Abstract:
Lighting systems comprising a spectrum former upstream from a reflective pixelated spatial light modulator (reflective SLM), the SLM reflecting substantially all of the light in the spectrum into at least two different light paths, that do not reflect back to the light source or the spectrum former. At least one of the light paths acts as a projection light path and transmits desired light out of the lighting system. The lighting systems provide virtually any desired color(s) and intensity(s) of light, and avoid overheating problems by deflecting unwanted light and other electromagnetic radiation out of the system or to a heat management system. The systems can be part of another system, a luminaire, or any other suitable light source. The systems can provide virtually any desired light, from the light seen at the break of morning to specialized light for treating cancer or psoriasis, and may change color and intensity at speeds that are perceptually instantaneous.
Abstract:
A ceramic reference in conjunction with a spectrometer, a metallized ceramic material, and a method of utilizing a ceramic material as a reference in the ultraviolet, visible, near-infrared, or infrared spectral regions are presented. The preferred embodiments utilize a ceramic reference material to diffusely reflect incident source light toward a detector element for quantification in a reproducible fashion. Alternative embodiments metallize either the incident surface or back surface of to form a surface diffuse reflectance standard. Optional wavelength reference layers or protective layers may be added to the ceramic or to the metallized layer. The reference ceramic is used to provide a measure of optical signal of an analyzer as a function of the analyzers spatial, temporal, and environmental state.
Abstract:
A programmable substance detector includes a light source, a sample cell, a programmable diffraction grating positioned to receive light from the light source and to direct diffracted light to the sample cell, and a detector associated with the cell to detect a match between a characteristic of the diffracted light and a corresponding characteristic of a substance within the cell.
Abstract:
A spectrographic analysis method which is photometric and non-contact for determining the presence of a chosen constituent in water is provided based on the fact that the inverse of reflectance is a measure of absorption. A full spectrum measurement of the reflectance of the water is made and an absorption spectrum calculated which is then fitted to a clear spectrum in a wavelength range where the water absorption dominates so as to have scaling and offset. Then the clear water spectrum is subtracted and a matching is repeated for the spectrum of the desired constituent and thus a measure of the concentration of the constituent in the water is obtained.
Abstract:
A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function nullm(x), determination of a provisional wavelength scale nullnullm 1(x) for at least one neighbouring order m 1, by means of addition/subtraction of a wavelength difference nullFSR which corresponds to a free spectral region, according to nullm 1 null(x)null0nullm(x)nullFSR with nullFSRnullnullm(x)/m, determination of the wavelengths of lines in said neighbouring order m 1, by means of the provisional wavelength scale null 1(x), replacement of the provisional wavelength of at least two lines by the reference wavelength for said lines as obtained in step (a) and repeat of steps (d) to (g) for at least one further neighbouring order.
Abstract:
The invention provides an optical transceiver capable of simplifying the manufacturing process. An optical transceiver includes a transparent substrate having a surface emitting laser mounted thereon, a transparent substrate with a photo detector mounted thereon, a transparent substrate formed with diffraction gratings, and a transparent substrate formed with a diffraction grating adhered with each other in layers. The signal beam emitted from the surface emitting laser is introduced to the diffraction grating by the diffraction grating, converged by the diffraction grating, and introduced into the optical fiber connected to the sleeve. The signal beam emitted from the optical fiber connected to the sleeve is introduced toward the diffraction grating by the diffraction grating, converged by the diffraction grating, and introduced into the photo detector.
Abstract:
An on-the-go sensor for determining the sugar content of an agricultural product, such as a sugar beet, during harvesting or at other times. The sensor is coupled to a harvester/defoliator and uses a knife to slice a cross-section from the crown of the sugar beet during harvesting. An illumination chamber radiates the exposed crown, and a sensor head receives the reflected radiation. A spectrometer converts the reflected radiation to a spectral signal. A computer digitizes and processes the spectral signal to produce data points relating to the sugar content of the sugar beet. The processing of the data points includes normalization, linearization, and other techniques. One of the techniques eliminates the conventional need to use the spectral signature of a separate physical standard as a reference.
Abstract:
A plasma processing system that comprises a process chamber, a plasma source, a light detection device and a controller. The controller is useful for determining a seasoning state of the plasma processing system. The present invention further provides a method of determining the seasoning state of a plasma processing system comprising the steps of forming a first plasma in the process chamber utilizing the plasma source; measuring a first signal related to light emitted from the first plasma using the light detection device and storing the first signal using the controller; forming a second plasma in the process chamber utilizing the plasma source; measuring a second signal related to light emitted from the second plasma using the light detection device and storing the second signal using the controller; and correlating a change between the first signal and the second signal with a seasoning state of the plasma processing system.
Abstract:
A high resolution hyperspectral imaging apparatus (10) for analyzing atmospheric constituents. The apparatus (10) includes an optical telescope that receives an optical beam to be analyzed. A beam splitter (20) separates the optical beam into a first beam and a second beam that have separate wavelengths. A first spectrograph (72) analyzes the first beam and a second spectrograph (74) analyzes the second beam. Both spectrographs (72, 74) include a lens assembly (36, 44), a grating (42, 50) and a detector (54, 52). The gratings (42, 50) separate the beams into representative wavelengths that are recorded by the detectors (54, 52).
Abstract:
An apparatus for and method of calculating an integrated index of a transparent, translucent or opaque material for a desired wavelength range, the method comprising measuring a filtered value of the material as a function of wavelength within the desired wavelength range and calculating a protection index from the measured filtered value. The integrated index is used to quantify the ultraviolet, infra-red, erythemal or aphakic exposure properties of the material. In addition, the integrated index is used to quantify the photopic and/or scotopic response capabilities of the material. Further, the integrated index is used to quantify the differential or mean color indices of the material in comparison to the color spectrum or another material. Moreover, the integrated index is used to quantify the heat flux absorbed by the material.