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1726 条记录 (耗时 0.029 秒)

    METHOD AND DEVICE FOR DETERMINING THE TRANSMITTANCE OF A FLAT GLASS SUBSTRATE
    41.
    发明申请
    METHOD AND DEVICE FOR DETERMINING THE TRANSMITTANCE OF A FLAT GLASS SUBSTRATE 审中-公开

    公开(公告)号：US20180128740A1

    公开(公告)日：2018-05-10

    申请号：US15520444

    申请日：2015-10-20

    申请人： Cibite AG

    发明人： Dieter OLSCHEWSKI ,  Ina DÖHRING ,  Peter LÜKE

    IPC分类号： G01N21/59 ,  G01N21/896

    CPC分类号： G01N21/59 ,  G01N21/896 ,  G01N2021/8416 ,  G01N2201/06126

    摘要： The invention relates to a method and an associated device for determining the transmittance of a flat-glass substrate (40) with a measuring device (10), with which light of at least one light source (20) is guided from one side of the flat-glass substrate (40) through the flat-glass substrate (40) to the opposite side of the flat-glass substrate (40), where it is captured by at least one receiving unit (30) and the transmittance of the flat-glass substrate (40) is determined by means of a comparison between the intensity of the light emitted by the light source (20) and the light incident upon the receiving unit (30). The light source is a surface-like diffuse light source (20), and the receiving unit (30) comprises at least one spatially resolving receiver (31; 31n). By evaluating brightness values in the measuring image (33; 33′) of the spatially resolving receiver (31; 31n), the transmittance is determined in a spatially resolved manner in a partial surface of the flat-glass substrate (40), which is covered by the measuring image (33; 33′).

    Moveable Assembly for Simultaneous Detection of Analytic and Compensation Signals in Optical Computing
    45.
    发明申请
    Moveable Assembly for Simultaneous Detection of Analytic and Compensation Signals in Optical Computing 审中-公开

    公开(公告)号：US20180112526A1

    公开(公告)日：2018-04-26

    申请号：US15559343

    申请日：2015-04-23

    申请人： Halliburton Energy Services, Inc.

    发明人： David L. PERKINS ,  Robert ATKINSON

    IPC分类号： E21B49/08

    CPC分类号： E21B49/08 ,  E21B47/011 ,  E21B47/102 ,  E21B47/122 ,  E21B2049/085 ,  G01N21/255 ,  G01N21/55 ,  G01N21/59 ,  G01N21/85

    摘要： An optical computing device uses a moveable assembly to simultaneously analytic and compensation signals to determine sample characteristics in real-time. In one embodiment, the moveable assembly is a rotating carousel including at least one optical element pair positioned thereon, where one of the optical elements forms an analytic channel, and the other forms the compensation channel. Alternatively, two carousels may be utilized, where one includes the analytic channel and the other includes the compensation channel. In another embodiment, a linear array having compensation and analytic channels may be utilized. During operation, electromagnetic radiation optically interacts with the sample to form sample-interacted light, which is directed toward the optical elements on the moveable assembly. The optical elements are positioned on the moveable assemblies such that the sample-interacted light optically interacts with both simultaneously, thereby providing compensation in parallel with the sample characteristic measurement.

    MEASUREMENT METHOD FOR LIQUID CRYSTAL AZIMUTHAL ANGLE OF LIQUID CRYSTAL PANEL AND MEASUREMENT DEVICE
    46.
    发明申请
    MEASUREMENT METHOD FOR LIQUID CRYSTAL AZIMUTHAL ANGLE OF LIQUID CRYSTAL PANEL AND MEASUREMENT DEVICE 审中-公开

    公开(公告)号：US20180107033A1

    公开(公告)日：2018-04-19

    申请号：US15113539

    申请日：2016-05-10

    申请人： Shenzhen China Star Optoelectronics Technology Co., Ltd.

    发明人： Bo HAI

    IPC分类号： G02F1/13 ,  G02F1/1335 ,  G01N21/59 ,  G01C1/00

    CPC分类号： G02F1/1309 ,  G01B11/26 ,  G01N21/59 ,  G01N2021/8477 ,  G01N2021/9513 ,  G02F1/13 ,  G09G3/006

    摘要： A measurement method for a liquid crystal azimuthal angle of a liquid crystal panel and a measurement device are disclosed. The liquid crystal panel includes an upper polarization film, a lower polarization film disposed oppositely and liquid crystal molecules disposed there between. The method includes: when absorption axes of the upper and the lower polarization films are disposed as 0 degree and 90 degrees with respect to a horizontal direction, and are perpendicular to each other, measuring a first transmittance; when absorption axes of the upper and the lower polarization films are disposed as 45 degrees and 135 degrees with respect to the horizontal direction, and are perpendicular to each other, measuring a second transmittance; calculating to obtain the liquid crystal azimuthal angle of the liquid crystal panel according to the first transmittance and second transmittance. The present invention can measure the liquid crystal azimuthal angle quickly, simply, and effectively.

    INTEGRATED EMISSIVITY SENSOR ALIGNMENT CHARACTERIZATION
    47.
    发明申请
    INTEGRATED EMISSIVITY SENSOR ALIGNMENT CHARACTERIZATION 审中-公开

    公开(公告)号：US20180094921A1

    公开(公告)日：2018-04-05

    申请号：US15281757

    申请日：2016-09-30

    申请人： Axcelis Technologies, Inc.

    发明人： John F. Baggett ,  Joseph Ferrara

    IPC分类号： G01B11/27 ,  G01N21/59 ,  G01N21/84 ,  H01L21/68

    CPC分类号： G01B11/272 ,  G01N21/59 ,  G01N21/84 ,  G01N21/9505 ,  G01N2021/8416 ,  H01L21/67242 ,  H01L21/681

    摘要： A workpiece alignment system has a workpiece support to support a workpiece. A first light emitter directs a first light beam toward the workpiece. A first light receiver receives the first light beam. A rotation device rotates the workpiece support about a support axis. A second light emitter directs a second light beam toward a peripheral region of the workpiece. A second light receiver receives the second light beam concurrent with the rotation of the workpiece. A controller determines a transmissivity of the workpiece based on a total initial emittance of the first light beam a transmission of the first light beam through the workpiece. The controller determines a position of the workpiece with respect to the support axis based, at least in part, on a rotational position of the workpiece, a portion of the second light beam received, and the determined transmissivity.

    Composite Processing Machine for Detecting Material Height and Collision
    48.
    发明申请
    Composite Processing Machine for Detecting Material Height and Collision 审中-公开

    公开(公告)号：US20180087895A1

    公开(公告)日：2018-03-29

    申请号：US15277243

    申请日：2016-09-27

    申请人： Great Computer Corp.

    发明人： Chien-Ping WONG ,  Chen-Chien TSAI ,  Hui-Te YU

    IPC分类号： G01B11/06 ,  G01B17/00 ,  G01B5/06 ,  G01N21/59 ,  G01B11/30

    CPC分类号： G01B11/0608 ,  G01B5/061 ,  G01B11/306 ,  G01B17/00 ,  G01B21/08 ,  G01N21/59

    摘要： A composite processing machine for detectiing material height and collision comprises a machine body, a contact detection unit, a non-contact detection unit, a control module, and a judgment module. The machine body is provided with an elevating working platform. An object to be processed is placed on the elevating working platform for laser processing operation. The contact detection unit and the non-contact detection unit are movably and displaceably disposed on the machine body. The control module is connected to the contact detection unit and the non-contact detection unit respectively. The judgment module determines the object's external property in order to drive the control module to control the contact detection unit and the non-contact detection unit respectively or sequentially to detect the object.