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公开(公告)号：US10939600B2
公开(公告)日：2021-03-02
申请号：US16202241
申请日：2018-11-28
发明人： Jiayu Zheng , WeiFeng Zhang , Lin Zhao , XiYuan Yin , Tao Song , James Bielick
IPC分类号： B23K1/00 , H05K13/08 , H05K13/00 , H05K3/34 , H05K3/00 , H04N5/33 , B23K1/20 , G06T7/00 , B23K35/362 , B23K101/42
摘要： A system for flux residue detection is provided. The system includes a flux heater, where the flux heater controls a temperature of a flux spray applied to a printed circuit board, and an infrared camera, wherein the infrared camera provides a thermal image of the flux on the printed circuit board. A method, a computer system, and a computer program product for flux residue detection is provided, including setting flux application parameters, applying flux to a printed circuit board, and capturing an infrared image of the flux applied to the printed circuit board. A method, a computer system, and a computer program product for flux residue detection is provided, including setting flux application parameters, applying flux to a printed circuit board, capturing an infrared image of the flux applied to the printed circuit board, and determining there is excess flux residue on the printed circuit board.
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公开(公告)号：US20200170155A1
公开(公告)日：2020-05-28
申请号：US16202241
申请日：2018-11-28
发明人： Jiayu Zheng , WeiFeng Zhang , Lin Zhao , XiYuan Yin , Tao Song , James Bielick
摘要： A system for flux residue detection is provided. The system includes a flux heater, where the flux heater controls a temperature of a flux spray applied to a printed circuit board, and an infrared camera, wherein the infrared camera provides a thermal image of the flux on the printed circuit board. A method, a computer system, and a computer program product for flux residue detection is provided, including setting flux application parameters, applying flux to a printed circuit board, and capturing an infrared image of the flux applied to the printed circuit board. A method, a computer system, and a computer program product for flux residue detection is provided, including setting flux application parameters, applying flux to a printed circuit board, capturing an infrared image of the flux applied to the printed circuit board, and determining there is excess flux residue on the printed circuit board.
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公开(公告)号：US10001507B2
公开(公告)日：2018-06-19
申请号：US15264963
申请日：2016-09-14
发明人： Wei Guo , Yanlong Hou , WeiFeng Zhang , Lin Zhao
CPC分类号： G01R31/2801 , G01R1/06722
摘要： A method of testing a printed circuit board (PCB) with an in-circuit test (ICT) probe having an improved probe-to-via contact is provided. The ICT probe includes a tip attached to a spindle; a housing having a cavity, a portion of the spindle insertable into the cavity; and a heating element wrapped helically around the spindle, the heating element coupled to the housing. The probe is contacted with a surface of a flux layer of a test via of the PCB, said contact compressing the heating element and recessing the insertable portion of the spindle into the cavity. The tip of the probe is heated with the heating element to a temperature capable of at least partially melting the flux layer, the tip at least partially penetrating the flux layer to contact a surface of a solder plugging the test via.
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公开(公告)号：US10061309B1
公开(公告)日：2018-08-28
申请号：US15841869
申请日：2017-12-14
发明人： WeiFeng Zhang , Guo Wei , Lin Zhao , Zhipeng Wang , Qiuyi Yu , Zhongfeng Yang , YanLong Hou
IPC分类号： G06F19/00 , G05B19/418
CPC分类号： G05B19/41885 , G05B2219/42058 , G05B2219/45026 , Y02P90/02
摘要： In an approach to creating a press-fit force analysis, one or more computer processors retrieve a force press-fit data from a press-fit machine based on a press cycle. One or more computer processors calculate a deformation force of the press cycle based on the press-fit data and storing the deformation force. One or more computer processors create a predictive control model based on the deformation force and determine if a corrective action is required based on at least one of a raw material quality data, machine setting data, a completed lot quality data or the predictive control model. One or more computer processors determine if a corrective action is required and alert a downstream process to take the corrective action. One or more computer processors schedule a material kitting.
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公开(公告)号：US20180074094A1
公开(公告)日：2018-03-15
申请号：US15264963
申请日：2016-09-14
发明人： Wei Guo , Yanlong Hou , WeiFeng Zhang , Lin Zhao
CPC分类号： G01R31/2801 , G01R1/06722
摘要： A method of testing a printed circuit board (PCB) with an in-circuit test (ICT) probe having an improved probe-to-via contact is provided. The ICT probe includes a tip attached to a spindle; a housing having a cavity, a portion of the spindle insertable into the cavity; and a heating element wrapped helically around the spindle, the heating element coupled to the housing. The probe is contacted with a surface of a flux layer of a test via of the PCB, said contact compressing the heating element and recessing the insertable portion of the spindle into the cavity. The tip of the probe is heated with the heating element to a temperature capable of at least partially melting the flux layer, the tip at least partially penetrating the flux layer to contact a surface of a solder plugging the test via.
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公开(公告)号：US20170276713A1
公开(公告)日：2017-09-28
申请号：US15077955
申请日：2016-03-23
发明人： Wei Guo , LiCen Mu , Qiuyi Yu , WeiFeng Zhang , Lin Zhao
IPC分类号： G01R31/00 , B23P19/04 , H05K3/30 , G01R19/165
CPC分类号： G01R31/001 , B23P19/04 , G01R19/165 , H01L27/0248 , H05K3/30
摘要： A first electrostatic discharge measurement is received from a first sensor. The first sensor utilizes a wireless network to send the first measurement from a first stage of the assembly line of electronic components susceptible to electrostatic discharge damage. A second electrostatic discharge measurement is received from a second sensor. The second sensor utilizes the wireless network to send the second measurement from a second stage of the assembly line. An electrostatic discharge history is updated for the first assembly stage based on the first electrostatic discharge measurement. The electrostatic discharge history is updated for the second assembly stage based on the second electrostatic discharge measurement. A potential electrostatic danger condition is determined based on the electrostatic discharge history
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公开(公告)号：US20200012987A1
公开(公告)日：2020-01-09
申请号：US16030049
申请日：2018-07-09
发明人： Paul A. Zulpa , Zhipeng Wang , Matthew S. Kelly , Feng Xue , Lin Zhao , WeiFeng Zhang , Jeffrey G. Komatsu
IPC分类号： G06Q10/06
摘要： A computer-implemented method includes assigning an auditor weight to each user of a plurality of users. A plurality of audit data is received from the plurality of users, where each audit data is associated with a respective user and includes a set of user ratings for an audit. Final ratings are generated for the audit, with a respective final rating for each item in the audit. Generating the final rating of a first item in the audit includes identifying, in the audit data, user ratings for the first item. The user ratings for the first item include a respective user rating of the first item from each user. Generating the final rating of a first item further includes calculating the final rating of the first item based on a weighted combination of the plurality of user ratings for the first item, according to the respective auditor weight of each user.
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公开(公告)号：US20190056721A1
公开(公告)日：2019-02-21
申请号：US15677051
申请日：2017-08-15
发明人： WeiFeng Zhang , Guo Wei , Lin Zhao , Zhipeng Wang , Qiuyi Yu , Zhongfeng Yang , YanLong Hou
IPC分类号： G05B19/418
摘要： In an approach to creating a press-fit force analysis, one or more computer processors retrieve a force press-fit data from a press-fit machine based on a press cycle. One or more computer processors calculate a deformation force of the press cycle based on the press-fit data and storing the deformation force. One or more computer processors create a predictive control model based on the deformation force and determine if a corrective action is required based on at least one of a raw material quality data, machine setting data, a completed lot quality data or the predictive control model. One or more computer processors determine if a corrective action is required and alert a downstream process to take the corrective action. One or more computer processors schedule a material kitting.
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公开(公告)号：US10018662B2
公开(公告)日：2018-07-10
申请号：US15077955
申请日：2016-03-23
发明人： Wei Guo , LiCen Mu , Qiuyi Yu , WeiFeng Zhang , Lin Zhao
CPC分类号： G01R31/001 , B23P19/04 , G01R19/165 , H01L27/0248 , H05K3/30
摘要： A first electrostatic discharge measurement is received from a first sensor. The first sensor utilizes a wireless network to send the first measurement from a first stage of the assembly line of electronic components susceptible to electrostatic discharge damage. A second electrostatic discharge measurement is received from a second sensor. The second sensor utilizes the wireless network to send the second measurement from a second stage of the assembly line. An electrostatic discharge history is updated for the first assembly stage based on the first electrostatic discharge measurement. The electrostatic discharge history is updated for the second assembly stage based on the second electrostatic discharge measurement. A potential electrostatic danger condition is determined based on the electrostatic discharge history.
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公开(公告)号：US20170336458A1
公开(公告)日：2017-11-23
申请号：US15674752
申请日：2017-08-11
发明人： Wei Guo , LiCen Mu , Qiuyi Yu , WeiFeng Zhang , Lin Zhao
IPC分类号： G01R31/00 , B23P19/04 , G01R19/165 , H05K3/30
CPC分类号： G01R31/001 , B23P19/04 , G01R19/165 , H01L27/0248 , H05K3/30
摘要： A first electrostatic discharge measurement is received from a first sensor. The first sensor utilizes a wireless network to send the first measurement from a first stage of the assembly line of electronic components susceptible to electrostatic discharge damage. A second electrostatic discharge measurement is received from a second sensor. The second sensor utilizes the wireless network to send the second measurement from a second stage of the assembly line. An electrostatic discharge history is updated for the first assembly stage based on the first electrostatic discharge measurement. The electrostatic discharge history is updated for the second assembly stage based on the second electrostatic discharge measurement. A potential electrostatic danger condition is determined based on the electrostatic discharge history.
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