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公开(公告)号:USD1038901S1
公开(公告)日:2024-08-13
申请号:US29822866
申请日:2022-01-12
摘要: FIG. 1 is a top isometric view of collimator for a physical vapor deposition chamber, according to one embodiment of the novel design.
FIG. 2 is a bottom isometric view thereof.
FIG. 3 is a top plan view thereof.
FIG. 4 is a bottom plan view thereof.
FIG. 5 is a front elevation view thereof.
FIG. 6 is a back elevation view thereof.
FIG. 7 is a left elevation view thereof.
FIG. 8 is a right elevation view thereof; and,
FIG. 9 is a cross-sectional view taken along line 9-9 in FIG. 3.
The dash-dash broken lines in the drawings illustrate portions of the article that form no part of the claimed design. The dot-dash broken lines are for the purpose of illustrating the indications of the cross-section and form no part of the claimed design.-
公开(公告)号:US11990319B2
公开(公告)日:2024-05-21
申请号:US17568836
申请日:2022-01-05
发明人: Yida Lin , Rui Li , Martin Lee Riker , Haitao Wang , Noufal Kappachali , Xiangjin Xie
CPC分类号: H01J37/32183 , B23K15/0006 , H01J2237/327
摘要: Methods and apparatus for processing a substrate are provided herein. For example, an RF power delivery compensation circuit comprises a first input configured to receive an RF forward power from an RF power source connected to a processing chamber and a second input configured to receive an RF delivered power from a matching network connected between the RF power source and the processing chamber. The RF power delivery compensation circuit calculates an RF forward power compensation factor based on the RF forward power and the RF delivered power for adjusting the RF forward power delivered to the processing chamber during operation.
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公开(公告)号:USD998575S1
公开(公告)日:2023-09-12
申请号:US29730633
申请日:2020-04-07
摘要: FIG. 1 is a top isometric view of collimator for a physical vapor deposition chamber, according to one embodiment of the novel design.
FIG. 2 is a bottom isometric view thereof.
FIG. 3 is a top plan view thereof.
FIG. 4 is a bottom plan view thereof.
FIG. 5 is a right elevation view thereof.
FIG. 6 is a left elevation view thereof.
FIG. 7 is a front elevation view thereof.
FIG. 8 is a rear elevation view thereof.
FIG. 9 is a cross sectional view taken along line 9-9 in FIG. 3.
FIG. 10 is a top isometric view of collimator for a physical vapor deposition chamber, according to another embodiment of the novel design.
FIG. 11 is a bottom isometric view thereof.
FIG. 12 is a top plan view thereof.
FIG. 13 is a bottom plan view thereof.
FIG. 14 is a right elevation view thereof.
FIG. 15 is a left elevation view thereof.
FIG. 16 is a front elevation view thereof.
FIG. 17 is a rear elevation view thereof; and,
FIG. 18 is a cross sectional view taken along line 18-18 in FIG. 12.
The dashed lines in FIGS. 10-18 represent unclaimed environment and form no part of the claimed design.-
公开(公告)号:US11309169B2
公开(公告)日:2022-04-19
申请号:US16910151
申请日:2020-06-24
发明人: Martin Lee Riker , Fuhong Zhang , Anthony Infante , Zheng Wang
摘要: A collimator that is biasable is provided. The ability to bias the collimator allows control of the electric field through which the sputter species pass. In some implementations of the present disclosure, a collimator that has a high effective aspect ratio while maintaining a low aspect ratio along the periphery of the collimator of the hexagonal array of the collimator is provided. In some implementations, a collimator with a steep entry edge in the hexagonal array is provided. It has been found that use of a steep entry edge in the collimator reduces deposition overhang and clogging of the cells of the hexagonal array. These various features lead to improve film uniformity and extend the life of the collimator and process kit.
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公开(公告)号:US10347474B2
公开(公告)日:2019-07-09
申请号:US15940398
申请日:2018-03-29
发明人: Martin Lee Riker , Fuhong Zhang , Anthony Infante , Zheng Wang
摘要: In some implementations described herein, a collimator that is biasable is provided. The ability to bias the collimator allows control of the electric field through which the sputter species pass. In some implementations of the present disclosure, a collimator that has a high effective aspect ratio while maintaining a low aspect ratio along the periphery of the collimator of the hexagonal array of the collimator is provided. In some implementations, a collimator with a steep entry edge in the hexagonal array is provided. It has been found that use of a steep entry edge in the collimator reduces deposition overhang and clogging of the cells of the hexagonal array. These various features lead to improve film uniformity and extend the life of the collimator and process kit.
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公开(公告)号:USD837755S1
公开(公告)日:2019-01-08
申请号:US29618506
申请日:2017-09-21
设计人: Martin Lee Riker , Fuhong Zhang , Yu Liu
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公开(公告)号:USD1026839S1
公开(公告)日:2024-05-14
申请号:US29863220
申请日:2022-12-16
摘要: FIG. 1 is a top isometric view of collimator for a physical vapor deposition (PVD) chamber showing our new design.
FIG. 2 is a bottom isometric view thereof.
FIG. 3 is a top plan view thereof.
FIG. 4 is a bottom plan view thereof.
FIG. 5 is a front elevation view thereof.
FIG. 6 is a back elevation view thereof.
FIG. 7 is a left side elevation view thereof.
FIG. 8 is a right side elevation view thereof; and,
FIG. 9 is a cross-sectional view taken along line 9-9 in FIG. 3.
The dash-dash broken lines in the drawings illustrate portions of the article that form no part of the claimed design. The dot-dash broken lines are for the purpose of illustrating the indications of the cross-section and form no part of the claimed design.-
8.
公开(公告)号:US11810770B2
公开(公告)日:2023-11-07
申请号:US17490840
申请日:2021-09-30
发明人: Xiaodong Wang , Joung Joo Lee , Fuhong Zhang , Martin Lee Riker , Keith A. Miller , William Fruchterman , Rongjun Wang , Adolph Miller Allen , Shouyin Zhang , Xianmin Tang
CPC分类号: H01J37/3458 , C23C14/345 , C23C14/351 , C23C14/54 , H01J37/3402 , H01J37/345 , H01J37/3405 , H01J37/3411 , H01J37/3441 , H01J37/3447 , H01J37/3452 , H01J37/3455
摘要: Methods and apparatus for processing substrates are disclosed. In some embodiments, a process chamber for processing a substrate includes: a body having an interior volume and a target to be sputtered, the interior volume including a central portion and a peripheral portion; a substrate support disposed in the interior volume opposite the target and having a support surface configured to support the substrate; a collimator disposed in the interior volume between the target and the substrate support; a first magnet disposed about the body proximate the collimator; a second magnet disposed about the body above the support surface and entirely below the collimator and spaced vertically below the first magnet; and a third magnet disposed about the body and spaced vertically between the first magnet and the second magnet. The first, second, and third magnets are configured to generate respective magnetic fields to redistribute ions over the substrate.
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公开(公告)号:US11492697B2
公开(公告)日:2022-11-08
申请号:US16908344
申请日:2020-06-22
发明人: Kirankumar Neelasandra Savandaiah , Keith A. Miller , Srinivasa Rao Yedla , Chandrashekar Kenchappa , Martin Lee Riker
摘要: Embodiments of process kits for use in plasma process chambers are provided herein. In some embodiments, a process kit for use in a process chamber includes an annular body having an upper portion and a lower portion extending downward and radially inward from the upper portion, wherein the annular body includes an inner surface having a first segment that extends downward, a second segment that extends radially outward from the first segment, a third segment that extends downward from the second segment, a fourth segment that extends radially outward from the third segment, a fifth segment that extends downward from the fourth segment, a sixth segment that extends radially inward from the fifth segment, a seventh segment that extends downward from the sixth segment, and an eighth segment that extends radially inward from the seventh segment.
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公开(公告)号:US20200035527A1
公开(公告)日:2020-01-30
申请号:US16592084
申请日:2019-10-03
发明人: Fuhong Zhang , Sunil Kumar Garg , Paul Kiely , Martin Lee Riker , William Fruchterman , Zheng Wang , Xiaodong Wang
IPC分类号: H01L21/67 , G05B19/418 , G05B15/02
摘要: Methods and apparatus to minimize electromagnetic interference between adjacent process chambers of a cluster tool are described. The start time of the subject recipe is controlled based on the electromagnetic process window of the subject process chamber, the electromagnetic window of the first adjacent process chamber and of an optional second adjacent process chamber. The start time of the subject process chamber is controlled to prevent temporal overlap of the electromagnetic window of the subject chamber with the electromagnetic window of an adjacent chamber.
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