DC-to-DC converter and integrated circuit including the same

    公开(公告)号:US12212242B2

    公开(公告)日:2025-01-28

    申请号:US18468893

    申请日:2023-09-18

    Abstract: A direct-current (DC)-DC converter includes a converting circuit including an inductor element. The converting circuit is configured to generate an output voltage from an input voltage based on a switching operation. An inductor current emulator is configured to adjust at least one parameter for changing a current peak value of the inductor element in response to a change in a level of the input voltage and is configured to generate an internal voltage based on the at least one parameter, which is adjusted. The inductor current emulator is configured to generate a control signal for controlling the switching operation such that current of the inductor element has a pattern corresponding to a pattern of the internal voltage.

    SYSTEM ON CHIP
    13.
    发明申请

    公开(公告)号:US20220253117A1

    公开(公告)日:2022-08-11

    申请号:US17559684

    申请日:2021-12-22

    Abstract: A system on chip includes a core configured to maintain a clock gating state; a plurality of header switch circuits configured to deliver a supply voltage, which is reduced from an external supply voltage, to the core in response to a plurality of control signals; and a voltage regulator configured to monitor the supply voltage, change logic levels of the plurality of control signals according to a difference level corresponding to a difference between the supply voltage and a preset target voltage, and output the plurality of control signals of which the logic levels have been changed to the plurality of header switch circuits.

    DEVICE AND METHOD FOR OUTPUTTING RESULT OF MONITORING

    公开(公告)号:US20230221364A1

    公开(公告)日:2023-07-13

    申请号:US18094860

    申请日:2023-01-09

    CPC classification number: G01R31/2843

    Abstract: A device includes a function circuit that operates based on power provided by a first positive supply voltage and a first negative supply voltage, a monitoring circuit that operates based on power provided by a second positive supply voltage and a second negative supply voltage and that generates a first monitor signal based on monitoring an operation of the function circuit, and an output circuit that generates a second monitor signal based on monitoring the first positive supply voltage, generates a third monitor signal based on monitoring the second positive supply voltage, and generates an output signal that is output through one or more output pins, based on the first monitor signal, the second monitor signal, and the third monitor signal.

    SYSTEM-ON-CHIP INCLUDING LOW-DROPOUT REGULATOR

    公开(公告)号:US20220404853A1

    公开(公告)日:2022-12-22

    申请号:US17845541

    申请日:2022-06-21

    Abstract: A system-on-chip according to an embodiment includes a core including a header switch circuit configured to transmit a power supply voltage applied to a first power rail as a supply voltage to a second power rail and a logic circuit configured to operate based on the supply voltage from the second power rail, and a low-dropout (LDO) regulator configured to regulate a magnitude of first current output to the second power rail based on a change in the supply voltage, wherein the LDO regulator is further configured to control on/off of a plurality of first header switches included in the header switch circuit based on an amount of the change in the supply voltage.

    BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME

    公开(公告)号:US20210199719A1

    公开(公告)日:2021-07-01

    申请号:US16940809

    申请日:2020-07-28

    Abstract: A temperature measurement circuit includes a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature, a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage, a sensing circuit configured to generate a temperature-variant voltage based on a bias current, where the temperature-variant voltage is varied depending on the operation temperature, an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage, and an analog built-in self-test (BIST) circuit configured to generate a plurality of flag signals indicating whether each of the band-gap reference voltage, the measurement reference voltage, and a bias voltage corresponding to the bias current is included in a predetermined range.

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