MANUFACTURING METHOD OF MAGNETIC MEMORY DEVICE
    1.
    发明申请
    MANUFACTURING METHOD OF MAGNETIC MEMORY DEVICE 有权
    磁记忆装置的制造方法

    公开(公告)号:US20160071776A1

    公开(公告)日:2016-03-10

    申请号:US14636984

    申请日:2015-03-03

    Abstract: According to one embodiment, a manufacturing method of a magnetic memory device, includes obtaining first and second magnetic fields for each of magnetoresistive effect elements, defining a group of the elements, for the first and second magnetic fields of the elements in the group, a highest first magnetic field being lower than a lowest second magnetic field, and a difference between the highest first magnetic field and the lowest second magnetic field being greater than a predetermined difference, determining a maximum applied magnetic field higher than the highest first magnetic field and lower than the lowest second magnetic field, and obtaining magnetic characteristics for each of the elements in the group by applying a magnetic field decreasing from the maximum applied magnetic field after the magnetic field is increased up to the maximum applied magnetic field.

    Abstract translation: 根据一个实施例,一种磁存储器件的制造方法包括为每个磁阻效应元件获得用于组中元件的第一和第二磁场的一组元件的第一和第二磁场, 最高的第一磁场低于最低的第二磁场,并且最高的第一磁场和最低的第二磁场之间的差大于预定的差,确定高于最高的第一磁场的最大施加的磁场和较低的第一磁场 并且通过在磁场增加到最大施加的磁场之后施加从最大施加的磁场减小的磁场来获得组中的每个元件的磁特性。

    MAGNETIC MEMORY ELEMENT AND MAGNETIC MEMORY
    2.
    发明申请
    MAGNETIC MEMORY ELEMENT AND MAGNETIC MEMORY 有权
    磁记忆元件和磁记忆

    公开(公告)号:US20130099337A1

    公开(公告)日:2013-04-25

    申请号:US13604386

    申请日:2012-09-05

    CPC classification number: H01L27/228 H01L43/08

    Abstract: According to one embodiment, a magnetic memory element includes a memory layer, a first nonmagnetic layer, a reference layer, a second nonmagnetic layer, and an adjustment layer which are stacked. The adjustment layer is configured to reduce a leakage magnetic field from the reference layer. The adjustment layer is formed by stacking an interface layer provided on the second nonmagnetic layer, and a magnetic layer having magnetic anisotropy perpendicular to a film surface. Saturation magnetization of the interface layer is larger than that of the magnetic layer.

    Abstract translation: 根据一个实施例,磁存储元件包括堆叠的存储器层,第一非磁性层,参考层,第二非磁性层和调整层。 调整层被配置为减少来自参考层的泄漏磁场。 调整层通过层叠设置在第二非磁性层上的界面层和垂直于膜表面的具有磁各向异性的磁性层而形成。 界面层的饱和磁化强度大于磁性层的饱和磁化强度。

    Magnetoresistive element and magnetic memory
    6.
    发明授权
    Magnetoresistive element and magnetic memory 有权
    磁阻元件和磁记忆体

    公开(公告)号:US07894246B2

    公开(公告)日:2011-02-22

    申请号:US12014522

    申请日:2008-01-15

    CPC classification number: G11C11/15 H01L27/228 H01L43/08

    Abstract: A magnetoresistive element includes: a magnetization free layer having a first plane and a second plane located on the opposite side from the first plane, and having a variable magnetization direction; a magnetization pinned layer provided on the first plane side of the magnetization free layer, and having a pinned magnetization direction; a first tunnel barrier layer provided between the magnetization free layer and the magnetization pinned layer; a second tunnel barrier layer provided on the second plane of the magnetization free layer; and a non-magnetic layer provided on a plane on the opposite side of the second tunnel barrier layer from the magnetization free layer. The magnetization direction of the magnetization free layer is variable by applying current between the magnetization pinned layer and the non-magnetic layer, and a resistance ratio between the first tunnel barrier layer and the second tunnel barrier layer is in a range of 1:0.25 to 1:4.

    Abstract translation: 磁阻元件包括:无磁化层,其具有第一平面和位于与第一平面相反的一侧的第二平面,并且具有可变的磁化方向; 磁化固定层,设置在所述磁化自由层的所述第一平面侧上,并且具有钉扎磁化方向; 设置在所述磁化自由层和所述磁化固定层之间的第一隧道势垒层; 设置在无磁化层的第二平面上的第二隧道势垒层; 以及设置在与磁化自由层相反的第二隧道势垒层的相对侧上的平面上的非磁性层。 磁化自由层的磁化方向通过在磁化被钉扎层和非磁性层之间施加电流而变化,并且第一隧道势垒层和第二隧道势垒层之间的电阻比在1:0.25至 1:4。

    MAGNETORESISTIVE ELEMENT AND MAGNETIC MEMORY
    7.
    发明申请
    MAGNETORESISTIVE ELEMENT AND MAGNETIC MEMORY 有权
    磁性元件和磁记忆

    公开(公告)号:US20100315864A1

    公开(公告)日:2010-12-16

    申请号:US12851275

    申请日:2010-08-05

    CPC classification number: G11C11/15 H01L27/228 H01L43/08

    Abstract: A magnetoresistive element includes: a magnetization free layer having a first plane and a second plane located on the opposite side from the first plane, and having a variable magnetization direction; a magnetization pinned layer provided on the first plane side of the magnetization free layer, and having a pinned magnetization direction; a first tunnel barrier layer provided between the magnetization free layer and the magnetization pinned layer; a second tunnel barrier layer provided on the second plane of the magnetization free layer; and a non-magnetic layer provided on a plane on the opposite side of the second tunnel barrier layer from the magnetization free layer. The magnetization direction of the magnetization free layer is variable by applying current between the magnetization pinned layer and the non-magnetic layer, and a resistance ratio between the first tunnel barrier layer and the second tunnel barrier layer is in a range of 1:0.25 to 1:4.

    Abstract translation: 磁阻元件包括:无磁化层,其具有第一平面和位于与第一平面相反的一侧的第二平面,并且具有可变的磁化方向; 磁化固定层,设置在所述磁化自由层的所述第一平面侧上,并且具有钉扎磁化方向; 设置在所述磁化自由层和所述磁化固定层之间的第一隧道势垒层; 设置在无磁化层的第二平面上的第二隧道势垒层; 以及设置在与磁化自由层相反的第二隧道势垒层的相对侧上的平面上的非磁性层。 磁化自由层的磁化方向通过在磁化被钉扎层和非磁性层之间施加电流而变化,并且第一隧道势垒层和第二隧道势垒层之间的电阻比在1:0.25至 1:4。

Patent Agency Ranking