Abstract:
A dual band spectrometer (40) for imaging one or two spectral bands onto a common image plane. The spectrometer (40) includes an input aperture (42) for receiving scene photons; an entrance slit (46) illuminated by photons from the input aperture (42); a diffraction grating (50) for dispersing the photons into spectral bands, such that at least one of the spectral bands embodies two diffraction orders; a collimator (48) for collimating the photons from the input aperture (42) and directing the photons toward the diffraction grating (50); an image plane (60) receiving the at least one spectral component from the diffraction grating (50); and an order sorting filter device (54) interposed between the diffraction grating (50) and the image plane (60), such that the filter device (54) is operable to pass only one of the two diffraction orders onto the image plane (60).
Abstract:
Method and apparatus for evaluating one or more materials in accordance with size of particles. The method includes evaluating a spectrum of light reflected from a first group of particles; evaluating a spectrum of light reflected from a second group of particle; comparing results of said evaluating of said first group with results of said evaluating of said second group; and providing an indication of a state of said material when said comparing produces a predetermined comparison result. Distance between a first light conductor for conducting light to the particles and a second light conductor for conducting light from said particles for said evaluations may be varied. Monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved.
Abstract:
A diffraction grating and a prism with the appropriate characteristics are employed to provide a combined dispersive characteristic that is substantially linear over the visible spectrum. Radiation from the grating and prism is collimated by a lens towards a detector array. The or a telecentric stop between the grating and prism is placed at a focal point of the lens in a telecentric arrangement so that equal magnification is achieved at the detector array. If the detector array is replaced by a plurality of optical channels, a multiplexer/demultiplexer is obtained.
Abstract:
In a measurement arrangement comprising an optical device, into which a diverging beam coming from a specimen is coupled for measurement, and further comprising a detector, which is arranged following said optical device and comprises a multiplicity of detector pixels arranged in one plane and evaluable independently of each other, wherein the optical device spectrally disperses the diverging beam in a first direction transversely of the propagation direction of the beam and directs it to the detector, the optical device also parallels the beam, before it impinges on the detector, in a second direction transversely of the propagation direction (C) such that rays of the beam impinging on the detector, which are adjacent to each other in the second direction, extend parallel to each other.
Abstract:
A method for spatially resolving flame temperatures in which a temperature-dependent wavelength region of a molecule radical spectrum and a normalization wavelength region of the molecule radical spectrum suitable for normalizing spectral data are identified. An algorithm based upon a relationship between a temperature-dependent intensity range within the temperature-dependent wavelength region at a plurality of temperatures and a normalized intensity range within the normalization wavelength region is formulated. Flame spectral data from a flame is obtained and the algorithm is applied to the flame spectral data, resulting in generation of a flame temperature profile of the flame.
Abstract:
A detection system is used during irradiation of an interaction region of a structure including embedded material with laser light. The detection system includes a collimating lens positioned to receive light emitted from the interaction region. The detection system further includes an optical fiber optically coupled to the collimating lens and a spectrometer optically coupled to the optical fiber. The spectrometer is adapted for analysis of the light for indications of the embedded material within the interaction region. The spectrometer includes an input slit adapted to receive light from the optical fiber. The input slit has a width selected to provide sufficient light transmittance and sufficient resolution. The spectrometer further includes an optical grating adapted to receive light from the input slit and to separate the light into a spectrum of wavelengths. The spectrometer further includes a collection lens adapted to receive a selected range of wavelengths of the separated light from the optical grating. The spectrometer further includes a light sensor adapted to receive the selected range of wavelengths and to generate a signal corresponding to an intensity of the received light.
Abstract:
The invention relates to a spectrometer (1) comprising a dispersive element of a light beam formed of a set of spectral components, the dispersive element generating spatial dispersion of the spectral components in the form of a dispersion spectrum (6) spatially spread, at least one photon detector (5, 52) comprising at least one detection element (51) being provided at one point of said dispersion. According to the invention, a matrix optical electromechanical device (3) is provided between the dispersive element and the detector in the dispersion spectrum, said electromechanical device being formed of a matrix of optical elements, each of the optical elements being able to send back a portion of the dispersion spectrum according to at least two directions in relation to a control signal, in order to enable the selection of at least one sub-assembly of the spectrum for said detection element. A method and an application of the spectrometer are claimed.
Abstract:
An atomic absorption spectrometer is disclosed which includes a monochromater (30) and an optical path defined by a toric mirror (14), a flat mirror (16), a flat mirror (20), a flat mirror (24), a toric mirror (22) and a further toric mirror (26). The toric mirror (26) directs light through entrance slit (32) of the monochromater (30) so that radiation is reflected from diffraction grating (38) and out exit slit (40) to a detector (42). A sample stage (18) in the form of a furnace is located between the mirrors (16) and (20). The monochromater is oriented so that the entrance slit is arranged transverse to the vertical. In one arrangement, a magnifying means is also provided which magnifies an image of the aperture (32) at the sample station (18) to increase the amount of radiation which is focused at the sample stage, and which is passed through the aperture to the detector or a focusing element provided by one of the mirrors may be provided for focusing radiation at a location other than sample station (18) so an enlarged out of focus image of the entrance slit (32) is produced at the sample station (18) to increase the amount of radiation which passes through the slit (32) and is received by the detector (42).
Abstract:
A compact handy type inspection instrument is provided for conducting readily nondestructive inspection of an inspection object in any working site. The inspection instrument comprises a spectroscope assembly containing an optical fiber-arranging member for arranging and holding a light-outputting end of an optical fiber bundle to be flat in a uniform layer thickness, a packaged compact spectroscope which is enclosed in a package having a slit-shaped light inlet window on a side confronting the rectilinear light-outputting end of the optical fiber-arranging member and is constituted of linear type continuous variable interference filter, a microlens array, and a linear type silicon array sensor assembled in the named order from the side of the light inlet window toward the opposite side, and a positioning device for positioning the rectilinear light-outputting end of the optical fiber bundle to fit to the light input window; and a detection head; incorporated together into a main body casing.
Abstract:
A planar spectrograph for demultiplexing optical wavelength signals includes a monolithic substrate. The substrate has a diffraction grating etched therein. The diffraction grating is integrally formed in the subtstrate to be in operative relationship with input light to diffract and reflect the input light to a detector. A recess is formed in the substrate to accommodate a separate slab waveguide. A slab waveguide is dimensioned and configured to fit within the recess, and the waveguide guides input light to and from the diffraction grating. A silicon-on insulator spectrographs is also described, as well as, fabrication processes for manufacturing these spectrographs.