METHOD AND DEVICE FOR PERMANENT BONDING OF WAFERS, AS WELL AS CUTTING TOOL
    2.
    发明申请
    METHOD AND DEVICE FOR PERMANENT BONDING OF WAFERS, AS WELL AS CUTTING TOOL 有权
    用于永久粘合的方法和装置,如切割工具

    公开(公告)号:US20140196842A1

    公开(公告)日:2014-07-17

    申请号:US13808415

    申请日:2012-01-23

    IPC分类号: B23K20/24 B29C65/74

    摘要: A method for bonding a first bond surface of a first solid substrate consisting of a first material to a second bond surface of a second solid substrate consisting of a second material, said method comprising the steps of: working one of the first and/or second bond surfaces with a cutting tool at a speed vs that is below a critical speed vk and at a temperature Ts that exceeds a critical temperature Tk, down to a surface roughness O that is less than 1 μm; bringing the first solid substrate into contact with the second solid substrate at the bond surfaces, and exposing the solid substrates that are in contact to temperature in order to form a permanent bond that is at least primarily produced by recrystallization at the bond surfaces.

    摘要翻译: 一种用于将由第一材料组成的第一固体基质的第一粘合表面与由第二材料组成的第二固体基质的第二粘结表面接合的方法,所述方法包括以下步骤:将所述第一和/ 具有切削工具的速度与低于临界速度vk的温度Ts和超过临界温度Tk的温度T下降到小于1μm的表面粗糙度O; 使第一固体基材在接合表面与第二固体基材接触,并将与温度接触的固体基材曝光,以便形成至少主要通过在结合表面上重结晶产生的永久粘合。

    Method and device for permanent bonding of wafers, as well as cutting tool
    3.
    发明授权
    Method and device for permanent bonding of wafers, as well as cutting tool 有权
    用于晶片永久粘合的方法和装置,以及切削工具

    公开(公告)号:US09067363B2

    公开(公告)日:2015-06-30

    申请号:US13808415

    申请日:2012-01-23

    摘要: A method for bonding a first bond surface of a first solid substrate consisting of a first material to a second bond surface of a second solid substrate consisting of a second material. The method including the steps of: working one of the first and/or second bond surfaces with a cutting tool at a speed vs that is below a critical speed vk and at a temperature Ts that exceeds a critical temperature Tk, down to a surface roughness O that is less than 1 μm; bringing the first solid substrate into contact with the second solid substrate at the bond surfaces, and exposing the solid substrates that are in contact to temperature in order to form a permanent bond that is at least primarily produced by recrystallization at the bond surfaces.

    摘要翻译: 一种用于将由第一材料组成的第一固体基底的第一粘合表面与由第二材料组成的第二固体基底的第二粘结表面接合的方法。 该方法包括以下步骤:用切削工具以与低于临界速度vk的速度相对应的第一和/或第二接合表面中的一个,并且在超过临界温度Tk的温度Ts下,直到表面粗糙度 O小于1μm; 使第一固体基材在接合表面与第二固体基材接触,并将与温度接触的固体基材曝光,以便形成至少主要通过在结合表面上重结晶产生的永久粘合。

    METHOD AND DEVICE FOR DETERMINING THE PRESSURE DISTRIBUTION FOR BONDING
    5.
    发明申请
    METHOD AND DEVICE FOR DETERMINING THE PRESSURE DISTRIBUTION FOR BONDING 有权
    用于确定用于粘结的压力分布的方法和装置

    公开(公告)号:US20140102221A1

    公开(公告)日:2014-04-17

    申请号:US14119023

    申请日:2011-06-06

    IPC分类号: G01L1/24

    摘要: A method and a device for determining the pressure distribution for bonding of a first substrate to a second substrate, with the following steps, especially with the following sequence: placing a measurement layer between a first tool for holding the first substrate and an opposite second tool which is aligned to the first tool for bonding of the substrate, deformation of the measurement layer by bringing the tools closer to one another, measurement of the deformation of the measurement layer and computation of the pressure distribution.

    摘要翻译: 一种用于确定用于将第一基底粘结到第二基底上的压力分布的方法和装置,具体步骤如下:将测量层放置在用于保持第一基底的第一工具和相对的第二工具之间 其与基板的第一工具对准,通过使工具彼此靠近来测量测量层的变形,测量层的变形的测量和压力分布的计算。

    Method and device for determining the pressure distribution for bonding
    6.
    发明授权
    Method and device for determining the pressure distribution for bonding 有权
    用于确定粘合的压力分布的方法和装置

    公开(公告)号:US09500541B2

    公开(公告)日:2016-11-22

    申请号:US14119023

    申请日:2011-06-06

    摘要: A method and a device for determining the pressure distribution for bonding of a first substrate to a second substrate, with the following steps, especially with the following sequence: placing a measurement layer between a first tool for holding the first substrate and an opposite second tool which is aligned to the first tool for bonding of the substrate, deformation of the measurement layer by bringing the tools closer to one another, measurement of the deformation of the measurement layer and computation of the pressure distribution.

    摘要翻译: 一种用于确定用于将第一基底粘结到第二基底上的压力分布的方法和装置,具体步骤如下:将测量层放置在用于保持第一基底的第一工具和相对的第二工具之间 其与基板的第一工具对准,通过使工具彼此靠近来测量测量层的变形,测量层的变形的测量和压力分布的计算。