SYSTEMS AND METHODS FOR SILICON CRACK DETECTION STRUCTURE

    公开(公告)号:US20240077531A1

    公开(公告)日:2024-03-07

    申请号:US18450714

    申请日:2023-08-16

    Applicant: Apple Inc.

    CPC classification number: G01R31/2884

    Abstract: Systems and methods are provided for detecting defects caused by cracks in an integrated circuit, which may arise during or after a silicon wafer is singulated into separate integrated circuits. An integrated circuit may include crack detection circuitry including a metal circuit. The metal circuit may fracture or break due to crack propagation through a portion of the integrated circuit. In the event of a crack, testing may detect the fracture of the metal circuit. The crack detection circuitry may also detect accurate operation of circuitry of the integrated circuit.

    Printed Circuit Board with Passthrough Signal Connections Between a Radio-frequency System and an Antenna Module

    公开(公告)号:US20240080967A1

    公开(公告)日:2024-03-07

    申请号:US18160831

    申请日:2023-01-27

    Applicant: Apple Inc.

    Abstract: An assembly is provided that includes a printed circuit board, a transceiver integrated circuit mounted on a first surface of the printed circuit board, and an antenna module having multiple antennas and that is mounted on a second surface of the printed circuit board. The antenna module at least partially overlaps with the transceiver integrated circuit in an overlap region. The antenna module is electrically coupled to the transceiver integrated circuit via direct passthrough signal connections that extend from the first surface to the second surface. The direct passthrough signal connections are located within the overlap region. Each of the direct passthrough signal connections can be implemented using through-board stacked via structures. The antenna module can include multiple layers of signal routing lines for distributing the signals from the direct passthrough signal connections to the various antennas on the antenna module.

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