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公开(公告)号:US12236997B2
公开(公告)日:2025-02-25
申请号:US18357204
申请日:2023-07-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung Kim , Taeyoung Oh , Jongcheol Kim , Kyungho Lee , Hyongryol Hwang
IPC: G11C11/4078 , G11C11/406 , G11C11/4076 , G11C11/4096
Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cell rows, a row hammer management circuit and a control logic circuit. The row hammer management circuit stores counted values in count cells of each of the plurality of memory cell rows as count data based on an active command applied to the control logic circuit at a first time point, and performs an internal read-update-write operation to read the count data from the count cells of a target memory cell row from among the plurality of memory cell rows, to update the count data that was read to obtain updated count data, and to write the updated count data in the count cells of the target memory cell row in response to a precharge command applied at a second time point after a first command that is applied to the control logic circuit.
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公开(公告)号:US12057184B2
公开(公告)日:2024-08-06
申请号:US18164100
申请日:2023-02-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunghye Cho , Kiheung Kim , Sungrae Kim , Junhyung Kim , Kijun Lee , Myungkyu Lee , Changyong Lee , Sanguhn Cha
IPC: G11C29/42 , G11C11/408 , G11C11/4091 , G11C29/44 , G11C29/12
CPC classification number: G11C29/42 , G11C11/4087 , G11C11/4091 , G11C29/4401 , G11C2029/1202 , G11C2029/1204
Abstract: A memory system includes a memory module having a plurality of memory devices therein. A memory controller is configured to transmit commands and addresses to the memory module in synchronization with a clock, input/output data to and from the memory module in synchronization with a data transfer clock, and perform system error correction operations on data read from the memory module. The plurality of memory devices perform on-die error correction operations, which are different from each other according to a physical location of the stored read data.
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公开(公告)号:US20230420033A1
公开(公告)日:2023-12-28
申请号:US18196703
申请日:2023-05-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jongcheol Kim , Kiheung Kim , Taeyoung Oh , Kyungho Lee , Hyongryol Hwang
IPC: G11C11/4078 , G11C11/408 , G11C11/4096 , G11C11/4094
CPC classification number: G11C11/4078 , G11C11/4087 , G11C11/4096 , G11C11/4094
Abstract: A semiconductor memory device, including a memory cell array; a row hammer management circuit configured to: count a number of accesses based on an active command, and based on a first command applied after the active command, perform an internal read-update-write operation to read the count data from the count cells of a target memory cell row, and to write updated count data in the count cells of the target memory cell row; and a column decoder configured to: access a first memory cell using a first bit-line; and store data in the first memory cell using a first voltage, or perform an internal write operation to store the count data in the first memory cell using a second voltage greater than the first voltage during an internal write time interval smaller than a reference write time interval.
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公开(公告)号:US11605441B1
公开(公告)日:2023-03-14
申请号:US17461380
申请日:2021-08-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunghye Cho , Kiheung Kim , Sungrae Kim , Junhyung Kim , Kijun Lee , Myungkyu Lee , Changyong Lee , Sanguhn Cha
IPC: G11C29/42 , G11C29/44 , G11C11/408 , G11C11/4091 , G11C29/12
Abstract: A memory system includes a memory module having a plurality of memory devices therein. A memory controller is configured to transmit commands and addresses to the memory module in synchronization with a clock, input/output data to and from the memory module in synchronization with a data transfer clock, and perform system error correction operations on data read from the memory module. The plurality of memory devices perform on-die error correction operations, which are different from each other according to a physical location of the stored read data.
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公开(公告)号:US20250028456A1
公开(公告)日:2025-01-23
申请号:US18907760
申请日:2024-10-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyungho Lee , Kiheung Kim , Taeyoung Oh , Jongcheol Kim , Hyongryol Hwang
IPC: G06F3/06
Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cell rows and a row hammer management circuit. The row hammer management circuit stores counted values in count cells of each of the plurality of memory cell rows as count data, and performs an internal read-update-write operation to read the count data from the count cells of a target memory cell row from among the plurality of memory cell rows, to update the count data that was read to obtain updated count data, and to write the updated count data in the count cells of the target memory cell row. The row hammer management circuit includes a hammer address queue. The row hammer management circuit changes the updated count data randomly, based on an event signal indicating a state change of the hammer address queue.
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公开(公告)号:US12118221B2
公开(公告)日:2024-10-15
申请号:US18136915
申请日:2023-04-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jongcheol Kim , Kiheung Kim , Taeyoung Oh , Kyungho Lee
CPC classification number: G06F3/0632 , G06F3/0604 , G06F3/0679
Abstract: A semiconductor memory device includes a memory cell array, a row hammer management circuit and a refresh control circuit. The row hammer management circuit automatically stores random count data in count cells of each of a plurality of memory cell rows during a power-up sequence of the semiconductor memory device and determines counted values by counting a number of times of access associated with each of the plurality of memory cell rows in response to an active command from an external memory controller and stores the counted values in the count cells of each of the plurality of memory cell rows as count data. The refresh control circuit receives a hammer address and performs a hammer refresh operation on one or more of the plurality of memory cell rows that are physically adjacent to a memory cell row that corresponds to the hammer address.
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公开(公告)号:US20240220149A1
公开(公告)日:2024-07-04
申请号:US18243268
申请日:2023-09-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung Kim , Taeyoung Oh
IPC: G06F3/06
CPC classification number: G06F3/0655 , G06F3/0604 , G06F3/064 , G06F3/0673
Abstract: A semiconductor memory device includes a memory cell array and a column access circuit. The memory cell array includes a plurality of sub-array blocks and each of the sub-array blocks includes volatile memory cells. The column access circuit receives a plurality of data units, each of which includes normal data and meta data having a ratio of k:1, which is associated with managing the normal data, allocates p column selection lines associated with transferring the data units to the bit-lines to a plurality of normal data and a plurality of meta data in the data units with the ratio of k:1, and stores a sub unit of a first normal data among the plurality of normal data and a sub unit of a first meta data in a first region and a second region of a first sub-array block of the plurality of sub-array blocks, respectively.
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公开(公告)号:US20230185460A1
公开(公告)日:2023-06-15
申请号:US18076628
申请日:2022-12-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung Kim , Taeyoung Oh , Hyeran Kim , Sungyong Cho , Kyungsoo Ha
IPC: G06F3/06
CPC classification number: G06F3/0619 , G06F3/0653 , G06F3/0659 , G06F3/0673
Abstract: A semiconductor memory device includes a memory cell array, a row hammer management circuit and a control logic circuit. The memory cell array includes a plurality of memory cell rows. The row hammer management circuit counts the number of instances of access of each of the memory cell rows, such as in response to the receipt of an active command, to store the counted values in count cells of each of the memory cell rows as count data and, in response to a first command, initiates an internal read-update-write operation to read the count data, to update the read count data, and to write the updated count data in the count cells. The control logic circuit may performs an internal write operation to write the updated count data in the count cells during a second write time interval that is smaller than a first write time interval associated with a normal write operation.
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公开(公告)号:US11487615B2
公开(公告)日:2022-11-01
申请号:US17205276
申请日:2021-03-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung Kim , Hyungi Kim , Junhyung Kim , Sungchul Park , Yesin Ryu
IPC: G06F11/10 , G11C11/4096 , G11C11/406 , G11C11/408 , H01L25/065
Abstract: A semiconductor memory device includes a memory cell array, an error correction code (ECC) engine, a scrubbing control circuit and a control logic circuit. The memory cell array includes memory cell rows, and each of the memory cell rows including volatile memory cells. The scrubbing control circuit generates scrubbing addresses for performing a normal scrubbing operation on the memory cell rows with a first period based on refresh row addresses for refreshing the memory cell rows. The control logic circuit controls the ECC engine the scrubbing control circuit to distribute a scrubbing operation on weak codewords dynamically within the refresh operation such that a dynamic allocated scrubbing (DAS) operation is performed with a second period smaller than the first period. An error bit is detected in each of the weak codewords during the normal scrubbing operation or normal read operation on at least one of the memory cell rows.
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公开(公告)号:US20220093200A1
公开(公告)日:2022-03-24
申请号:US17245075
申请日:2021-04-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung Kim , Sanguhn Cha , Junhyung Kim , Sungchul Park , Hyojin Jung , Kyung-Soo Ha
IPC: G11C29/42 , G11C29/44 , G11C29/20 , G11C11/406
Abstract: A semiconductor memory device includes a memory cell array, an error correction code (ECC) circuit, a fault address register, a scrubbing control circuit and a control logic circuit. The memory cell array includes memory cell rows. The scrubbing control circuit generates scrubbing addresses based on refresh operations performed on the memory cell array. The control logic circuit controls the ECC circuit such that the ECC circuit performs an error detection operation on a plurality of sub-pages in a first memory cell row to count a number of error occurrences, and determines whether to correct a codeword in which an error is detected based on the number of error occurrences. An uncorrected or corrected codeword is written back , and a row address of the first memory cell row may be stored in the fault address register as a row fault address based on the number of error occurrences.
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