM ,  Jesse JONES ,  Yosuke KANAOKA ,  Hongxia FENG ,  Dingying XU ,  Rahul MANEPALLI ,  Sameer PAITAL ,  Kristof DARMAWIKARTA ,  Yonggang LI ,  Meizi JIAO ,  Chong ZHANG ,  Matthew TINGEY ,  Jung Kyu HAN ,  Haobo CHEN

IPC: H01L23/538 ,  H01L23/31 ,  H01L23/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/78

Abstract: A die assembly is disclosed. The die assembly includes a die, one or more die pads on a first surface of the die and a die attach film on the die where the die attach film includes one or more openings that expose the one or more die pads and that extend to one or more edges of the die.

公开(公告)号：US20200083164A1

公开(公告)日：2020-03-12

申请号：US16129711

申请日：2018-09-12

Applicant: Intel Corporation

Inventor： Brandon C. MARIN ,  Frank TRUONG ,  Shivasubramanian BALASUBRAMANIAN ,  Dilan SENEVIRATNE ,  Yonggang LI ,  Sameer PAITAL ,  Darko GRUJICIC ,  Rengarajan SHANMUGAM ,  Melissa WETTE ,  Srinivas PIETAMBARAM

IPC: H01L23/522 ,  H01L49/02 ,  H01L27/01 ,  H01L21/768 ,  H01L23/00

Abstract: Embodiments include package substrates and a method of forming the package substrates. A package substrate includes a dielectric having a cavity that has a footprint, a resistor embedded in the cavity of the dielectric, and a plurality of traces on the resistor, where a plurality of surfaces of the resistor are activated surfaces. The resistor may also have a plurality of sidewalls which may be activated sidewalls and tapered. The dielectric may include metallization particles/ions. The resistor may include resistive materials, such as nickel-phosphorus (NiP), aluminum-nitride (AlN), and/or titanium-nitride (TiN). The package substrate may further include a first resistor embedded adjacently to the resistor. The first resistor may have a first footprint of a first cavity that is different than the footprint of the cavity of the resistor. The resistor may have a resistance value that is thus different than a first resistance value of the first resistor.