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公开(公告)号:US20240021353A1
公开(公告)日:2024-01-18
申请号:US17812772
申请日:2022-07-15
Applicant: QUALCOMM Incorporated
Inventor: Jonghae KIM , Je-Hsiung LAN , Kai LIU , Ranadeep DUTTA
CPC classification number: H01F17/0013 , H01F27/2804 , H01F2027/2809
Abstract: One or more aspects include apparatuses, systems including co-spiral inductors and methods for fabricating the same. In at least one aspect, a co-spiral inductor includes a plurality of turns, each of the plurality of turns being displaced both vertically and horizontally from a next successive turn. The plurality of turns is formed from traces on different metal layers formed on a substrate. The co-spiral inductor includes a plurality of insulators configured to electrically insulate each of the plurality of turns. The co-spiral inductor includes a plurality of interconnects configured to couple each of the plurality of turns to at least one other turn.
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公开(公告)号:US20230275004A1
公开(公告)日:2023-08-31
申请号:US17682868
申请日:2022-02-28
Applicant: QUALCOMM Incorporated
Inventor: Jonghae KIM , Je-Hsiung LAN , Kai LIU , Ranadeep DUTTA
IPC: H01L23/48 , H01L23/522 , H01L21/768 , H03H7/01
CPC classification number: H01L23/481 , H01L23/5223 , H01L21/76898 , H03H7/0115 , H01L23/5227
Abstract: An integrated circuit (IC) includes a substrate and a first through substrate via (TSV) in the substrate. The first TSV includes a first metal-insulator-metal (MIM) capacitor. The first MIM capacitor includes a first plate composed of a first metallization layer on an inner surface of the first TSV. The first MIM capacitor includes a MIM insulator layer on the first plate. The first MIM capacitor includes a second plate composed of a second metallization layer on the MIM insulator layer. The IC includes a 3D inductor. The 3D inductor includes a second TSV in the substrate. The 3D inductor includes a first trace on a first surface of the substrate, coupled to a first end of the second TSV. The 3D inductor further includes a second trace on a second surface of the substrate and coupled to a second end of the second TSV and a second end of the first TSV.
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公开(公告)号:US20230092429A1
公开(公告)日:2023-03-23
申请号:US17483403
申请日:2021-09-23
Applicant: QUALCOMM Incorporated
Inventor: Ranadeep DUTTA , Jonghae KIM , Je-Hsiung LAN
IPC: H01L29/94 , H01L49/02 , H01L29/66 , H01L21/768 , H01L23/48
Abstract: Disclosed are devices having a metal-insulator-metal (MIM) capacitor and methods for fabricating the devices. The MIM capacitor includes a plurality of trenches in a Silicon (Si) substrate; a porous Si surface formed in the plurality of trenches, where the porous Si surface has an irregular surface on sidewalls and bottoms of the plurality of trenches; an oxide layer conformally disposed on the porous Si surface; a first plate conformally disposed on the oxide layer; a first dielectric layer conformally disposed on the first plate; and a second plate conformally disposed on the first dielectric, where the first plate, the first dielectric layer, and the second plate, each have an irregular surface that generally conforms to the irregular surface of the porous Si surface.
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公开(公告)号:US20220406882A1
公开(公告)日:2022-12-22
申请号:US17349724
申请日:2021-06-16
Applicant: QUALCOMM Incorporated
Inventor: Jonghae KIM , Je-Hsiung LAN , Ranadeep DUTTA
Abstract: A three dimensional (3D) inductor is described. The 3D inductor includes a first plurality of micro-through substrate vias (TSVs) within a first area of a substrate. The 3D inductor also includes a first trace on a first surface of the substrate, coupled to a first end of the first plurality of micro-TSVs. The 3D inductor further includes a second trace on a second surface of the substrate, opposite the first surface, coupled to a second end, opposite the first end, of the first plurality of micro-TSVs.
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公开(公告)号:US20220285080A1
公开(公告)日:2022-09-08
申请号:US17195220
申请日:2021-03-08
Applicant: QUALCOMM Incorporated
Inventor: Jonghae KIM , Changhan Hobie YUN , Je-Hsiung LAN , Ranadeep DUTTA
Abstract: An inductor includes a first metallization layer multi-turn trace. The inductor also includes a second metallization layer multi-turn trace coupled to the first metallization layer multi-turn trace through at least one first via. The inductor further includes a plurality of discrete third metallization layer trace segments coupled to the second metallization layer multi-turn trace through a plurality of second vias.
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公开(公告)号:US20210398957A1
公开(公告)日:2021-12-23
申请号:US16906509
申请日:2020-06-19
Applicant: QUALCOMM Incorporated
Inventor: Je-Hsiung LAN , Ranadeep DUTTA , Jonghae KIM
IPC: H01L25/16 , H01L23/00 , H01L49/02 , H01L27/092 , H03H9/17
Abstract: A three-dimensional integrated circuit (3DIC) and techniques for fabricating a 3DIC. An example semiconductor device generally includes an integrated circuit (IC) having a first plurality of pads coupled to components of the IC, wherein a first oxide material is disposed between the first plurality of pads, and a second plurality of pads, wherein at least a portion of the first plurality of pads is bonded to at least a portion of the second plurality of pads, and wherein a second oxide material is disposed between the second plurality of pads and is bonded to the first oxide material b. The semiconductor device may also include a substrate disposed above the second plurality of pads, one or more passive devices adjacent to the substrate, and one or more vias formed through the substrate, wherein at least one of the second plurality of pads is coupled to the one or more vias.
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公开(公告)号:US20210143071A1
公开(公告)日:2021-05-13
申请号:US16682554
申请日:2019-11-13
Applicant: QUALCOMM Incorporated
Inventor: Je-Hsiung LAN , Jonghae KIM , Ranadeep DUTTA
IPC: H01L23/15 , H01L21/02 , H01L21/8238
Abstract: Certain aspects provide a three-dimensional integrated circuit (3DIC) and techniques for fabricating a 3DIC. For example, certain aspects provide a semiconductor device that generally includes one or more first integrated circuits (ICs), a first plurality of pads coupled to components of the one or more first ICs, one or more second ICs, forming glass (FG) material disposed adjacent to the one or more second ICs, and a second plurality of pads, wherein at least one of the second plurality of pads is coupled to components of the one or more second ICs, and wherein at least a portion of the first plurality of pads is bonded to at least a portion of the second plurality of pads.
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公开(公告)号:US20210099149A1
公开(公告)日:2021-04-01
申请号:US16986595
申请日:2020-08-06
Applicant: QUALCOMM Incorporated
Inventor: Je-Hsiung LAN , Jonghae KIM , Ranadeep DUTTA
Abstract: Disclosed are devices and methods for fabricating devices. A device can include a passive portion having at least one metal insulator metal (MIM) capacitor and at least one 2-dimensional (2D) inductor. The device further includes a substrate and the passive portion is formed on the substrate. A magnetic core is embedded in the substrate. A 3-dimensional (3D) inductor is also included having windings formed at least in part in the substrate and at least a portion of the windings being formed around the magnetic core.
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公开(公告)号:US20180315773A1
公开(公告)日:2018-11-01
申请号:US15581254
申请日:2017-04-28
Applicant: QUALCOMM INCORPORATED
Inventor: Ranadeep DUTTA , Antonino SCUDERI , Wing SY
CPC classification number: H01L27/1203 , H01L21/823418 , H01L21/823462 , H01L27/088 , H01L27/0922 , H01L27/1237 , H01L29/7824 , H03F1/223 , H03F3/195 , H03F3/245 , H03F2200/451
Abstract: An amplifier includes a cascode structure comprising a first transistor having first characteristics coupled to a second transistor having second characteristics different than the first characteristics, the first transistor formed with the second transistor on a single diffusion.
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