公开(公告)号：US4410268A

公开(公告)日：1983-10-18

申请号：US257271

申请日：1981-04-24

申请人： Hiroshi Tamaki

发明人： Hiroshi Tamaki

IPC分类号： G01M11/02 ,  G01B9/00

CPC分类号： G01M11/0235

摘要： An apparatus for measuring the optical characteristics of an optical system includes a light source, a collimator lens, a mask, a detector, and a circuit for measuring information received from the detector. The light source projects a beam of light through the collimator lens and then through the optical system. The beam of light then passes through the mask, which has a pattern of at least two non-parallel, straight lines on it, and is projected onto the detector. With the information provided to the circuit by the detector the optical characteristics of the optical system are determined. The circuit determines the optical characteristics of the optical system by evaluating changes in the length and gradient angles of the lines projected onto the detector from the mask.

摘要翻译： 用于测量光学系统的光学特性的装置包括光源，准直透镜，掩模，检测器和用于测量从检测器接收的信息的电路。 光源通过准直透镜投射光束，然后通过光学系统投影。 然后光束通过掩模，该掩模具有至少两个不平行的直线的图案，并且投射到检测器上。 通过检测器提供给电路的信息，确定光学系统的光学特性。 该电路通过评估从掩模投射到检测器上的线的长度和梯度角的变化来确定光学系统的光学特性。

公开(公告)号：US4194214A

公开(公告)日：1980-03-18

申请号：US827677

申请日：1977-08-25

申请人： Katunobu Awane ,  Hironori Hattori ,  Tetuo Biwa ,  Hiroshi Tamaki

发明人： Katunobu Awane ,  Hironori Hattori ,  Tetuo Biwa ,  Hiroshi Tamaki

IPC分类号： G09F13/22 ,  G09F9/30 ,  H01L21/266 ,  H01L21/822 ,  H01L21/8234 ,  H01L27/04 ,  H01L27/088 ,  H01L29/78

CPC分类号： H01L29/7835 ,  H01L21/266 ,  H01L27/088 ,  H01L29/7801

摘要： High voltage diffusion-self-alignment metal oxide semiconductor devices and control logic circuitry therefor are integrated in a single semiconductor body. The integrated semiconductor device includes a considerably large number of output terminals compared to the number of input terminals. The output terminals develop signals of high voltages derived from the high voltage diffusion-self-alignment metal oxide semiconductor devices which are positioned at a peripheral zone of the semiconductor body.

摘要翻译： 高电压扩散自对准金属氧化物半导体器件及其控制逻辑电路集成在单个半导体本体中。 与输入端子的数量相比，集成半导体器件包括相当大数量的输出端子。 输出端子产生来自位于半导体本体的周边区域的高电压扩散 - 自对准金属氧化物半导体器件的高电压信号。

公开(公告)号：US20100103691A1

公开(公告)日：2010-04-29

申请号：US12604744

申请日：2009-10-23

申请人： Yuji YASUDA ,  Takashi Inoue ,  Seiichiro Yagi ,  Junichi Shimizu ,  Hiroshi Tamaki ,  Tetsuya Sugiyama

发明人： Yuji YASUDA ,  Takashi Inoue ,  Seiichiro Yagi ,  Junichi Shimizu ,  Hiroshi Tamaki ,  Tetsuya Sugiyama

IPC分类号： B60Q1/00

CPC分类号： F21V29/74 ,  F21S41/143 ,  F21S41/147 ,  F21S45/43 ,  F21V29/71 ,  F21V29/76 ,  F21V29/85

摘要： An automotive lamp includes a semiconductor light emitting device used as a light source and bracket used as a support member supporting the semiconductor light emitting device. The bracket includes a first heat-transfer member having an isotropic thermal conductivity in at least part of region in contact with the semiconductor light emitting device, and a second heat-transfer member having an anisotropic thermal conductivity in a region in contact with the first heat-transfer member.

摘要翻译： 汽车灯包括用作支撑半导体发光器件的支撑部件的光源和支架的半导体发光器件。 支架包括在与半导体发光器件接触的区域的至少一部分中具有各向同性导热性的第一传热部件，以及在与第一热接触的区域中具有各向异性热传导性的第二传热部件 转移成员。

公开(公告)号：US4384204A

公开(公告)日：1983-05-17

申请号：US272265

申请日：1981-06-10

申请人： Hiroshi Tamaki ,  Fumio Ohtomo ,  Kazuaki Kimura

发明人： Hiroshi Tamaki ,  Fumio Ohtomo ,  Kazuaki Kimura

IPC分类号： G01D5/36 ,  G01D5/249 ,  G01D5/347 ,  H03M1/00

CPC分类号： H03M1/308 ,  H03M1/287

摘要： An absolute encoder comprising a sensor array, a code plate arranged in opposition to the sensor array and having a plurality of blocks in the direction of normal displacement, each block having an address track and a fine reading track, and an arithmetic unit for processing data of the code plate detected by the sensor array. Each of the blocks of the code plate has a reference track, an address track and a fine reading track. The fine reading track of each block has fine reading patterns which change in a direction crossing said direction of normal displacement.

摘要翻译： 一种绝对编码器，包括传感器阵列，与传感器阵列相对布置的代码板，并且在正常位移方向上具有多个块，每个块具有地址轨道和精细读取轨道，以及用于处理数据的运算单元 由传感器阵列检测到的代码板。 代码板的每个块具有参考轨道，地址轨道和精细读取轨道。 每个块的精细读取轨迹具有在与正常位移方向交叉的方向上变化的精细读取模式。

公开(公告)号：US4325638A

公开(公告)日：1982-04-20

申请号：US142229

申请日：1980-04-21

申请人： Harumi Takeda ,  Kiichi Furuya ,  Susumu Takahashi ,  Hiroshi Tamaki

发明人： Harumi Takeda ,  Kiichi Furuya ,  Susumu Takahashi ,  Hiroshi Tamaki

IPC分类号： G02B6/42 ,  G01B11/02 ,  G01S7/48 ,  G01S7/481 ,  G02B6/00 ,  G02B6/02 ,  G01B11/14 ,  G02B5/17

CPC分类号： G01S7/4818 ,  G01B11/026

摘要： Electro-optical distance measuring apparatus has a light emitting element for producing a modulated light which is projected through a condenser lens and an objective lens. Between the condenser and objective lenses, there is provided a light guide device which comprises a first optical fiber bundle adjacent to the objective lens and a second optical fiber bundle adjacent to the condenser lens. The first and second optical fiber bundles are in end-to-end relationship and the first bundle has a diameter smaller than that of the second bundle.

摘要翻译： 电光测距装置具有用于产生通过聚光透镜和物镜投影的调制光的发光元件。 在聚光镜和物镜之间设置有导光装置，其包括与物镜相邻的第一光纤束和与聚光透镜相邻的第二光纤束。 第一和第二光纤束处于端对端关系，第一束的直径小于第二束的直径。

公开(公告)号：US4666299A

公开(公告)日：1987-05-19

申请号：US729665

申请日：1985-05-02

申请人： Hiroshi Tamaki ,  Fumitomo Kondo ,  Hiroo Sugai

发明人： Hiroshi Tamaki ,  Fumitomo Kondo ,  Hiroo Sugai

IPC分类号： G01C9/20 ,  G01C5/02 ,  G02B5/06 ,  G01B11/26

CPC分类号： G01C5/02

摘要： An inclination measuring apparatus having a prism and a container having a liquid sealed therein for providing a liquid surface perpendicular to the direction of gravity. A member constructed from thermal conductive material is position under the liquid surface to maintain the liquid surface level in the presence of ambient temperature changes.

摘要翻译： 一种倾斜测量装置，具有棱镜和液体密封在其中的用于提供垂直于重力方向的液体表面的容器。 由导热材料构成的构件位于液面下方，以在存在环境温度变化的情况下保持液面的水平。

公开(公告)号：US4601575A

公开(公告)日：1986-07-22

申请号：US353505

申请日：1982-03-01

申请人： Hiroshi Tamaki

发明人： Hiroshi Tamaki

IPC分类号： G01M11/02 ,  G01B9/00

CPC分类号： G01M11/0235

摘要： An apparatus for measuring the optical characteristics of an optical system includes a light source, collimator means for collimating a beam of light from the light source, a mask means, a means for holding the optical system to be tested between the collimator means and the mask means, a detector, a calculator, and first beam splitting means. The mask means includes at least one mask provided in each optical path following the first beamsplitter means, each having a linear band group consisting of at least two parallel linear bands, with each mask disposed to provide a different orientation for the linear bands.

摘要翻译： 一种用于测量光学系统的光学特性的装置，包括光源，用于准直来自光源的光束的准直器装置，掩模装置，用于将待测光学系统保持在准直器装置和掩模之间的装置 装置，检测器，计算器和第一分束装置。 掩模装置包括设置在每个光路之后的至少一个掩模，其中第一分束器装置具有由至少两个平行线性带组成的线性带组，每个掩模设置成为线性带提供不同的取向。

公开(公告)号：US4461462A

公开(公告)日：1984-07-24

申请号：US442438

申请日：1982-11-17

申请人： Nobuyuki Mizushima ,  Kyohei Murata ,  Hiroshi Tamaki ,  Junichi Hayashi ,  Fujio Ohkubo

发明人： Nobuyuki Mizushima ,  Kyohei Murata ,  Hiroshi Tamaki ,  Junichi Hayashi ,  Fujio Ohkubo

IPC分类号： C21D1/00 ,  C21D9/08 ,  C21D1/63

CPC分类号： C21D9/085

摘要： A method and apparatus for cooling at least the inside of steel pipes. Cooling is effected while restraining the radial displacement of a pipe at a point not more than 500 mm, or preferably not more than 250 mm, away from each end of the pipe and at intermediate points spaced at intervals of 1.0 m to 2.5 m. Elliptical deformation in the cross section of larger-diameter pipes also is prevented by adding to the aforementioned cooling method and apparatus a device and step to rotate the pipe being cooled at a rate of 30 to 150 times per minute. The restraining device at one end of the pipe is designed to move in the direction of the pipe axis so that the restraint of the radial displacement at a point not more than 500 mm away from that end is at all times ensured even when the pipe length varies.

摘要翻译： 至少冷却钢管内部的方法和装置。 在管道的每个端部远离管子的距离不超过500mm，优选地不超过250mm的位置处，并且在间隔1.0m至2.5m的中间点处，进行冷却。 通过向上述冷却方法和装置中添加以每分钟30至150次的速度旋转被冷却的管的装置和步骤，可以防止大直径管的横截面中的椭圆形变形。 管道一端的限制装置被设计成在管轴方向上移动，使得即使在管道长度方向上也始终确保远离该端部不超过500mm的位置处的径向位移的约束 不一样

公开(公告)号：US4058822A

公开(公告)日：1977-11-15

申请号：US691874

申请日：1976-06-01

申请人： Katunobu Awane ,  Hironori Hattori ,  Tetuo Biwa ,  Hiroshi Tamaki

发明人： Katunobu Awane ,  Hironori Hattori ,  Tetuo Biwa ,  Hiroshi Tamaki

IPC分类号： H01L21/336 ,  H01L29/06 ,  H01L29/40 ,  H01L29/417 ,  H01L29/78 ,  H01L27/02 ,  H01L29/04

CPC分类号： H01L29/7816 ,  H01L29/404 ,  H01L29/41758 ,  H01L29/66674 ,  H01L29/7801 ,  H01L29/0696

摘要： In a metal oxide semiconductor device of the diffusion-self-alignment type which comprises a semiconductor body having a conductivity of one type, a drain and a source regions having a conductivity opposite that of the semiconductor body, and a channel region of the same conductivity type as the semiconductor body and having a higher conductivity than that of the semiconductor body, said channel region being formed in such a manner to surround the source region through the use of double diffusion techniques. An active pinched resistor layer of the opposite conductivity type to that of the semiconductor body and having a lower conductivity than that of the drain and the source regions is formed on the surface of the semiconductor body to extend between the drain and the channel regions. A field plate or overlay metallization is disposed on an insulating layer adjacent the drain metallization and extends outwardly towards the gate metallization so that it overlies a part of the active pinched resistor layer near the drain contact region.

摘要翻译： 在扩散自对准型的金属氧化物半导体器件中，其包括具有一种导电性的半导体本体，具有与半导体本体的导电性相反的导电性的漏极和源极区域以及相同导电性的沟道区域 类型为半导体本体并且具有比半导体本体更高的导电性，所述沟道区以通过使用双扩散技术包围源极区的方式形成。 在半导体本体的表面上形成与半导体本体相反的导电类型的有源夹持电阻层，并且具有比漏极和源极区更低的导电性，以在漏极和沟道区之间延伸。 场板或覆盖金属化设置在与漏极金属化相邻的绝缘层上，并向外延伸到栅极金属化，使得其覆盖在漏极接触区域附近的有源夹持电阻器层的一部分。

公开(公告)号：US4588270A

公开(公告)日：1986-05-13

申请号：US436853

申请日：1982-10-26

申请人： Hiroshi Tamaki

发明人： Hiroshi Tamaki

IPC分类号： A61B3/10 ,  A61B3/107 ,  G01B11/24 ,  G01B11/245 ,  G01B11/255 ,  G01B21/20 ,  G01M11/00

CPC分类号： A61B3/107 ,  G01B11/255

摘要： A curvature measuring apparatus is provided for measuring the radii of curvature of a curved surface, particularly a human cornea or a contact lens. The apparatus comprises an illuminating optical system which illuminates the surface to be measured. The optical system includes a light source for forming a pattern of radiating beams of at least two groups, with each group being comprised of at least two parallel straight lines in a virtual plane. The straight lines in one group are different in directions of arrangement from the straight lines in the other group, and each group includes at least one line whose characteristics are substantially different from the other lines in the group to serve as a reference line. A collimator lens orients principal rays of illuminating beams of light emitted from the light source through a pin hole arranged on an optical axis, to be parallel to the optical axis so as to illuminate the surface to be measured by the illuminating beams of light. A detector is provided which is positioned in a virtual plane which is afocal with the plane containing the light source, for detecting the illuminating beams of light reflected from the surface. An arithmetic calculator calculates a radius of curvature of the surface from changes in inclination and pitch which are produced between a pattern of projected straight lines and the pattern of radiating beams from the light source.

摘要翻译： 提供曲率测量装置用于测量曲面，特别是人角膜或隐形眼镜的曲率半径。 该装置包括照亮待测表面的照明光学系统。 光学系统包括用于形成至少两组的辐射光束的图案的光源，每个组由虚拟平面中的至少两条平行的直线构成。 一组中的直线与另一组中的直线的布置方向不同，并且每组包括至少一条线，其特征与组中的其他线基本上不同以用作参考线。 准直透镜通过布置在光轴上的销孔将从光源发出的照明光束的主光线定向为平行于光轴，以照亮由照明光束测量的表面。 提供一种检测器，其位于与包含光源的平面无关的虚拟平面中，用于检测从表面反射的光的照明光束。 算术计算器根据投影直线的图案与来自光源的辐射光束的图案之间产生的倾斜度和间距的变化来计算表面的曲率半径。