公开(公告)号：US20040257563A1

公开(公告)日：2004-12-23

申请号：US10465342

申请日：2003-06-19

Applicant: Northrop Grumman Corporation

Inventor： Harold E. Miller ,  Peter J. Jarecke

IPC: G01J003/28

CPC classification number: G01J3/28 ,  G01J3/2823 ,  G01J2003/1273

Abstract: A dual band spectrometer (40) for imaging one or two spectral bands onto a common image plane. The spectrometer (40) includes an input aperture (42) for receiving scene photons; an entrance slit (46) illuminated by photons from the input aperture (42); a diffraction grating (50) for dispersing the photons into spectral bands, such that at least one of the spectral bands embodies two diffraction orders; a collimator (48) for collimating the photons from the input aperture (42) and directing the photons toward the diffraction grating (50); an image plane (60) receiving the at least one spectral component from the diffraction grating (50); and an order sorting filter device (54) interposed between the diffraction grating (50) and the image plane (60), such that the filter device (54) is operable to pass only one of the two diffraction orders onto the image plane (60).

Abstract translation: 用于将一个或两个光谱带成像到共同的图像平面上的双频带光谱仪（40）。 光谱仪（40）包括用于接收场景光子的输入孔（42）; 入射狭缝（46），其由来自所述输入孔（42）的光子照射; 衍射光栅（50），用于将光子分散到光谱带中，使得光谱带中的至少一个体现了两个衍射级; 准直器（48），用于从所述输入孔（42）准直所述光子并将所述光子引向所述衍射光栅（50）; 从所述衍射光栅（50）接收所述至少一个光谱分量的图像平面（60）。 以及置于所述衍射光栅（50）和所述图像平面（60）之间的顺序分类过滤器装置（54），使得所述过滤装置（54）可操作以将所述两个衍射级中的仅一个通过到所述图像平面（60）上 ）。