公开(公告)号：US08963323B2

公开(公告)日：2015-02-24

申请号：US12143594

申请日：2008-06-20

Applicant: Roger Scott Kempers ,  Shankar Krishnan ,  Alan Michael Lyons ,  Todd Richard Salamon

Inventor： Roger Scott Kempers ,  Shankar Krishnan ,  Alan Michael Lyons ,  Todd Richard Salamon

IPC: H01L23/31 ,  H01L23/00 ,  H01L23/42 ,  H01L23/367 ,  H01L25/065 ,  B21D53/02

CPC classification number: B23P15/26 ,  B21D53/02 ,  B21D53/022 ,  B21D53/04 ,  F28F21/00 ,  F28F21/081 ,  H01L23/367 ,  H01L23/3677 ,  H01L23/3736 ,  H01L23/42 ,  H01L24/64 ,  H01L24/66 ,  H01L24/69 ,  H01L25/0657 ,  H01L2225/06527 ,  H01L2225/06575 ,  H01L2225/06589 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/01057 ,  H01L2924/01075 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/14 ,  Y10T29/4935 ,  Y10T428/12396 ,  Y10T428/24562 ,  Y10T428/24851

Abstract: An apparatus 100 comprising a first substrate 130 having a first surface 125, a second substrate 132 having a second surface 127 facing the first surface and an array 170 of metallic raised features 170 being located on the first surface, each raised feature being in contact with the first surface to the second surface, a portion of the raised features being deformed via a compressive force 305.

Abstract translation: 装置100包括具有第一表面125的第一基底130，具有面向第一表面的第二表面127的第二基底132和位于第一表面上的金属凸起特征170的阵列170，每个凸起特征与 第一表面到第二表面，凸起特征的一部分经由压缩力305变形。

公开(公告)号：US20130342629A1

公开(公告)日：2013-12-26

申请号：US13527774

申请日：2012-06-20

Applicant: Stephen C. North ,  John F. Murray ,  Christopher W. Rice ,  Shankar Krishnan

Inventor： Stephen C. North ,  John F. Murray ,  Christopher W. Rice ,  Shankar Krishnan

IPC: H04N7/14

CPC classification number: H04N7/141 ,  H04N7/157 ,  H04N21/44008 ,  H04N21/8146

Abstract: A method that incorporates teachings of the subject disclosure may include, for example, utilizing a system including at least one processor for determining a video modification plan for a received video stream of a video call session according to the at least one party associated with the video call session, modifying, by the system, a plurality of background images of the received video stream according to the video modification plan to generate a plurality of modified background images, and generating, by the system, a modified video stream according to the plurality of modified background images. Other embodiments are disclosed.

Abstract translation: 结合本公开的教导的方法可以包括例如利用包括至少一个处理器的系统，用于根据与视频相关联的至少一个方确定视频呼叫会话的接收视频流的视频修改计划 呼叫会话，由系统修改根据该视频修改方案的接收到的视频流的多个背景图像，以生成多个修改后的背景图像，并且由该系统根据多个修改图像生成修改的视频流 修改背景图片。 公开了其他实施例。

公开(公告)号：US20090071525A1

公开(公告)日：2009-03-19

申请号：US11856201

申请日：2007-09-17

Applicant: Marc Scott Hodes ,  Shankar Krishnan

Inventor： Marc Scott Hodes ,  Shankar Krishnan

IPC: H01L35/32 ,  H01L21/50

CPC classification number: H01L23/38 ,  H01L2924/0002 ,  H01L2924/00

Abstract: An apparatus includes a thermoelectric cooler adjacent to a surface of a device substrate and including a first set of one or more metal electrodes, a second set of one or more metal electrodes, and one or more semiconductor members. Each member includes a material different from the device substrate and physically joins a corresponding one electrode of the first set to a corresponding one electrode of the second set. The electrodes and at least one member are configured to transport heat to or from a thermal load in a direction parallel to the surface of the device substrate.

Abstract translation: 一种装置包括邻近器件衬底的表面的热电冷却器，并且包括第一组一个或多个金属电极，第二组一个或多个金属电极和一个或多个半导体部件。 每个构件包括与装置基板不同的材料，并将第一组的对应的一个电极物理地连接到第二组的对应的一个电极。 电极和至少一个构件构造成在平行于器件衬底的表面的方向上将热量传递到热负载或从热负载传输热量。

公开(公告)号：US20080180698A1

公开(公告)日：2008-07-31

申请号：US12019592

申请日：2008-01-24

Applicant: Hidong Kwak ,  Shankar Krishnan

Inventor： Hidong Kwak ,  Shankar Krishnan

IPC: G01B11/06 ,  G01J1/42

CPC classification number: G01B11/0625 ,  G01B11/0633 ,  G01B11/0641 ,  G01J3/02 ,  G01J3/0224 ,  G01J3/0294 ,  G01J3/447 ,  G01N21/211 ,  G01N21/33 ,  G01N2021/213 ,  G01N2201/0233

Abstract: An optical method and system for measuring characteristics of a sample using a broadband metrology tool in a purge gas flow environment are disclosed. In the method a beam path for the metrology tool is purged with purge gas at a first flow rate. A surface of the sample is illuminated by a beam of source radiation having at least one wavelength component in a vacuum ultraviolet (VUV) range and/or at least one wavelength component in an ultraviolet-visible (UV-Vis) range. A flow rate of a purge gas is adjusted between the first flow rate for metrology measurements made when the source radiation is in the VUV spectral region and a second flow rate for metrology measurements made when the source radiation is in the UV-Vis spectral region. The system includes a light source, illumination optics, collection optics, detector, a purge gas source and a controller. The purge gas source is configured to supply a flow of purge gas to a beam path in the light source and/or illumination optics and/or sample and/or collection optics and/or detector. The controller is configured to control a flow rate of the purged gas flow in response to an output signal from the detector.

Abstract translation: 公开了一种用于在吹扫气体流动环境中使用宽带测量工具测量样品的特性的光学方法和系统。 在该方法中，用第一流量的吹扫气体吹扫计量工具的光束路径。 通过在紫外 - 可见（UV-Vis）范围内具有真空紫外（VUV）范围和/或至少一个波长分量的至少一个波长分量的源辐射束照射样品的表面。 当源辐射处于VUV光谱区域时进行的度量测量的第一流量和当源辐射处于UV-Vis光谱区域时进行度量测量的第二流量时，净化气体的流量被调节。 该系统包括光源，照明光学器件，收集光学器件，检测器，吹扫气体源和控制器。 吹扫气体源被配置为向光源和/或照明光学器件和/或样品和/或收集光学元件和/或检测器中的光束路径提供净化气体流。 控制器被配置为响应于来自检测器的输出信号来控制净化气体流量的流量。

公开(公告)号：US20080155992A1

公开(公告)日：2008-07-03

申请号：US11618056

申请日：2006-12-29

Applicant: Marc Scott Hodes ,  Christopher D.W. Jones ,  Shankar Krishnan ,  Oana Malis

Inventor： Marc Scott Hodes ,  Christopher D.W. Jones ,  Shankar Krishnan ,  Oana Malis

IPC: F25B21/02

CPC classification number: F25B21/02 ,  F25B2500/01 ,  H01L23/38 ,  H01L2924/0002 ,  H01L2924/00

Abstract: An apparatus includes a thermoelectric cooler having a first set of one or more metal electrodes, a second set of one or more metal electrodes, and one or more doped semiconductor members. Each member physically joins a corresponding one electrode of the first set to a corresponding one electrode of the second set. Each member has a cross-sectional area that increases along a path from the one metal electrode of the first set to the one metal electrode of the second set.

Abstract translation: 一种装置包括具有第一组一个或多个金属电极的热电冷却器，一个或多个金属电极的第二组和一个或多个掺杂的半导体部件。 每个构件将第一组的对应的一个电极物理地连接到第二组的对应的一个电极。 每个构件具有沿着从第一组的一个金属电极到第二组的一个金属电极的路径增加的横截面面积。

公开(公告)号：US08571309B2

公开(公告)日：2013-10-29

申请号：US13296417

申请日：2011-11-15

Applicant: Shankar Krishnan ,  James Klosowski

Inventor： Shankar Krishnan ,  James Klosowski

IPC: G06K9/00

CPC classification number: G06T3/4053

Abstract: A method includes receiving an image having a first resolution and generating an upsampled image having a second resolution based on the image. A multi-dimensional data structure corresponding to a multi-dimensional image space is generated from the upsampled image. Each node of the data structure is determined based on a weighted sum of values of one or more pixels in the upsampled image. Each of the one or more pixels corresponds to a pixel in the received image and is located within a region of the image space having a vertex defined by the node. A filter modifies the values of the nodes and a second upsampled image is generated based on the modified values. Each pixel of the second upsampled image not corresponding to a pixel in the received image is determined based on a weighted sum of the modified values of one or more nodes.

Abstract translation: 一种方法包括接收具有第一分辨率的图像并基于该图像生成具有第二分辨率的上采样图像。 从上采样图像生成对应于多维图像空间的多维数据结构。 基于上采样图像中的一个或多个像素的值的加权和来确定数据结构的每个节点。 一个或多个像素中的每一个对应于接收到的图像中的像素，并且位于具有由该节点定义的顶点的图像空间的区域内。 滤波器修改节点的值，并且基于修改的值生成第二上采样图像。 基于一个或多个节点的修改值的加权和来确定不对应于接收图像中的像素的第二上采样图像的每个像素。

公开(公告)号：US20110012898A1

公开(公告)日：2011-01-20

申请号：US12893404

申请日：2010-09-29

Applicant: Shankar Krishnan ,  Pei Yean Lee ,  John Barrett Moore ,  Suresh Venkatasubramanian

Inventor： Shankar Krishnan ,  Pei Yean Lee ,  John Barrett Moore ,  Suresh Venkatasubramanian

IPC: G06T15/00

CPC classification number: G06K9/00214 ,  G06K9/6211 ,  G06T7/30 ,  G06T17/00 ,  G06T2207/10028

Abstract: A method for registering multiple 3D point sets by determining optimal relative positions and orientations of the 3D point sets. Initial values are determined for the rotation matrices corresponding to the relative orientations of reference frames of the 3D point sets. A registration error cost function is optimized on a product manifold of all of the rotation matrices to determine optimal values of the rotation matrices. The optimal values of the rotation matrices are used to determine optimal values for translation vectors corresponding to the relative positions of the reference frames of the 3D point sets. The 3D point sets are registered on a common reference frame using the optimal rotation matrices and the optimal translation vectors.

Abstract translation: 一种用于通过确定3D点集合的最佳相对位置和取向来登记多个3D点集的方法。 对于与3D点集的参考帧的相对取向相对应的旋转矩阵确定初始值。 在所有旋转矩阵的乘积歧管上优化注册误差成本函数，以确定旋转矩阵的最佳值。 旋转矩阵的最佳值用于确定对应于3D点集的参考帧的相对位置的平移向量的最优值。 使用最佳旋转矩阵和最优平移向量将3D点集登记在公共参考帧上。

公开(公告)号：US20090321046A1

公开(公告)日：2009-12-31

申请号：US12165193

申请日：2008-06-30

Applicant: Domhnaill Hernon ,  Marc Hodes ,  Alan Lyons ,  Alan O'Loughlin ,  Shankar Krishnan

Inventor： Domhnaill Hernon ,  Marc Hodes ,  Alan Lyons ,  Alan O'Loughlin ,  Shankar Krishnan

IPC: F28F7/00

CPC classification number: F28F3/02 ,  B23P15/26 ,  F28F13/02 ,  H01L23/467 ,  H01L2924/0002 ,  Y10T29/4935 ,  H01L2924/00

Abstract: A heat sink includes a base and fins attached to the base. A flow diverter is in contact with the base or at least one of the fins and is configured to disturb a laminar flow region of a fluid flowing adjacent to at least one of the fins or the base.

Abstract translation: 散热器包括底座和连接到基座的翅片。 分流器与基座或至少一个翅片接触并且构造成扰乱流体相邻于至少一个翅片或底座流动的层流区域。

公开(公告)号：US20090321044A1

公开(公告)日：2009-12-31

申请号：US12165063

申请日：2008-06-30

Applicant: Domhnaill Hernon ,  Marc Hodes ,  Alan Lyons ,  Alan O'Loughlin ,  Shankar Krishnan

Inventor： Domhnaill Hernon ,  Marc Hodes ,  Alan Lyons ,  Alan O'Loughlin ,  Shankar Krishnan

IPC: F28F7/00

CPC classification number: H01L23/467 ,  F28F2013/008 ,  H01L23/34 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A heat sink includes a surface and a first active element connected to the surface. The first active element is configured to move from a first position relative to the surface to a second position relative to the surface. The movement alters the heat transfer characteristics of the heat sink.

Abstract translation: 散热器包括连接到表面的表面和第一有源元件。 第一活动元件构造成相对于表面从相对于表面的第一位置移动到第二位置。 运动改变散热器的传热特性。

公开(公告)号：US07274440B1

公开(公告)日：2007-09-25

申请号：US10936019

申请日：2004-09-08

Applicant: Gary Janik ,  Shankar Krishnan

Inventor： Gary Janik ,  Shankar Krishnan

IPC: G01B11/16 ,  G01J4/00

CPC classification number: G01L1/241 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/447 ,  G01J4/00 ,  G01N2203/0641 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

Abstract: Systems and methods for measuring stress in a specimen are provided. One system includes an optical subsystem configured to measure stress-induced birefringence in patterned structures formed on the specimen. In some embodiments, the optical subsystem may be configured as a spectroscopic ellipsometer, a multi-angle laser ellipsometer, a polarimeter, a polarized reflectometer, or some combination thereof. The system also includes a processor coupled to the optical subsystem. The processor is configured to determine stress in a material of the patterned structures using the stress-induced birefringence measurements. One method includes measuring stress-induced birefringence in patterned structures formed on the specimen using an optical technique. The method also includes determining stress in a material of the patterned structures using the stress-induced birefringence measurements.

Abstract translation: 提供了用于测量样品中应力的系统和方法。 一个系统包括被配置为测量形成在样本上的图案化结构中的应力诱导双折射的光学子系统。 在一些实施例中，光学子系统可以被配置为分光椭偏仪，多角度激光椭偏仪，偏振计，偏振反射计或其某种组合。 该系统还包括耦合到光学子系统的处理器。 处理器被配置为使用应力诱导的双折射测量来确定图案化结构的材料中的应力。 一种方法包括使用光学技术来测量在样品上形成的图案化结构中的应力诱导双折射。 该方法还包括使用应力诱导的双折射测量来确定图案化结构的材料中的应力。