Dual band hyperspectral imaging spectrometer
    1.
    发明申请
    Dual band hyperspectral imaging spectrometer 审中-公开
    双波段高光谱成像光谱仪

    公开(公告)号:US20040257563A1

    公开(公告)日:2004-12-23

    申请号:US10465342

    申请日:2003-06-19

    CPC classification number: G01J3/28 G01J3/2823 G01J2003/1273

    Abstract: A dual band spectrometer (40) for imaging one or two spectral bands onto a common image plane. The spectrometer (40) includes an input aperture (42) for receiving scene photons; an entrance slit (46) illuminated by photons from the input aperture (42); a diffraction grating (50) for dispersing the photons into spectral bands, such that at least one of the spectral bands embodies two diffraction orders; a collimator (48) for collimating the photons from the input aperture (42) and directing the photons toward the diffraction grating (50); an image plane (60) receiving the at least one spectral component from the diffraction grating (50); and an order sorting filter device (54) interposed between the diffraction grating (50) and the image plane (60), such that the filter device (54) is operable to pass only one of the two diffraction orders onto the image plane (60).

    Abstract translation: 用于将一个或两个光谱带成像到共同的图像平面上的双频带光谱仪(40)。 光谱仪(40)包括用于接收场景光子的输入孔(42); 入射狭缝(46),其由来自所述输入孔(42)的光子照射; 衍射光栅(50),用于将光子分散到光谱带中,使得光谱带中的至少一个体现了两个衍射级; 准直器(48),用于从所述输入孔(42)准直所述光子并将所述光子引向所述衍射光栅(50); 从所述衍射光栅(50)接收所述至少一个光谱分量的图像平面(60)。 以及置于所述衍射光栅(50)和所述图像平面(60)之间的顺序分类过滤器装置(54),使得所述过滤装置(54)可操作以将所述两个衍射级中的仅一个通过到所述图像平面(60)上 )。

    Method and apparatus for determining particle size and composition of mixtures
    2.
    发明申请
    Method and apparatus for determining particle size and composition of mixtures 失效
    用于确定混合物的粒度和组成的方法和装置

    公开(公告)号:US20040233431A1

    公开(公告)日:2004-11-25

    申请号:US10787072

    申请日:2004-02-24

    CPC classification number: G01N15/0205 G01N2015/0092

    Abstract: Method and apparatus for evaluating one or more materials in accordance with size of particles. The method includes evaluating a spectrum of light reflected from a first group of particles; evaluating a spectrum of light reflected from a second group of particle; comparing results of said evaluating of said first group with results of said evaluating of said second group; and providing an indication of a state of said material when said comparing produces a predetermined comparison result. Distance between a first light conductor for conducting light to the particles and a second light conductor for conducting light from said particles for said evaluations may be varied. Monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved.

    Abstract translation: 根据颗粒尺寸评估一种或多种材料的方法和装置。 该方法包括评估从第一组颗粒反射的光谱; 评估从第二组粒子反射的光谱; 将所述第一组的所述评估结果与所述第二组的评估结果进行比较; 以及当所述比较产生预定的比较结果时提供所述材料的状态的指示。 可以改变用于将光导向粒子的第一光导体与用于传导来自所述粒子的光用于所述评估的第二光导体之间的距离。 可以实现对粒度随时间的变化的过程的监测或者确定颗粒或含有其的混合物的各种物理和/或化学特性(包括均匀性)。

    Refractive-diffractive spectrometer
    3.
    发明申请
    Refractive-diffractive spectrometer 审中-公开
    折射衍射光谱仪

    公开(公告)号:US20040227939A1

    公开(公告)日:2004-11-18

    申请号:US10723342

    申请日:2003-11-25

    Abstract: A diffraction grating and a prism with the appropriate characteristics are employed to provide a combined dispersive characteristic that is substantially linear over the visible spectrum. Radiation from the grating and prism is collimated by a lens towards a detector array. The or a telecentric stop between the grating and prism is placed at a focal point of the lens in a telecentric arrangement so that equal magnification is achieved at the detector array. If the detector array is replaced by a plurality of optical channels, a multiplexer/demultiplexer is obtained.

    Abstract translation: 使用衍射光栅和具有适当特性的棱镜来提供在可见光谱上基本上线性的组合色散特性。 来自光栅和棱镜的辐射由透镜朝向检测器阵列准直。 光栅和棱镜之间的远心止动件以远心布置放置在透镜的焦点处,使得在检测器阵列处实现相等的倍率。 如果检测器阵列被多个光通道替代,则获得多路复用器/解复用器。

    Scatterometric measuring arrangement and measuring method
    4.
    发明申请
    Scatterometric measuring arrangement and measuring method 审中-公开
    散射测量装置和测量方法

    公开(公告)号:US20040196460A1

    公开(公告)日:2004-10-07

    申请号:US10472253

    申请日:2004-04-12

    CPC classification number: G01J4/00 G01J3/28 G01N21/211 G01N21/47

    Abstract: In a measurement arrangement comprising an optical device, into which a diverging beam coming from a specimen is coupled for measurement, and further comprising a detector, which is arranged following said optical device and comprises a multiplicity of detector pixels arranged in one plane and evaluable independently of each other, wherein the optical device spectrally disperses the diverging beam in a first direction transversely of the propagation direction of the beam and directs it to the detector, the optical device also parallels the beam, before it impinges on the detector, in a second direction transversely of the propagation direction (C) such that rays of the beam impinging on the detector, which are adjacent to each other in the second direction, extend parallel to each other.

    Abstract translation: 在包括光学装置的测量装置中,来自试样的发散光束耦合到光学装置中用于测量,并且还包括检测器,其被布置在所述光学装置之后并且包括布置在一个平面中并且可独立评估的多个检测器像素 其中所述光学装置在横向于所述光束的传播方向的第一方向上光谱地扩散所述发散光束并将其引导到所述检测器,所述光学装置在其撞击所述检测器之前还将所述光束平行于所述检测器 方向横向于传播方向(C),使得在第二方向上彼此相邻的入射到检测器上的光束彼此平行延伸。

    Method and apparatus for spatially resolving flame temperatures using ultraviolet light emission
    5.
    发明申请
    Method and apparatus for spatially resolving flame temperatures using ultraviolet light emission 有权
    使用紫外光发射空间分辨火焰温度的方法和装置

    公开(公告)号:US20040188620A1

    公开(公告)日:2004-09-30

    申请号:US10400887

    申请日:2003-03-27

    CPC classification number: G01J5/0014

    Abstract: A method for spatially resolving flame temperatures in which a temperature-dependent wavelength region of a molecule radical spectrum and a normalization wavelength region of the molecule radical spectrum suitable for normalizing spectral data are identified. An algorithm based upon a relationship between a temperature-dependent intensity range within the temperature-dependent wavelength region at a plurality of temperatures and a normalized intensity range within the normalization wavelength region is formulated. Flame spectral data from a flame is obtained and the algorithm is applied to the flame spectral data, resulting in generation of a flame temperature profile of the flame.

    Abstract translation: 一种用于空间分辨火焰温度的方法,其中识别适用于归一化光谱数据的分子自由基光谱的分子自由基光谱和归一化波长区域的温度依赖性波长区域。 基于在多个温度下的温度相关波长区域内的温度依赖强度范围与归一化波长区域内的归一化强度范围之间的关系的算法被配制。 获得来自火焰的火焰光谱数据,并将该算法应用于火焰光谱数据,导致产生火焰的火焰温度分布。

    Method and apparatus for detecting embedded rebar within an interaction region of a structure irradiated with laser
    6.
    发明申请
    Method and apparatus for detecting embedded rebar within an interaction region of a structure irradiated with laser 失效
    在用激光照射的结构的相互作用区域内检测嵌入钢筋的方法和装置

    公开(公告)号:US20040182999A1

    公开(公告)日:2004-09-23

    申请号:US10803267

    申请日:2004-03-18

    Abstract: A detection system is used during irradiation of an interaction region of a structure including embedded material with laser light. The detection system includes a collimating lens positioned to receive light emitted from the interaction region. The detection system further includes an optical fiber optically coupled to the collimating lens and a spectrometer optically coupled to the optical fiber. The spectrometer is adapted for analysis of the light for indications of the embedded material within the interaction region. The spectrometer includes an input slit adapted to receive light from the optical fiber. The input slit has a width selected to provide sufficient light transmittance and sufficient resolution. The spectrometer further includes an optical grating adapted to receive light from the input slit and to separate the light into a spectrum of wavelengths. The spectrometer further includes a collection lens adapted to receive a selected range of wavelengths of the separated light from the optical grating. The spectrometer further includes a light sensor adapted to receive the selected range of wavelengths and to generate a signal corresponding to an intensity of the received light.

    Abstract translation: 在包括具有激光的嵌入材料的结构的相互作用区域的照射期间使用检测系统。 检测系统包括准直透镜,定位成接收从相互作用区域发出的光。 检测系统还包括光学耦合到准直透镜的光纤和光学耦合到光纤的光谱仪。 光谱仪适用于分析相互作用区域内的嵌入材料的光的光。 光谱仪包括适于接收来自光纤的光的输入狭缝。 输入狭缝具有选择的宽度以提供足够的透光率和足够的分辨率。 光谱仪还包括适于接收来自输入狭缝的光并将光分离成波长范围的光栅。 光谱仪还包括适于接收来自光栅的分离光的选定波长范围的收集透镜。 光谱仪还包括适于接收所选择的波长范围并且产生对应于所接收的光的强度的信号的光传感器。

    Spectrometer comprising active matrix optics
    7.
    发明申请
    Spectrometer comprising active matrix optics 有权
    光谱仪包括有源矩阵光学元件

    公开(公告)号:US20040169858A1

    公开(公告)日:2004-09-02

    申请号:US10468839

    申请日:2004-03-19

    Inventor: Edouard Da Silva

    Abstract: The invention relates to a spectrometer (1) comprising a dispersive element of a light beam formed of a set of spectral components, the dispersive element generating spatial dispersion of the spectral components in the form of a dispersion spectrum (6) spatially spread, at least one photon detector (5, 52) comprising at least one detection element (51) being provided at one point of said dispersion. According to the invention, a matrix optical electromechanical device (3) is provided between the dispersive element and the detector in the dispersion spectrum, said electromechanical device being formed of a matrix of optical elements, each of the optical elements being able to send back a portion of the dispersion spectrum according to at least two directions in relation to a control signal, in order to enable the selection of at least one sub-assembly of the spectrum for said detection element. A method and an application of the spectrometer are claimed.

    Abstract translation: 本发明涉及一种光谱仪(1),其包括由一组光谱分量形成的光束的色散元件,所述色散元件至少产生以分散光谱(6)的形式的空间色散空间扩散 一个光子检测器(5,52)包括至少一个检测元件(51),该检测元件设置在所述分散体的一个点处。 根据本发明,在色散谱中在色散元件和检测器之间提供矩阵光学机电装置(3),所述机电装置由光学元件的矩阵形成,每个光学元件能够发送回 根据与控制信号相关的至少两个方向的色散谱的一部分,以便能够选择用于所述检测元件的光谱的至少一个子组件。 要求保护光谱仪的方法和应用。

    Atomic absorption spectrometer
    8.
    发明申请
    Atomic absorption spectrometer 失效
    原子吸收光谱仪

    公开(公告)号:US20040169856A1

    公开(公告)日:2004-09-02

    申请号:US10484489

    申请日:2004-01-19

    CPC classification number: G01J3/04 G01J3/42 G01N21/3103 G01N21/74

    Abstract: An atomic absorption spectrometer is disclosed which includes a monochromater (30) and an optical path defined by a toric mirror (14), a flat mirror (16), a flat mirror (20), a flat mirror (24), a toric mirror (22) and a further toric mirror (26). The toric mirror (26) directs light through entrance slit (32) of the monochromater (30) so that radiation is reflected from diffraction grating (38) and out exit slit (40) to a detector (42). A sample stage (18) in the form of a furnace is located between the mirrors (16) and (20). The monochromater is oriented so that the entrance slit is arranged transverse to the vertical. In one arrangement, a magnifying means is also provided which magnifies an image of the aperture (32) at the sample station (18) to increase the amount of radiation which is focused at the sample stage, and which is passed through the aperture to the detector or a focusing element provided by one of the mirrors may be provided for focusing radiation at a location other than sample station (18) so an enlarged out of focus image of the entrance slit (32) is produced at the sample station (18) to increase the amount of radiation which passes through the slit (32) and is received by the detector (42).

    Abstract translation: 公开了一种原子吸收光谱仪,其包括单色仪(30)和由折射镜(14),平面镜(16),平面镜(20),平面镜(24),复曲面 (22)和另一个复曲面镜(26)。 复曲面镜(26)通过单色仪(30)的入口狭缝(32)引导光线,使得辐射从衍射光栅(38)和出射狭缝(40)反射到检测器(42)。 炉子形式的样品台(18)位于反射镜(16)和(20)之间。 单色仪被定向成使得入口狭缝横向于垂直布置。 在一种布置中,还提供放大装置,其放大在采样站(18)处的孔径(32)的图像,以增加聚焦在样品台处的辐射量,并且其通过孔径到达 可以提供由一个反射镜提供的检测器或聚焦元件用于将辐射聚焦在除了采样台(18)之外的位置处,从而在采样站(18)产生入射狭缝(32)的放大的对焦图像, 以增加通过狭缝(32)并被检测器(42)接收的辐射量。

    Handy internal quality inspection instrument
    9.
    发明申请
    Handy internal quality inspection instrument 审中-公开
    方便内部质量检测仪器

    公开(公告)号:US20040130720A1

    公开(公告)日:2004-07-08

    申请号:US10475472

    申请日:2003-10-21

    Abstract: A compact handy type inspection instrument is provided for conducting readily nondestructive inspection of an inspection object in any working site. The inspection instrument comprises a spectroscope assembly containing an optical fiber-arranging member for arranging and holding a light-outputting end of an optical fiber bundle to be flat in a uniform layer thickness, a packaged compact spectroscope which is enclosed in a package having a slit-shaped light inlet window on a side confronting the rectilinear light-outputting end of the optical fiber-arranging member and is constituted of linear type continuous variable interference filter, a microlens array, and a linear type silicon array sensor assembled in the named order from the side of the light inlet window toward the opposite side, and a positioning device for positioning the rectilinear light-outputting end of the optical fiber bundle to fit to the light input window; and a detection head; incorporated together into a main body casing.

    Abstract translation: 提供了一种紧凑便携式检测仪器,用于在任何工作现场进行检查对象的非破坏性检查。 该检查仪器包括一个分光计组件,该分光镜组件包含用于将光纤束的光输出端布置并保持为均匀层厚度的平坦的光纤排列构件,封装在具有狭缝的封装中的封装的小型分光镜 形状的光入口窗在与光纤排列构件的直线光输出端相对的一侧上,由线性型连续可变干涉滤光器,微透镜阵列和线性硅阵列传感器构成,该传感器以命名顺序从 光入口窗侧朝向相反侧;以及定位装置,用于将光纤束的直线光输出端定位成适合于光输入窗; 和检测头; 并入到主体外壳中。

    MULTIMODE PLANAR SPECTROGRAPHS FOR WAVELENGTH DEMULTIPLEXING AND METHODS OF FABRICATION
    10.
    发明申请
    MULTIMODE PLANAR SPECTROGRAPHS FOR WAVELENGTH DEMULTIPLEXING AND METHODS OF FABRICATION 有权
    用于波长分解的多模式平面光谱和制造方法

    公开(公告)号:US20030197862A1

    公开(公告)日:2003-10-23

    申请号:US09736006

    申请日:2000-12-13

    Abstract: A planar spectrograph for demultiplexing optical wavelength signals includes a monolithic substrate. The substrate has a diffraction grating etched therein. The diffraction grating is integrally formed in the subtstrate to be in operative relationship with input light to diffract and reflect the input light to a detector. A recess is formed in the substrate to accommodate a separate slab waveguide. A slab waveguide is dimensioned and configured to fit within the recess, and the waveguide guides input light to and from the diffraction grating. A silicon-on insulator spectrographs is also described, as well as, fabrication processes for manufacturing these spectrographs.

    Abstract translation: 用于解复用光波长信号的平面光谱仪包括单片基板。 衬底具有蚀刻在其中的衍射光栅。 衍射光栅整体地形成在底板中以与输入光处于操作关系,以将输入光衍射并反射到检测器。 在衬底中形成凹槽以容纳单独的平板波导。 平板波导的尺寸和构造被配置成装配在凹槽内,并且波导将输入光与衍射光栅相连。 还描述了硅绝缘体光谱仪,以及用于制造这些光谱仪的制造工艺。

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