- 专利标题: Flux residue detection
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申请号: US16202241申请日: 2018-11-28
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公开(公告)号: US10939600B2公开(公告)日: 2021-03-02
- 发明人: Jiayu Zheng , WeiFeng Zhang , Lin Zhao , XiYuan Yin , Tao Song , James Bielick
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理商 L. Jeffey Kelly
- 主分类号: B23K1/00
- IPC分类号: B23K1/00 ; H05K13/08 ; H05K13/00 ; H05K3/34 ; H05K3/00 ; H04N5/33 ; B23K1/20 ; G06T7/00 ; B23K35/362 ; B23K101/42
摘要:
A system for flux residue detection is provided. The system includes a flux heater, where the flux heater controls a temperature of a flux spray applied to a printed circuit board, and an infrared camera, wherein the infrared camera provides a thermal image of the flux on the printed circuit board. A method, a computer system, and a computer program product for flux residue detection is provided, including setting flux application parameters, applying flux to a printed circuit board, and capturing an infrared image of the flux applied to the printed circuit board. A method, a computer system, and a computer program product for flux residue detection is provided, including setting flux application parameters, applying flux to a printed circuit board, capturing an infrared image of the flux applied to the printed circuit board, and determining there is excess flux residue on the printed circuit board.
公开/授权文献
- US20200170155A1 FLUX RESIDUE DETECTION 公开/授权日:2020-05-28
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