摘要:
This invention discloses a static random access memory (SRAM) cell array structure which comprises a first and second bit-line coupled to a column of SRAM cells, the first and second bit-lines being substantially parallel to each other and formed by a first metal layer, and a first conductive line being placed between the first and second bit-lines and spanning across the column of SRAM cells without making conductive coupling thereto, the first conductive line being also formed by the first metal layer.
摘要:
This invention discloses a static random access memory (SRAM) cell array structure which comprises a first and second bit-line coupled to a column of SRAM cells, the first and second bit-lines being substantially parallel to each other and formed by a first metal layer, and a first conductive line being placed between the first and second bit-lines and spanning across the column of SRAM cells without making conductive coupling thereto, the first conductive line being also formed by the first metal layer.
摘要:
This invention discloses an integrated circuit, which comprises a first and a second pull-down circuit controlled by a first and second signal, respectively, and coupled between a first node and a low voltage power supply (Vss), and a controllable pull-up circuit coupled between the first node and a complimentary high voltage power supply (Vcc), wherein when either the first or second signal is asserted to a predetermined logic state, the first node is pulled down to a logic LOW state.
摘要:
This invention discloses an integrated circuit, which comprises a first and a second pull-down circuit controlled by a first and second signal, respectively, and coupled between a first node and a low voltage power supply (Vss), and a controllable pull-up circuit coupled between the first node and a complimentary high voltage power supply (Vcc), wherein when either the first or second signal is asserted to a predetermined logic state, the first node is pulled down to a logic LOW state.
摘要:
A circuit includes a first inverter including a first PMOS transistor and a first NMOS transistor, and a second inverter including a second PMOS transistor and a second NMOS transistor. A first node is connected to gates of the first PMOS transistor and the first NMOS transistor and drains of the second PMOS transistor and the second NMOS transistor. A second node is connected to gates of the second PMOS transistor and the second NMOS transistor and drains of the first PMOS transistor and the first NMOS transistor. The circuit further includes a first capacitor having a first capacitance connected to the first node; and a second capacitor having a second capacitance connected to the second node. The second capacitance is greater than the first capacitance.
摘要:
A read only memory (ROM) and an operating method thereof are provided. The read only memory includes: a control circuit, powered by a first power source for outputting a control signal within a first voltage range; a voltage shifter, for expanding the amplitude of the control signal to a second voltage range; a word line driver, powered by a second power source with a voltage which is higher than that of the first power source, for driving one of a plurality of word lines of a read only memory cell array according to the control signal which is expanded to be within the second voltage range; and an input/output circuit, for connecting the plurality of bit lines to read out messages.
摘要:
A keeper of an integrated circuit includes a first transistor having a first gate being coupled with an output end of an inverter. A second transistor is coupled with the first transistor in series. The second transistor has a second gate being coupled with an input end of the inverter.
摘要:
Memory products and manufacturing methods thereof. A memory product comprises at least one memory cell and at least one redundancy memory cell. The memory cell and the redundancy memory cell have different physical or electronic properties. The redundancy memory cells are used as repair schemes for the memory cell if the memory cell is determined to have experienced Vccmin failure.
摘要:
An improved a programmable electrical fuse device utilizing MOS oxide breakdown is described herein. The fuse device comprises a programmable MOS device having a first gate width, a reference MOS device having a second gate width that is substantially less than the first gate width, and a sense amplifier operable to detect a difference in current and generate a corresponding logical signal. According to one embodiment, the fuse device can be programmed only once to invert its logical state and thereby provide a changeable logical signal. This is done by applying an overvoltage signal to the programmable MOS device so that its oxide layer breaks down. Since the programmable MOS device and the reference MOS device are on opposite sides of the sense amplifier, an opposite logical signal is generated by shorting-out the programmable MOS device. According to another embodiment, the fuse device can be programmed and erased multiple times by breaking down oxide layers in MOS devices that are alternating sides of a sense amplifier.
摘要:
Mechanisms for improving static noise margin and/or reducing misread current in multi-port devices are disclosed. In some embodiments related to dual port SRAM a suppress device (e.g., transistor) is provided at each word line port. When both ports are activated, both suppress devices are on and lower the voltage level of these ports, which in turn lower the voltage level at the node storing the data for the memory. As the voltage level at the data node is lowered, noise margin is improved and read disturb can be avoided.